Electron Dispersion Spectroscopy

Electron Dispersion Spectroscopy, Total:345 items.

The international standard classification for "Electron Dispersion Spectroscopy" includes: Chemical analysis , Thermoplastic materials , Optics and optical measurements in general , Particle size analysis. sieving , Optical measuring instruments , Chemical technology (Vocabularies) , Electronic components in general , Chemical laboratories. Laboratory equipment , Ferrous metals in general , Copper and copper alloys , Analytical chemistry in general , IT applications in science , Optical equipment , Other non-ferrous metals and their alloys , Woodworking machines , Analytical chemistry , Education , Cadmium, cobalt and their alloys , Aluminium and aluminium alloys , Chemical analysis of metals .

The Chinese standard classification for "Electron Dispersion Spectroscopy" includes: Basic standards and general methods , Basic standards and general methods for synthetic resin and plastic , Optical instrument in general , Sieving, Sieve Plate and Sieve Screen , Electron optics and other physical optics instrument , Electronic element in general , Electrochemical, thermochemistry and optical profile type analyzer , Steel and iron alloy analysis method , Heavy metals and their alloys analysis method , Computer application , Magnifier and microscope , Rare refractory metals and their compounds , Hygiene, safety and labor protection , Special instruments for teaching , Light metals and their alloys analysis method , Rare metals and their alloys analysis method , Optical Measurement , Chemical Measurement .

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GB/T 36214.5-2018 Plastics—Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography—Part 5:Method using light-scattering detection

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 14203-2016 General rules for spark discharge atomic emission spectrometry
GB/T 31010-2014 Spectral calibration in laboratory for dispersive hyperspectral sensor
GB/T 29783-2013 Determination of chromium(Ⅵ) in electrical and electronic products—Atomic fluorescence spectrometry
GB/T 15337-2008 General rules for atomic absorption spectrometric analysis
GB/T 19627-2005 Particle size analysis--Photon correlation spectroscopy
GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
GB/T 31010-2014(英文版) Laboratory spectral calibration of dispersive hyperspectral remote sensors
GB/T 8322-2008 Molecular absorption spectrometry - Terminology
GB/T 4470-1998 Analytical spectroscopic methods-Flame emission,atomic absorption and atomic fluorescence-Vocabulary
GB/T 4324.9-2012 Methods for chemical analysis of tungsten - Part 9: Determination of cadmium content - Inductively coupled plasma atomic emission spectrometry and flame atomic absorption spectrometry
GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/T 13293.2-1991 Higher purity copper cathode. Determination of bismuth content. Hydride generation-atomic fluorescence spectrometric method
GB/T 21191-2007 Atomic fluorescence spectrometer
GB/T 36244-2018 Inductively coupled plasma atomic emission spectrometer
GB/T 42027-2022 Gas-phase molecular absorption spectrometer
GB/T 4324.15-2008 Methods for chemical analysis of tungsten - Determination of magnesium content - The flame atomic absorption spectrometry and inductively coupled plasma atomic emission spectrometry
GB/T 43847-2024 Optics and photonics—Spectral bands
GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
GB/T 15337-1994 General rules for atomic absorption spectrometric analysis
GB/T 8322-1987 Molecular absorption spectrometry--Terminology
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method

Professional Standard - Commodity Inspection

SN/T 2003.4-2006 Determination of lead, mercury, chromium, cadmium and bromine in electrical and electrical and electronic equipment. Part 4: Qualitative screening by energy dispersive X-ray fluorescence spectrometric method
SN/T 2003.5-2006 Determination of lead, mercury, chromium, cadmium and bromine in electrical and electrical and electronic equipment. Part 5: Qualitative screening by energy dispersive X-ray fluorescence spectrometric method
SN/T 2004.7-2006 Determination of lead,cadmium in electrical and electronic equipment.Part 7:Atomic fluorescence spectrometry
SN/T 2004.1-2005 Determination of mercury in electrical and electronic equipment - Part 1: Hydride generation-atomic fluorescence spectrometric method

