Electron spectroscopy and spectrometers
Electron spectroscopy and spectrometers, Total:138 items.
The international standard classification for "Electron spectroscopy and spectrometers" includes: IT applications in science , Chemical analysis , Analytical chemistry in general , Analytical chemistry , Chemical laboratories. Laboratory equipment , Optical measuring instruments , Other standards related to optics and optical measurements .
The Chinese standard classification for "Electron spectroscopy and spectrometers" includes: Computer application , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Electron optics and other physical optics instrument , Optical Measurement , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , chromatograph .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
- GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
- GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
- GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
- GB/T 32266-2015 Method of performance testing for atomic fluorescence spectrometer
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
- GB/T 36244-2018 Inductively coupled plasma atomic emission spectrometer
- GB/T 21191-2007 Atomic fluorescence spectrometer
- GB/T 42027-2022 Gas-phase molecular absorption spectrometer
未注明发布机构
- DIN 51401 Beiblatt 1 E:2017-02 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
- AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- DIN 51401 Beiblatt 1:2013-08 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
- DIN 51401 E:2015-10 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
- DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
National Metrological Verification Regulations of the People's Republic of China
- JJG 768-2005 Verification Regulation of Emission Spectrometer
- JJG(教委) 09-1992 Verification Regulations for Electron Spectrometer
- JJG(地质) 1015-1990 Verification regulations for inductively coupled plasma direct reading spectrometer
- JJG 1151-2018 Liquid Chromatograph-Atomic Fluorescence Spectrometers
Group Standards of the People's Republic of China
- T/CAIA YQ004-2018 Performance testing method for liquid chromatograph coupled with atomic fluorescence spectrometer
- T/QGCML 1522-2023 FLA Micro Fiber Spectrometer
- T/CSTM 00962-2022 Evaluation method for spectrometer performance of spark discharge atomic emission
- T/ZZB 0673-2018 Emission spectrometer
- T/CAIA YQ003-2016 Testing Methods for Optical/Electrical Characteristics of Linear Charge Coupled Imaging Device for Spectrometer
- T/CAIA YQ006-2018 Performance testing method of Ion chromatography
- T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer
Professional Standard - Education
- JY/T 013-1996 General rules for electron spectroscopic analysis
Professional Standard - Agriculture
- GB/T 44147-2024 The method of performance testing for liquid chromatography coupled atomic fluorescence spectrometer
- JJG(教委) 023-1996 Verification Regulations for Atomic Absorption Spectrometer
- JJG(教委) 013-1996 Verification Regulations for Electron Spectrometer
- GB/T 43968-2024 General rules for high performance liquid chromatography-atomic fluorescence spectrometry analysis method
- JJG(教委) 015-1996 Verification Regulations for Inductively Coupled Plasma Atomic Emission Spectrometer
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
- GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- GB/T 36240-2018 Ion chromatographs
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
- GB/T 35158-2017 Verification method for Auger electron spectrometers
Professional Standard - Electron
- SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
- SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
Taiwan Provincial Standard of the People's Republic of China
- CNS 14341-1999 Optical spectrum analyzer
Jilin Provincial Standard of the People's Republic of China
- DB22/T 2414-2015 Micro fiber optic spectrometer
Professional Standard - Machinery
- JB/T 11145-2011 X-ray fluorescence spectrometer
- JB/T 9322-1999 Spectrum projector
- JB/T 5590-1991 Optical Filter of Optical Spectrum Instrument
- JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer
Professional Standard - Medicine
- YY/T 1740.3-2024 Clinical mass spectrometer-Part 3 : Inductively coupled plasma mass spectrometry
Korean Agency for Technology and Standards (KATS)
- KS D ISO 21270:2005 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
- KS D ISO 21270-2005(2020) Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
- KS D ISO 21270-2020 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
- KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
- KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
- KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS D ISO 19319-2020 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS M ISO 6286-2010(2020) Molecular absorption spectrometry-Vocabulary-General-Apparatus
- KS M ISO 6286-2020 Molecular absorption spectrometry-Vocabulary-General-Apparatus
- KS M ISO 6286:2010 Molecular absorption spectrometry-Vocabulary-General-Apparatus
International Organization for Standardization (ISO)
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- ISO 6286:1982 Molecular absorption spectrometry; Vocabulary; General; Apparatus
- ISO 20473:2007 Optics and photonics - Spectral bands
British Standards Institution (BSI)
- BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
- BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
- BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- BS ISO 20473:2007 Optics and photonics. Spectral bands
GSO
- GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
- OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- OS GSO ISO 6286:2015 Molecular absorption spectrometry -- Vocabulary -- General -- Apparatus
- GSO ISO 6286:2015 Molecular absorption spectrometry -- Vocabulary -- General -- Apparatus
- GSO ISO 20473:2021 Optics and photonics — Spectral bands
- BH GSO ISO 6286:2017 Molecular absorption spectrometry -- Vocabulary -- General -- Apparatus
- BH GSO ISO 20473:2022 Optics and photonics — Spectral bands
American Society for Testing and Materials (ASTM)
- ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
- ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
- ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
- ASTM E1770-95(2006) Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment
- ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
- ASTM E1770-95 Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment
- ASTM E1016-07(2020) Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
- ASTM E388-04(2023) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers
German Institute for Standardization
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
- DIN 51401:2016 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
- DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
- DIN 51401 Beiblatt 1:2017-07 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
- DIN 51401:2016-11 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
SCC
- 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- DIN ISO 16129 E:2020 Draft Document - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
- BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
- ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
- BS EN 61290-1-1:1998 Optical spectrum analyzer
- BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
KR-KS
- KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
SE-SIS
- SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers
CZ-CSN
- CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
U.S. Air Force
- AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
- AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER
Standard Association of Australia (SAA)
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
RU-GOST R
- GOST 27176-1986 Spectroscopic optical instruments. Terms and definitions
Japanese Industrial Standards Committee (JISC)
- JIS B 7079:2015 Optics and photonics -- Spectral bands
Association Francaise de Normalisation
- NF S11-700*NF ISO 20473:2007 Optics and photonics - Spectral bands.
- NF ISO 20473:2007 Optique et photonique - Bandes spectrales
- NF C93-845:2006 Calibration of optical spectrum analyzers.
European Committee for Standardization (CEN)
- CEN EN 62129-2006 Calibration of optical spectrum analyzers
Indonesia Standards
- SNI 06-6596-2001 Water treatment for metal analysis by atomic absorption spectrophotometers
RO-ASRO
- STAS 12814-1990 ALUMINIUM AND ALUMINIUM ALLOYS Analysis by optical emission spectro- metry
Auger spectroscopy and photoelectron spectroscopy,X-ray Spectroscopy and X-ray Photoelectron Spectroscopy,X-ray Spectroscopy and Electron Spectroscopy,and x-ray photoelectron spectroscopy,Scanning Electron Microscopy and Electron Spectroscopy,Electron spectroscopy and spectrometers,X-ray Photoelectric Spectroscopy and Auger Electron Spectroscopy,Photoelectron spectroscopy and Auger electron spectroscopy,Auger Electron Spectroscopy and X-rays,UV Photoelectron Spectroscopy and UV Spectroscopy,UV Spectroscopy and UV Photoelectron Spectroscopy,Electron and X-ray photoelectron spectroscopy,UV photoelectron and X-ray photoelectron spectroscopy,X-ray photoelectron spectroscopy and mass spectrometry,Photoelectron spectroscopy and X-ray spectroscopy