Auger Electronic Sample Preparation

Auger Electronic Sample Preparation, Total:82 items.

The international standard classification for "Auger Electronic Sample Preparation" includes: Chemical analysis , Optical equipment , Measurement of electrical and magnetic quantities , IT applications in science .

The Chinese standard classification for "Auger Electronic Sample Preparation" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Integrated test system , Computer application .

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 35158-2017 Verification method for Auger electron spectrometers
GB/T 32998-2016 Surface chemical analysis一Auger electron spectroscopy一 Reporting of methods used for charge control and charge correction

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
GB/T 25187-2010 Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/T 29558-2013 Surface chemical analysis—Auger electron spectroscopy—Repeatability and constancy of intensity scale
GB/Z 32494-2016 Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information

Professional Standard - Electron

SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
SJ/T 10457-1993 Standard guide for depth profiling in auger electron spectroscopy

Professional Standard - Machinery

JB/T 6976-1993 Auger Electron Spectroscopy Element Identification Method

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 36533-2018 Determination of the chemical state of micro-iron in silicate—Auger electron spectroscopy
GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy

未注明发布机构

DIN ISO 16242 E:2019-10 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)

American Society for Testing and Materials (ASTM)

ASTM E1127-08(2015) Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM E1127-08 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM E1127-91(1997) Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM E983-10(2018) Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E983-05 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E983-94(1999) Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
ASTM E983-19 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E827-07 Standard Practice for Identifying Elements by the Peaks in Auger Electron Spectroscopy
ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E984-12(2020) Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E984-95 Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E983-10 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
ASTM E984-95(2001) Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
ASTM E984-12 Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
ASTM E984-06 Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy

GSO

BH GSO ISO 29081:2016 Surface chemical analysis -- Auger electron spectroscopy -- Reporting of methods used for charge control and charge correction
OS GSO ISO 29081:2013 Surface chemical analysis -- Auger electron spectroscopy -- Reporting of methods used for charge control and charge correction
GSO ISO/TR 18394:2021 Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information
GSO ISO 16242:2015 Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES)
BH GSO ISO 16242:2017 Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES)
OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale

Korean Agency for Technology and Standards (KATS)

KS F 2319-2016 Standard method for soil investigation and sampling by Auger borings
KS F 2319-1986 Standard method for soil investigation and sampling by Auger borings
KS D ISO 15471-2020 Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale

British Standards Institution (BSI)

BS ISO 29081:2010 Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
BS PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS ISO 16242:2011 Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
BS ISO 15471:2016 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution

International Organization for Standardization (ISO)

ISO 29081:2010 Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
ISO/TR 18394:2016 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
ISO/TR 18394:2006 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
ISO 16242:2011 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution

SCC

ASTM E983-04 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
09/30184131 DC BS ISO 29081. Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
BS PD ISO/TR 18394:2006 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
BS ISO 15471:2004 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters

Association Francaise de Normalisation

NF X21-068*NF ISO 29081:2010 Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
NF ISO 16242:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie des électrons Auger (AES)
NF ISO 29081:2010 Chemical analysis of surfaces - Auger electron spectroscopy - Indication of the methods used for the control and correction of the charge
NF X21-072*NF ISO 16242:2012 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES).
NF ISO 24236:2006 Chemical analysis of surfaces - Auger electron spectroscopy - Repeatability and constancy of the energy scale

German Institute for Standardization

DIN ISO 16242:2020-05 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES) (ISO 16242:2011); Text in English

Others: Auger Electron Spectroscopy Sample Preparation,Auger Electron Spectroscopy Sample Preparation,Auger Electronic Sample Preparation