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Database: 365,228(8 Aug 2026)

spectral peak area method

spectral peak area method, Total:41 items.

The international standard classification for "spectral peak area method" includes: Physicochemical methods of analysis , Chemical analysis .

The Chinese standard classification for "spectral peak area method" includes: Basic standards and general methods for synthetic resin and plastic , Basic standards and general methods .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 28893-2012 Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
  • GB/T 40139-2021 Measuring method for surface areas of materials—Three dimensional area measurement base on hyperspectral imaging
  • GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
  • GB/T 28893-2024 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Methods used to determine peak intensities and information required when reporting results

Professional Standard - Electron

  • SJ 2355.7-1983 Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices

Group Standards of the People's Republic of China

  • T/JCMS 0007-2022 Determination of the ultimate aerobic biodegradability of polylactic acid biodegradable materials under controlled composting conditions —Method by calculating the peak area of terahertz wide spectrum

British Standards Institution (BSI)

  • BS ISO 19962:2019 Optics and photonics. Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
  • BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
  • BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

Kingdom of Bahrain Testing and Metrology Directorate

  • BH GSO ISO 19962:2022 Optics and photonics — Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
  • BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • BH GSO ISO 20903:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results

GCC Standardization Organization

  • GSO ASTM D7214:2024 Standard Test Method for Determination of the Oxidation of Used Lubricants by FT-IR Using Peak Area Increase Calculation
  • GSO ISO 19962:2021 Optics and photonics — Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
  • OS GSO ASTM D7214:2024 Standard Test Method for Determination of the Oxidation of Used Lubricants by FT-IR Using Peak Area Increase Calculation
  • GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

Association Francaise de Normalisation

  • NF ISO 19962:2019 Optics and photonics - Spectroscopic measurement methods for integrated scattering by optical elements with parallel planes
  • NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.

International Organization for Standardization (ISO)

  • ISO 20903:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
  • ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
  • ISO 20903:2011 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results

Gosstandart of Russia

European Committee for Electrotechnical Standardization(CENELEC)

BE-NBN

International Electrotechnical Commission (IEC)

American Society for Testing and Materials (ASTM)

  • ASTM D7214-07a Standard Test Method for Determination of the Oxidation of Used Lubricants by FT-IR Using Peak Area Increase Calculation
  • ASTM D7214-07 Standard Test Method for Determination of the Oxidation of Used Lubricants by FT-IR Using Peak Area Increase Calculation
  • ASTM D7214-07a(2012) Standard Test Method for Determination of the Oxidation of Used Lubricants by FT-IR Using Peak Area Increase Calculation
  • ASTM D7214-06 Standard Test Method for Determination of the Oxidation of Used Lubricants by FT-IR Using Peak Area Increase Calculation
  • ASTM C810-90(2000) Standard Test Method for Nickel on Steel for Porcelain Enameling by X-Ray Emission Spectrometry
  • ASTM C810-90(2011)e1 Standard Test Method for Nickel on Steel for Porcelain Enameling by X-Ray Emission Spectrometry
  • ASTM C810-90(2006) Standard Test Method for Nickel on Steel for Porcelain Enameling by X-Ray Emission Spectrometry

European Committee for Standardization (CEN)

German Institute for Standardization

  • DIN 50990:1993-11 Determination of mass per unit area of metallic coatings by flame atomic absorption spectrometry
  • DIN 50990:2018-03 Draft Document - Measurement of coating thickness - Measurement of the area-related mass of metallic layers by means of spectrometric measurement methods

Korean Agency for Technology and Standards (KATS)

  • KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 19319-2020 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer

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