Taiwan Provincial Standard of the People's Republic of China

CNS 14896.14-2005 Titanium - Method for atomic emission spectrometric analysis
CNS 11209-1995 General Rules for Chemical Analysis by Atomic Absorption Spectrophotometry
CNS 11206-2002 Iron and steel─Methods for atomic absorption spectrometric analysis
CNS 12126-1987 Method of Chemical Analysis by Atomic Absorption Spectrophotometry for Copper and Copper Alloys
CNS 12416-2006 General rules for atomic emission spectrometry
CNS 14896-14-2005 Titanium - Method for atomic emission spectrometric analysis

Professional Standard - Education

JY/T 0565-2020 General rules for electrothermal atomic absorption spectrometry
JY/T 0566-2020 General rules for atomic fluorescence spectrometry
JY/T 0567-2020 General rules for inductively coupled plasma optical emission spectrometry
JY/T 0569-2020 General rules for wavelength dispersive X-ray fluorescence spectrometry

工业和信息化部

YS/T 3015.6-2017 Methods for chemical analysis of gold-loaded carbon-Part 6:Deterniination of mercury content-Atomic fluorescence spectrometry and inductively coupled plasma atomic emission spectrometry
YS/T 3015.7-2017 Methods for chemical analysis of gold-loaded carbon-Part 7:Determination of arsenic content-Atomic fluorescence spectrometry and inductively coupled plasma atomic emission spectrometry
YS/T 483-2022 Methods for analysis of copper and copper alloys-X-Ray fluorescence spectrometric(wavelength dispersive)

未注明发布机构

DIN ISO 22309 E:2015-05 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
DIN EN ISO 16014-5 E:2018-04 Plastics Determination of average molecular mass and molecular mass distribution of polymers using exclusion chromatography Part 5: Light scattering detection method (draft)
AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
DIN 51401 Beiblatt 1 E:2017-02 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
DIN 51401 E:2015-10 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
DIN EN ISO 8754:1995 Petroleum products - Determination of sulfur content - Energy-dispersive X-ray fluorescence spectrometry
DIN 51009 E:2012-07 Optical atomic spectral analysis - Principles and definitions
ASTM RR-E01-1061 2006 E0539-Test Method for Analysis of Titanium Alloys by Wavelength Dispersive X-Ray Fluorescence Spectrometry
ANSI/IES TM-27-20 IES STANDARD FORMAT FOR THE ELECTRONIC TRANSFER OF SPECTRAL DATA
DIN 51401 Beiblatt 1:2013-08 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

Professional Standard - Agriculture

778兽药典一部-2015 Appendix Contents 0400 Spectroscopy 0406 Atomic Absorption Spectrophotometry
GB/T 43968-2024 General rules for high performance liquid chromatography-atomic fluorescence spectrometry analysis method
780兽药典一部-2015 Appendix Contents 0400 Spectroscopy 0411 Inductively Coupled Plasma Atomic Emission Spectrometry
52药典四部-2020 0411 Inductively coupled plasma atomic emission spectrometry
JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer
776兽药典二部-2015 Appendix Contents 0400 Spectroscopy 0412 Inductively Coupled Plasma Atomic Emission Spectrometry
72药典四部-2015 0411 Inductively coupled plasma atomic emission spectrometry

工业和信息化部/国家能源局

JB/T 12962.1-2016 Energy dispersive X-ray fluorescence spectrometer. Part 1: General specification
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer

Professional Standard - Non-ferrous Metal

YS/T 483-2005 Methods for analysis of copper and copper alloys--X-Ray fluorescence spectrometric(wavelength dispersive)
YS/T 739-2010 Determination of cryolite rate and main components of electrolyte—X-ray fluorescence spectrometric analysis method
YS/T 536.4-2009 Methods for chemical analysis of bismuth - Determination of silver content - Flame atomic absorption spectrophotometric method and electrothermal atomic absorption spectrometric method

