X-ray Photoelectron Spectroscopy+
X-ray Photoelectron Spectroscopy+, Total:23 items.
The international standard classification for "X-ray Photoelectron Spectroscopy+" includes: Optical measuring instruments , Chemical analysis , Measurement of electrical and magnetic quantities , IT applications in science , Other non-ferrous metals and their alloys .
The Chinese standard classification for "X-ray Photoelectron Spectroscopy+" includes: Electron optics and other physical optics instrument , Basic standards and general methods , Integrated test system , Computer application , Precious metals and their alloys .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
- GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
- GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
- GB/T 28633-2012 Surface chemical analysis—X-ray photoelectron spectroscopy—Repeatability and constancy of intensity scale
- GB/T 25185-2010 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction
- GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
- GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
- GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- GB/T 25188-2010 Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
- GB/T 28893-2012 Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
Professional Standard - Electron
- SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
- SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Professional Standard - Non-ferrous Metal
- YS/T 644-2007 Determination method of Pt-Ru alloy film determination of alloyed Pt content and alloyed Ru content by X-ray photoelectron spectroscopy
未注明发布机构
- DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
German Institute for Standardization
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
British Standards Institution (BSI)
- BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
International Organization for Standardization (ISO)
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
GSO
- BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
SCC
- 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
X-ray Photoelectron Spectroscopy+,X-ray photoelectron spectroscopy,x-ray feature x-ray,Feature x-ray x-ray,x-ray copper ray,x-ray diffraction and x-rays,X-ray diffraction, X-ray fluorescence,radiofluorescence x-ray,X-ray photoelectron spectroscopy,x-ray photoelectron spectroscopy and x-ray x,X-ray photoelectron spectroscopy and x-rays,x-ray fluorescence x-ray diffraction,X-ray principle,x-ray photoelectron spectroscopy,X-ray fluorescence + X-ray diffraction,small angle x-ray x-ray,fluorescent x-ray x-ray,x-ray fluorescence x-ray,x-ray x-ray imaging,x-ray applications x-ray applications