Spectral peak area
Spectral peak area, Total:37 items.
The international standard classification for "Spectral peak area" includes: Physicochemical methods of analysis , Chemical analysis .
The Chinese standard classification for "Spectral peak area" includes: Basic standards and general methods for synthetic resin and plastic , Basic standards and general methods .
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40139-2021 Measuring method for surface areas of materials—Three dimensional area measurement base on hyperspectral imaging
- GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 28893-2012 Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
- GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
- GB/T 28893-2024 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Methods used to determine peak intensities and information required when reporting results
Professional Standard - Electron
- SJ 2355.7-1983 Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices
Group Standards of the People's Republic of China
- T/JCMS 0007-2022 Determination of the ultimate aerobic biodegradability of polylactic acid biodegradable materials under controlled composting conditions —Method by calculating the peak area of terahertz wide spectrum
RU-GOST R
- GOST R IEC 580-1995 Area exposure product meter
European Committee for Electrotechnical Standardization（CENELEC）
- HD 379-1978 Area Exposure Product Meter
International Electrotechnical Commission (IEC)
- IEC 60580:1977 Area exposure product meter
BE-NBN
- NBN-HD 379-1994 Area exposure product meter
GSO
- BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- BH GSO ISO 19962:2022 Optics and photonics — Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
- GSO ISO 19962:2021 Optics and photonics — Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
- BH GSO ISO 20903:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results
British Standards Institution (BSI)
- BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- BS ISO 19962:2019 Optics and photonics. Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
- BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
European Committee for Standardization (CEN)
- HD 379 S1-1979 Area exposure product meter
International Organization for Standardization (ISO)
- ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- ISO 20903:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
- ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
Korean Agency for Technology and Standards (KATS)
- KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS D ISO 19319-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
Association Francaise de Normalisation
- NF ISO 19962:2019 Optics and photonics - Spectroscopic measurement methods for integrated scattering by optical elements with parallel planes
- NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.
SCC
- BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
SE-SIS
- SIS SS IEC 580:1986 X-ray equipment - Area exposure product meter
American Society for Testing and Materials (ASTM)
- ASTM D7214-07a Standard Test Method for Determination of the Oxidation of Used Lubricants by FT-IR Using Peak Area Increase Calculation
- ASTM D7214-07 Standard Test Method for Determination of the Oxidation of Used Lubricants by FT-IR Using Peak Area Increase Calculation
- ASTM D7214-07a(2012) Standard Test Method for Determination of the Oxidation of Used Lubricants by FT-IR Using Peak Area Increase Calculation
- ASTM D7214-06 Standard Test Method for Determination of the Oxidation of Used Lubricants by FT-IR Using Peak Area Increase Calculation
- ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
American National Standards Institute （ANSI)
- ANSI/TIA/EIA 455-132-A-2001 Measurement of Effective Area of Single-Mode Optical Fiber
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