Professional Standard - Chemical Industry

HG/T 6184～6186-2023 C.I. Disperse Red 277 (Disperse Fluorescent Red G), C.I. Disperse Yellow 184:1 (Disperse Fluorescent Yellow 10GN), and C.I. Disperse Yellow 82 (Dispersed Fluorescent Yellow 8GFF) (2023)

Professional Standard - Aviation

HB 7716.16-2022 Spectrometric analysis of titanium alloys-Part 16: Determination of platinum, palladium content-Inductively coupled plasma atomic emission spectrometric method
HB 7716.17-2022 Spectrometric analysis of titanium alloys-Part 17: Determination of boron content-Inductively coupled plasma atomicemission spectrometric method
HB 6731.11-2005 Methods for spectrometric analysis of aluminium alloys - Part 11: Determination of beryllium content by flame atomic absorption spectrometric method
HB 7716.14-2002 Spectrometric analysis of titanium alloys Part 14: Determination of yttrium content -- Inductively coupled plasma atomic emission spectrometric method
HB 6731.12-2005 Methods for spectrometric analysis of aluminium alloys -- Part 12:Determination of silicon content by flame atomic absorption spectrometric method
HB 7716.18-2022 Spectrometric analysis of titanium alloys-Part 18: Determination of lithium, lead content-Inductively coupled plasma atomicemission spectrometric method
HB 7716.15-2022 Spectrometric analysis of titanium alloys-Part 15:Determination of tungsten, niobium, tantalum, nickel content-Inductively coupled plasma atomic emission spectrometric method

National Metrological Verification Regulations of the People's Republic of China

JJG 810-1993 Wavelength Dispersive X-Ray Fluorescence Spectrometers
JJG 939-1998 Verification Regulation of Non-disperse Atomic Fluoreacence Spectrometer

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1826-2016 Determination of Composition of Alloy Jewelry by Energy Dispersive X-ray Fluorescence Spectrometry

Ningxia Provincial Standard of the People's Republic of China

DB64/T 1577-2018 Determination of betaine content in wolfberry fruit by high performance liquid chromatography-evaporative light scattering method

National Metrological Technical Specifications of the People's Republic of China

JJF 2024-2023 Calibration Specification for Energy Dispersive X-Ray Fluorescence Spectrometers

Group Standards of the People's Republic of China

T/CSTM 00197-2021 Graphene quantum dots — Determination of relative fluorescence quantum efficiency for the blue emission — Molecular fluorescence spectroscopy

Professional Standard - Electron

SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy

Military Standard of the People's Republic of China-General Armament Department

GJB/Z 40.6-1993 Military vacuum electronic devices series spectrum vacuum optoelectronic devices
GJB/Z 48.1A-2011 Series programmes for military electronic components and devices Optical fibres
GJB/Z 49.1A-2013 Military electronic components series type spectrum optical cable

国家能源局

SY/T 6404-2018 Analytical method for metal elements in rock by ICP-AES and ICP-MS

Henan Provincial Standard of the People's Republic of China

DB41/T 1189-2016 Analysis of Chemical Composition of Polymetallic Minerals by Inductively Coupled Plasma-Atomic Emission Spectrometry

International Organization for Standardization (ISO)

ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO 14594:2003 Microbeam analysis - Electron microprobe analysis (Castaing Microprobe) - Guidelines for determining experimental parameters for wavelength dispersive spectrometry
ISO 14594:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
ISO 21501-1:2009 Determination of particle size distribution - Single particle light interaction methods - Part 1: Light scattering aerosol spectrometer
ISO 14594:2003/Cor 1:2009 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy; Technical Corrigendum 1
ISO 19962:2019 Optics and photonics — Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 13321:1996 Particle size analysis - Photon correlation spectroscopy
ISO 20473:2007 Optics and photonics - Spectral bands
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO 16014-5:2019 Plastics — Determination of average molecular weight and molecular weight distribution of polymers using size-exclusion chromatography — Part 5: Light-scattering method
ISO 18118:2004 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 18118:2015 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 21475:2019 Plastics — Methods of exposure to determine the wavelength dependent degradation using spectrally dispersed radiation
ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
ISO 22309:2011 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 16014-5:2012 Plastics - Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography - Part 5: Method using light-scattering detection

GSO

GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BH GSO ISO 19962:2022 Optics and photonics — Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
GSO ISO 19962:2021 Optics and photonics — Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
BH GSO ISO 14594:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BH GSO ISO 17470:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
OS GSO ISO 21501-1:2013 Determination of particle size distribution -- Single particle light interaction methods -- Part 1: Light scattering aerosol spectrometer
BH GSO ISO 21501-1:2016 Determination of particle size distribution -- Single particle light interaction methods -- Part 1: Light scattering aerosol spectrometer
BH GSO ISO 11938:2017 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
OS GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
GSO ISO 13321:2013 Particle size analysis -- Photon correlation spectroscopy
GSO ISO 14594:2015 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BH GSO ISO 13321:2016 Particle size analysis -- Photon correlation spectroscopy
GSO ISO 21501-1:2013 Determination of particle size distribution -- Single particle light interaction methods -- Part 1: Light scattering aerosol spectrometer
BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
GSO ISO 17470:2015 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 20473:2021 Optics and photonics — Spectral bands
BH GSO ISO 20473:2022 Optics and photonics — Spectral bands
BH GSO ISO 22489:2017 Microbeam analysis -- Electron probe microanalysis -- Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
GSO ISO 26845:2015 Chemical analysis of refractories -- General requirements for wet chemical analysis, atomic absorption spectrometry (AAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES) methods
GSO ISO/TS 10798:2013 Nanotechnologies -- Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
GSO ISO 22489:2015 Microbeam analysis -- Electron probe microanalysis -- Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy

British Standards Institution (BSI)

BS ISO 14594:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 19962:2019 Optics and photonics. Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
BS ISO 14594:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 14594:2024 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS 3727-20:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Spectrographic method
BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BS EN ISO 16014-5:2019 Plastics. Determination of average molecular weight and molecular weight distribution of polymers using size-exclusion chromatography. Light-scattering method
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS ISO 20473:2007 Optics and photonics. Spectral bands
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 21501-2:2007 Determination of particle size distribution. Single particle light interaction methods. Light scattering liquid-borne particle counter
BS ISO 21501-1:2009 Determination of particle size distribution - Single particle light interaction methods - Light scattering aerosol spectrometer
BS EN ISO 16014-5:2012 Plastics. Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography. Method using light-scattering detection
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 18118:2005 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS EN 62321-5:2014 Determination of certain substances in electrotechnical products. Cadmium, lead and chromium in polymers and electronics and cadmium and lead in metals by AAS, AFS, ICP-OES and ICP-MS

Association Francaise de Normalisation

NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
NF ISO 19962:2019 Optics and photonics - Spectroscopic measurement methods for integrated scattering by optical elements with parallel planes
NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
NF X21-013*NF ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy.
NF S10-048*NF ISO 19962:2019 Optics and photonics - Spectroscopic measurement methods for integrated scattering by plane parallel optical elements
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
NF ISO 11938:2012 Microbeam analysis - Electron microprobe analysis (Castaing microprobe) - Elemental mapping analysis methods using wavelength dispersive spectrometry
NF X11-672:1996 Particle size analysis. Photon correlation spectroscopy.
NF ISO 20473:2007 Optique et photonique - Bandes spectrales
NF S11-700*NF ISO 20473:2007 Optics and photonics - Spectral bands.
NF EN ISO 16014-5:2019 Plastics - Determination of the average molecular mass and molecular mass distribution of polymers by size exclusion chromatography - Part 5: light scattering method
NF C05-100-4*NF EN 62321-4:2014 Determination of certain substances in electrotechnical products - Part 4 : mercury in polymers, metals and electronics by CV-AAS, CV-AFS, ICP-OES and ICP-MS
NF M07-053*NF EN ISO 8754:2003 Petroleum products - Determination of sulfur content - Energy-dispersive X-ray fluorescence spectrometry
NF EN IEC 61280-1-3:2021 Test procedures for fibronic telecommunications subsystems - Part 1-3: general telecommunications subsystems - Measurement of central wavelength, spectral width and additional spectral characteristics...
FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
NF C05-100-5*NF EN 62321-5:2014 Determination of certain substances in electrotechnical products - Part 5 : cadmium, lead and chromium in polymers and electronics and cadmium and lead in metals by AAS, AFS, ICP-OES and ICP-MS
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
FD CEN/TR 10377:2023 Guidelines for the preparation of routine methods using wavelength-dispersive X-ray fluorescence spectrometry

Standard Association of Australia （SAA）

ISO 14594:2024 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
AS 4549.1:1999 Particle size analysis - Photon correlation spectroscopy
AS 4392.1:1996 Heavy mineral sands - Analysis by wavelength dispersive X-ray fluorescence spectrometry - Titaniferous mineral sands
AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
AS 4392.1:1996/Amdt 1:1996 Analysis of titanium-containing ores by wavelength dispersive X-ray fluorescence spectrometry of heavy mineral sands
AS 4392.2:1997 Heavy mineral sands - Analysis by wavelength dispersive X-ray fluorescence spectrometry - Zircon materials
AS 4392.1:1996/Amdt 2:1999 Analysis of titanium-containing ores by wavelength dispersive X-ray fluorescence spectrometry of heavy mineral sands
AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales

Korean Agency for Technology and Standards (KATS)

KS D ISO 14594:2012 Microbeam analysis－Electron probe microanalysis－Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
KS D ISO 14594-2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
KS D 1852-2005 Methods for photoelectric emission spectrochemical analysis of aluminium and aluminium alloys
KS D 1673-2007 Methods for inductively coupled plasma emission spectrochemical analysis of steel
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489-2023 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D 1652-2022 Iron and steel — Method for spark discharge atomic emission spectrometric analysis
KS D 1652-2007(2017) Iron and steel－Method for spark discharge atomic emission spectrometric analysis
KS D 2553-2015 Tantalum－Method for atomic absorption spectrometric analysis
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 18118:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
KS L ISO 26845-2012(2017) Chemical analysis of refractories－General requirements for wet chemical analysis, atomic absorption spectrometry and inductively coupled plasma atomic emission spectrometry methods
KS D 1652-2007 Iron and steel-Method for spark discharge atomic emission spectrometric analysis
KS L ISO 26845-2012(2022) Chemical analysis of refractories－General requirements for wet chemical analysis, atomic absorption spectrometry and inductively coupled plasma atomic emission spectrometry methods
KS L ISO 26845-2022 Chemical analysis of refractories－General requirements for wet chemical analysis, atomic absorption spectrometry and inductively coupled plasma atomic emission spectrometry methods
KS E 3030-1982 Atomic absorption spectrochemical analysis for iron ores
KS D 2553-2015(2020) Tantalum－Method for atomic absorption spectrometric analysis
KS E 3030-2007(2012) Atomic absorption spectrochemical analysis for iron ores
KS M 0063-1997 Light scattering automatic particle counter
KS B 6336-2022 Light scattering automatic particle counter
KS B 6336-1992(2022) Light scattering automatic particle counter
KS D ISO 22309:2011 Microbeam analysis-Quantitative analysis using energy-dispersive spectrometry(EDS)
KS D 2568-2019 Tantalum－Method for atomic absorption spectrometric analysis
KS M 0012-2009(2019) General rules for molecular absorptiometric analysis
KS D 2568-2008 Tantalum－Method for atomic absorption spectrometric analysis
KS D ISO 22309-2011(2016) Microbeam analysis－Quantitative analysis using energy-dispersive spectrometry(EDS)
KS D 2553-2020 Tantalum－Method for atomic absorption spectrometric analysis
KS B 6336-1992(2017) Light scattering automatic particle counter
KS D ISO 22309-2011(2021) Microbeam analysis－Quantitative analysis using energy-dispersive spectrometry(EDS)
KS M ISO 6955-2016(2021) Analytical spectroscopic methods－Flame emission,atomic absorption, and atomic fluorescence－Vocabulary
KS D ISO 22309-2021 Microbeam analysis－Quantitative analysis using energy-dispersive spectrometry(EDS)
KS M 0016-2010(2020) General rules for atomic absorption spectrochemical analysis

