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X-ray Photoelectron Spectroscopy+

X-ray Photoelectron Spectroscopy+, Total:23 items.

The international standard classification for "X-ray Photoelectron Spectroscopy+" includes: Optical measuring instruments , Chemical analysis , Measurement of electrical and magnetic quantities , IT applications in science , Other non-ferrous metals and their alloys .

The Chinese standard classification for "X-ray Photoelectron Spectroscopy+" includes: Electron optics and other physical optics instrument , Basic standards and general methods , Integrated test system , Computer application , Precious metals and their alloys .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
  • GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
  • GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
  • GB/T 28633-2012 Surface chemical analysis—X-ray photoelectron spectroscopy—Repeatability and constancy of intensity scale
  • GB/T 25185-2010 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction
  • GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
  • GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
  • GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
  • GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
  • GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • GB/T 25188-2010 Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
  • GB/T 28893-2012 Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results

Professional Standard - Electron

  • SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
  • SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

Professional Standard - Non-ferrous Metal

  • YS/T 644-2007 Determination method of Pt-Ru alloy film determination of alloyed Pt content and alloyed Ru content by X-ray photoelectron spectroscopy

未注明发布机构

  • DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

German Institute for Standardization

  • DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English

British Standards Institution (BSI)

  • BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

International Organization for Standardization (ISO)

  • ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

GSO

  • BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

SCC

  • 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer