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Electron spectroscopy and spectrometers

Electron spectroscopy and spectrometers, Total:138 items.

The international standard classification for "Electron spectroscopy and spectrometers" includes: IT applications in science , Chemical analysis , Analytical chemistry in general , Analytical chemistry , Chemical laboratories. Laboratory equipment , Optical measuring instruments , Other standards related to optics and optical measurements .

The Chinese standard classification for "Electron spectroscopy and spectrometers" includes: Computer application , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Electron optics and other physical optics instrument , Optical Measurement , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , chromatograph .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
  • GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
  • GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
  • GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
  • GB/T 32266-2015 Method of performance testing for atomic fluorescence spectrometer
  • GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
  • GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
  • GB/T 36244-2018 Inductively coupled plasma atomic emission spectrometer
  • GB/T 21191-2007 Atomic fluorescence spectrometer
  • GB/T 42027-2022 Gas-phase molecular absorption spectrometer

未注明发布机构

  • DIN 51401 Beiblatt 1 E:2017-02 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
  • AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • DIN 51401 Beiblatt 1:2013-08 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
  • DIN 51401 E:2015-10 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
  • DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales

National Metrological Verification Regulations of the People's Republic of China

Group Standards of the People's Republic of China

Professional Standard - Education

  • JY/T 013-1996 General rules for electron spectroscopic analysis

Professional Standard - Agriculture

  • GB/T 44147-2024 The method of performance testing for liquid chromatography coupled atomic fluorescence spectrometer
  • JJG(教委) 023-1996 Verification Regulations for Atomic Absorption Spectrometer
  • JJG(教委) 013-1996 Verification Regulations for Electron Spectrometer
  • GB/T 43968-2024 General rules for high performance liquid chromatography-atomic fluorescence spectrometry analysis method
  • JJG(教委) 015-1996 Verification Regulations for Inductively Coupled Plasma Atomic Emission Spectrometer

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
  • GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • GB/T 36240-2018 Ion chromatographs

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
  • GB/T 35158-2017 Verification method for Auger electron spectrometers

Professional Standard - Electron

  • SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
  • SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers

Taiwan Provincial Standard of the People's Republic of China

Jilin Provincial Standard of the People's Republic of China

Professional Standard - Machinery

Professional Standard - Medicine

  • YY/T 1740.3-2024 Clinical mass spectrometer-Part 3 : Inductively coupled plasma mass spectrometry

Korean Agency for Technology and Standards (KATS)

  • KS D ISO 21270:2005 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 21270-2005(2020) Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 21270-2020 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
  • KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
  • KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 19319-2020 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS M ISO 6286-2010(2020) Molecular absorption spectrometry-Vocabulary-General-Apparatus
  • KS M ISO 6286-2020 Molecular absorption spectrometry-Vocabulary-General-Apparatus
  • KS M ISO 6286:2010 Molecular absorption spectrometry-Vocabulary-General-Apparatus

International Organization for Standardization (ISO)

  • ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
  • ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • ISO 6286:1982 Molecular absorption spectrometry; Vocabulary; General; Apparatus
  • ISO 20473:2007 Optics and photonics - Spectral bands

British Standards Institution (BSI)

  • BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
  • BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
  • BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
  • BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • BS ISO 20473:2007 Optics and photonics. Spectral bands

GSO

  • GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
  • OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
  • BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
  • OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
  • GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
  • OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
  • GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
  • BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
  • BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • OS GSO ISO 6286:2015 Molecular absorption spectrometry -- Vocabulary -- General -- Apparatus
  • GSO ISO 6286:2015 Molecular absorption spectrometry -- Vocabulary -- General -- Apparatus
  • GSO ISO 20473:2021 Optics and photonics — Spectral bands
  • BH GSO ISO 6286:2017 Molecular absorption spectrometry -- Vocabulary -- General -- Apparatus
  • BH GSO ISO 20473:2022 Optics and photonics — Spectral bands

American Society for Testing and Materials (ASTM)

  • ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
  • ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
  • ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
  • ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
  • ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
  • ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
  • ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
  • ASTM E1770-95(2006) Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment
  • ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
  • ASTM E1770-95 Standard Practice for Optimization of Electrothermal Atomic Absorption Spectrometric Equipment
  • ASTM E1016-07(2020) Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
  • ASTM E388-04(2023) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers

German Institute for Standardization

  • DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
  • DIN 51401:2016 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
  • DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
  • DIN 51401 Beiblatt 1:2017-07 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
  • DIN 51401:2016-11 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary

SCC

  • 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • DIN ISO 16129 E:2020 Draft Document - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
  • BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
  • ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
  • BS EN 61290-1-1:1998 Optical spectrum analyzer
  • BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters

KR-KS

SE-SIS

  • SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers

CZ-CSN

  • CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters

U.S. Air Force

Standard Association of Australia (SAA)

  • AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

RU-GOST R

Japanese Industrial Standards Committee (JISC)

Association Francaise de Normalisation

European Committee for Standardization (CEN)

Indonesia Standards

  • SNI 06-6596-2001 Water treatment for metal analysis by atomic absorption spectrophotometers

RO-ASRO

  • STAS 12814-1990 ALUMINIUM AND ALUMINIUM ALLOYS Analysis by optical emission spectro- metry