spectral g peak

spectral g peak, Total:60 items.

The international standard classification for "spectral g peak" includes: Chemical analysis , Optical measuring instruments , General methods of tests and analysis for food products .

The Chinese standard classification for "spectral g peak" includes: Semiconductor emitting device , Basic standards and general methods , Optical testing instrument , Basic standards and general methods , Grain processing and products .

Professional Standard - Electron

SJ 2658.12-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Peak Emission Wavelength and Spectral Half Width
SJ/T 2658.12-2015 Measuring method for semiconductor infrared-emitting diode. Part 12: Peak-emission wavelength and spectral radiant bandwidth
SJ 2355.7-1983 Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GB/T 40069-2021 Nanotechnologies—Measurement of the number of layers of graphene-related two-dimensional (2D) materials—Raman spectroscopy method

Military Standard of the People's Republic of China-General Armament Department

GJB 8873-2016 High peak power laser device terminology
GJB/J 3352-1998 Calibration procedures for pulsed laser peak power meters
GJB 8546-2015 High peak power, high energy laser parameter terminology
GJB 9245-2017 High Peak Power Laser Optics Terminology

Professional Standard - Agriculture

1769药典一部-2010 Appendix VI G Ion Chromatography

Group Standards of the People's Republic of China

T/GDASE 0012-2020 Determination of Layer Number of Graphene Films by Laser Microscopy Confocal Raman Spectroscopy
T/CSTM 00166.1-2020 Characterization for graphene materials Part 1 Raman spectroscopy

Gansu Provincial Standard of the People's Republic of China

DB62/T 700-2001 Xifeng City Solar Greenhouse Construction Technical Regulations

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 28893-2012 Surface Chemical Analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
GB/T 28893-2024 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Methods used to determine peak intensities and information required when reporting results
GB/T 23212-2008 Determination of aflatoxin B1 B2 G1 G2 M1 M2 content in milk and milk powder—HPLC-fluorescence detection method

Professional Standard - Chemical Industry

HG/T 6184-2023 C. I. Disperse red 277 (Disperse fluorescent red G)

Professional Standard - Commodity Inspection

SN 0277-1993 Method for the determination of aflatoxin B1 B2 G1 G2 in cereals for export—Liquid chromatography

未注明发布机构

ANSI/TIA/EIA-492CAAB-2000(2005) Detail Specification for Class IVa Dispersion-Unshifted Single-Mode Optical Fibers with Low Water Peak

GSO

BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BH GSO ISO 20903:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results
GSO ISO 20903:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results

British Standards Institution (BSI)

BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
BS ISO 20903:2019 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
24/30454135 DC BS ISO 6863 Nuclear fuel technology - Preparation of spikes for isotope dilution mass spectrometry (IDMS)

International Organization for Standardization (ISO)

ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO 20903:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
ISO 20903:2011 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
ISO/CD 6863 Preparation of Plutonium and Uranium spikes for Isotope Dilution Mass Spectrometry (IDMS)

American Society for Testing and Materials (ASTM)

ASTM E827-07 Standard Practice for Identifying Elements by the Peaks in Auger Electron Spectroscopy
ASTM E827-02 Standard Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy
ASTM E827-95 Standard Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy

Korean Agency for Technology and Standards (KATS)

KS C 2375-2006(2021) Analytical method of polychlorinated biphenyls(PCBs)by gas chromatography peak pattern comparison
KS C 2375-2006(2016) Analytical method of polychlorinated biphenyls(PCBs)by gas chromatography peak pattern comparison
KS C 2375-2021 Analytical method of polychlorinated biphenyls(PCBs)by gas chromatography peak pattern comparison

Association Francaise de Normalisation

NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.

TIA - Telecommunications Industry Association

EIA/TIA-455-24-1991 FOTP-24 Water Peak Attenuation Measurement of Single-Mode Fibers
TIA/EIA-455-24-1991 FOTP-24 Water Peak Attenuation Measurement of Single-Mode Fibers

American National Standards Institute （ANSI)

ANSI/EIA/TIA 455-24:1991 Water Peak Attenuation Measurement of Single-Mode Fibers

SCC

MIL MIL-G-174B-1986 GLASS, OPTICAL (SUPERSEDING MIL-G-174A)
BS ISO 20903:2006 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
MIL MIL-G-2874E-1987 GLOVES, ANTI-FLASH, FLAME RESISTANT (SUPERSEDING MIL-G-2874D)

Defense Logistics Agency

DLA A-A-55433 VALID NOTICE 2-2011 Light, Chemiluminescent, 15 In - 8 Hr - A, G
DLA A-A-55133 VALID NOTICE 1-2005 LIGHT, CHEMILUMINESCENT, 6-IN - 30 MIN - G
DLA A-A-55133-1992 LIGHT, CHEMILUMINESCENT, 6-IN - 30 MIN - G

IX-ECMA

ECMA 279-1998 80 mm (1,23 Gbytes per Side) and 120 mm (3,95 Gbytes per Side) DVD-Recordable Disk (DVD-R)
ECMA 338-2002 80 mm (1,46 Gbytes per side) and 120 mm (4,70 Gbytes per side) DVD Re-recordable Disk (DVD-RW)
ECMA 359-2004 80 mm (1,46 Gbytes per side) and 120 mm (4,70 Gbytes per side) DVD Recordable Disk (DVD-R)
ECMA 330-2005 120 mm (4,7 Gbytes per side) and 80 mm (1,46 Gbytes per side) DVD Rewritable Disk (DVD-RAM) (3rd Edition)

United States Navy

NAVY A-A-55131-1992 LIGHT, CHEMILUMINESCENT, 6 IN - 8HR - A, G

RU-GOST R

GOST R 50005-1992 Lasers and solid-state laser heads. Measurement methods of peak local energy (power) density

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc.

ASHRAE SE-99-1-2-1999 Effect of Beam Solar Radiation Distribution on Peak Cooling Loads

International Telecommunication Union (ITU)

ITU-T G.984.3-2004 Gigabit-capable Passive Optical Networks (G-PON): Transmission convergence layer specification SERIES G: TRANSMISSION SYSTEMS AND MEDIA, DIGITAL SYSTEMS AND NETWORKS Digital sections and digital line system ?Optical line systems for local and access netw
ITU-T G.984.2 AMD 1-2006 Gigabit-capable Passive Optical Networks (G-PON): Physical Media Dependent (PMD) layer specification Amendment 1: New Appendix III – Industry best practice for 2.488 Gbit/s downstream, 1.244 Gbit/s upstream G-PON (Study Group 15)
ITU-T G.984.4 AMD 1-2005 Gigabit-capable Passive Optical Networks (GPON): ONT management and control interface specification Study Group 15
ITU-T G.984.2-2003 Gigabit-capable Passive Optical Networks (GPON): Physical Media Dependent (PMD) layer specification SERIES G: TRANSMISSION SYSTEMS AND MEDIA, DIGITAL SYSTEMS AND NETWORKS Digital sections and digital line system – Optical line systems for local and access
ITU-T G.984.4 AMD 3-2006 Gigabit-capable Passive Optical Networks (G-PON): ONT management and control interface specification Amendment 3 Study Group 15