How to analyze Auger electron spectroscopy

How to analyze Auger electron spectroscopy, Total:82 items.

The international standard classification for "How to analyze Auger electron spectroscopy" includes: Optical equipment , Chemical analysis , IT applications in science .

The Chinese standard classification for "How to analyze Auger electron spectroscopy" includes: Electron optics and other physical optics instrument , Basic standards and general methods , Computer application .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis
GB/Z 32494-2016 Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information
GB/T 25187-2010 Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
GB/T 29558-2013 Surface chemical analysis—Auger electron spectroscopy—Repeatability and constancy of intensity scale

Professional Standard - Electron

SJ/T 10457-1993 Standard guide for depth profiling in auger electron spectroscopy

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 32565-2016 Surface chemical analysis--Recording and reporting data in Auger electron spectroscopy(AES)
GB/T 35158-2017 Verification method for Auger electron spectrometers

Professional Standard - Machinery

JB/T 6976-1993 Auger Electron Spectroscopy Element Identification Method

未注明发布机构

DIN ISO 16242 E:2019-10 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)

GSO

GSO ISO/TR 18394:2021 Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information
OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
GSO ISO 16242:2015 Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES)
BH GSO ISO 16242:2017 Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES)
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
OS GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
BH GSO ISO 17974:2016 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
BH GSO ISO 29081:2016 Surface chemical analysis -- Auger electron spectroscopy -- Reporting of methods used for charge control and charge correction
OS GSO ISO 29081:2013 Surface chemical analysis -- Auger electron spectroscopy -- Reporting of methods used for charge control and charge correction

American Society for Testing and Materials (ASTM)

ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

British Standards Institution (BSI)

PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
BS ISO 15471:2016 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 16242:2011 Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
BS ISO 29081:2010 Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
BS PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
23/30469291 DC BS ISO 17973. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis

International Organization for Standardization (ISO)

ISO/TR 18394:2016 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
ISO 16242:2011 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)
ISO/TR 18394:2006 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
ISO 29081:2010 Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser

SCC

BS PD ISO/TR 18394:2006 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
BS ISO 15471:2004 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
10/30199172 DC BS ISO 16242. Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
09/30184131 DC BS ISO 29081. Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction

Association Francaise de Normalisation

NF ISO 16242:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie des électrons Auger (AES)
NF ISO 24236:2006 Chemical analysis of surfaces - Auger electron spectroscopy - Repeatability and constancy of the energy scale
NF X21-072*NF ISO 16242:2012 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES).
NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire

Korean Agency for Technology and Standards (KATS)

KS D ISO 15471-2020 Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 17973-2021 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 17973-2011(2016) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 15471-2005(2020) Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 17974-2021 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 15471:2005 Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 17974-2011(2016) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 19319:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 19319-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer

German Institute for Standardization

DIN ISO 16242:2020-05 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES) (ISO 16242:2011); Text in English

BSI

BS ISO 17973:2024 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis

Standard Association of Australia （SAA）

ISO 17973:2024 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis

Japanese Industrial Standards Committee (JISC)

JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters

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