KR-KS

KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D 1652-2007(2017)(英文版) Iron and steel－Method for spark discharge atomic emission spectrometric analysis
KS M ISO 6955-2016 Analytical spectroscopic methods－Flame emission,atomic absorption, and atomic fluorescence－Vocabulary
KS M ISO 14597-2003(2023) Petroleum products - Measurement of vanadium and nickel content - Wavelength - Distributed X-ray fluorescence spectroscopy

Japanese Industrial Standards Committee (JISC)

JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
JIS B 7081:2017 Optics and photonics -- Spectroscopic measurement methods for integrated scattering by plane optical elements
JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
JIS G 1253:2002 Iron and steel -- Method for spark discharge atomic emission spectrometric analysis
JIS B 7079:2015 Optics and photonics -- Spectral bands
JIS K 1310-3:2000 Hydrochloric acid for industrial use -- Part 3: Determination of iron content -- 1,10-Phenanthroline molecular absorption spectrometry, Electrothermal type atomic absorption spectrometry, inductively coupled plasma atomic emission spectrometry
JIS G 1258:1999 Iron and steel -- Methods for inductively coupled plasma atomic emission spectrometry
JIS H 1630:1995 Method for atomic emission spectrometric analysis of titanium
JIS H 1630:1975 Method for atomic emission spectrometric analysis of titanium
JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
JIS Z 8826:2005 Particle size analysis -- Photon correlation spectroscopy
JIS B 9921:1997 Light scattering automatic particle counter
JIS H 1683:2002 Tantalum -- Method for atomic absorption spectrometric analysis
JIS B 9925:2010 Light scattering liquid-borne particle counter
JIS G 1257:1994 Iron and steel -- Methods for atomic absorption spectrometric analysis

SCC

BS ISO 17470:2004 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
VDI 3869 BLATT 3-2010 Measuring ammonia in the ambient air — Sampling with coated diffusion separators (denuders) — Photometric or ion chromatographic analysis
08/30168969 DC BS ISO 21501-1. Determination of particle size distribution. Single particle light interaction methods. Part 1. Light scattering aerosol spectrometer
VDI 3869 BLATT 4-2012 Measuring ammonia in outdoor air — Sampling with passive samplers — Photometric or ion chromatographic analysis
10/30185165 DC BS ISO 11938. Microbeam analysis. Electron probe microanalysis. Methods of elemental area analysis using wavelength-dispersive spectroscopy
VDI 3869 BLATT 3-2010 Measuring ammonia in the ambient air — Sampling with coated diffusion separators (denuders) — Photometric or ion chromatographic analysis
BS ISO 22489:2006 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
AS 2134.1:1988 Recommended practice for chemical analysis by atomic absorption spectrometry - Flame atomic absorption spectrometry
DANSK DS/ISO 16014-5:2019 Plastics – Determination of average molecular weight and molecular weight distribution of polymers using size-exclusion chromatography – Part 5: Light-scattering method
DANSK DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 22309:2006 Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS)
DIN 51401 E:2015 Draft Document - Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
11/30199190 DC BS ISO 15632. Microbeam analysis. Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
DIN 51009 E:2012 Draft Document - Optical atomic spectral analysis - Principles and definitions
AS 3641.2:1990 Recommended practice for atomic emission spectrometric analysis - Inductively coupled plasma excitation
AENOR UNE-EN ISO 16014-5:2020 Plastics - Determination of average molecular weight and molecular weight distribution of polymers using size-exclusion chromatography - Part 5: Light-scattering method (ISO 16014-5:2019)
09/30191924 DC BS EN ISO 16014-5. Plastics. Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography. Part 5. Light-scattering method

American Society for Testing and Materials (ASTM)

ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E10-08 Standard Test Method for Brinell Hardness of Metallic Materials
ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis
ASTM E10-15 Standard Test Method for Brinell Hardness of Metallic Materials
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1097-97 Standard Guide for Direct Current Plasma Emission Spectrometry Analysis
ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E995-04 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1621-13 Standard Guide for Elemental Analysis by Wavelength Dispersive X-Ray Fluorescence Spectrometry
ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E131-02 Standard Terminology Relating to Molecular Spectroscopy
ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers

German Institute for Standardization

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 13321:2004 Particle size analysis - Photon correlation spectroscopy (ISO 13321:1996)
DIN 51401:2016 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
DIN 51401 Beiblatt 1:2017-07 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary; Supplement 1: Explanations
DIN 51401:2016-11 Atomic absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS) - Vocabulary
DIN EN ISO 16014-5:2019-09 Plastics - Determination of average molecular weight and molecular weight distribution of polymers using size-exclusion chromatography - Part 5: Light-scattering method (ISO 16014-5:2019); German version EN ISO 16014-5:2019
DIN 51009:2013-11 Optical atomic spectral analysis - Principles and definitions
DIN 51009:2001 Optical atomic spectral analysis - Principles and definitions
DIN 51009:2013 Optical atomic spectral analysis - Principles and definitions
DIN EN ISO 8754:2003 Petroleum products - Determination of sulfur content - Energy-dispersive X-ray fluorescence spectrometry (ISO 8754:2003); German version EN ISO 8754:2003
DIN EN 14242:2004 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis; German version EN 14242:2004

Society of Motion Picture and Television Engineers (SMPTE)

SMPTE 117M-2001 Motion-Picture Film - Photographic Audio Record - Spectral Diffuse Density

VDI - Verein Deutscher Ingenieure

VDI 3869 Blatt 3-2008 Measurement of ammonia in ambient air - Sampling with diffusion separators (denuders) - Photometric or ion chromatographic analysis

SE-SIS

SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector

RAPPORT BO.633-3 FRENCH-1986 ORBIT AND FREQUENCY PLANNING IN THE BROADCASTING-SATELLITE SERVICE

ES-UNE

UNE-EN ISO 16014-5:2020 Plastics - Determination of average molecular weight and molecular weight distribution of polymers using size-exclusion chromatography - Part 5: Light-scattering method (ISO 16014-5:2019)

International Electrotechnical Commission (IEC)

IEC 62321-5:2013 Determination of certain substances in electrotechnical products - Part 5: Determination of cadmium, lead, and chromium in polymers and electronics and cadmium and lead in metals by AAS, AFS, ICP- OES and ICP-MS

RU-GOST R

GOST 17261-2008 Zinc. Methods of atomic-emission spectral analysis
GOST 27981.1-1988 Copper of high purity. Methods of atomic-spectral analysis
GOST R 54153-2010 Steel. Method of atomic emission spectral analysis
GOST 27981.1-2015 High purity copper. Method of atomic-spectral analysis
GOST 18895-1981 Steel. Method of photoelectric spectral analysis
GOST 8776-2010 Cobalt. Methods of chemical-atomic-emission spectral analysis
GOST 6012-1978 Nickel. Methods of chemical-atomic-emission spectral analysis

Danish Standards Foundation

DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
DS/EN 14242:2004 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis

European Committee for Standardization (CEN)

EN ISO 16014-5:2019 Plastics - Determination of average molecular weight and molecular weight distribution of polymers using size-exclusion chromatography - Part 5: Light-scattering method (ISO 16014-5:2019)
EN ISO 16014-5:2012 Plastics - Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography - Part 5: Method using light-scattering detection
EN 14242:2004 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis

Lithuanian Standards Office

LST EN 62321-4-2014 Determination of certain substances in electrotechnical products - Part 4: Mercury in polymers, metals and electronics by CV-AAS, CV-AFS, ICP-OES and ICP-MS (IEC 62321-4:2013)
LST EN 14242-2005 Aluminium and aluminium alloys - Chemical analysis - Inductively coupled plasma optical emission spectral analysis