xps energy spectrum and aes energy spectrum
xps energy spectrum and aes energy spectrum, Total:45 items.
The international standard classification for "xps energy spectrum and aes energy spectrum" includes: Chemical analysis , Testing of metals in general , Analytical chemistry .
The Chinese standard classification for "xps energy spectrum and aes energy spectrum" includes: Basic standards and general methods , Rare metals and their alloys analysis method , Basic standards and general methods .
未注明发布机构
- SEMI F72-0309-2009 TEST METHOD FOR AUGER ELECTRON SPECTROSCOPY (AES) EVALUATION OF OXIDE LAYER OF WETTED SURFACES OF PASSIVATED 316L STAINLESS STEEL COMPONENTS
- DIN ISO 16242 E:2019-10 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33502-2017 Surface chemical analysis―Recording and reporting data in X-ray photoelectron spectroscopy(XPS）
- GB/T 32565-2016 Surface chemical analysis--Recording and reporting data in Auger electron spectroscopy(AES)
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 16481-1996 STANDARD spectrum tables of microwave plasma torch-atomic emitting spectrum of rare earth
- GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
- GB/T 32264-2015 Method of performance testing for gas chromatography-single quadrupole mass pectrometry
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
Professional Standard - Nuclear Industry
- EJ/T 1139-2001 γ-ray radiation meters and γ-ray spectrometers used for prospecting-characteristics and test methods
- EJ/T 20183-2018 Gamma Spectrum Logging Specifications
Professional Standard - Electron
- SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 2067-2023 Calibration Specification for Energy-Dispersive X-ray Spectrometers
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 09-1992 Verification Regulations for Electron Spectrometer
Group Standards of the People's Republic of China
- T/NAIA 048-2021 Determination of vitamin B12 in functional beverages by liquid chromatography-mass spectrometry/mass spectrometry
International Organization for Standardization (ISO)
- ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- ISO 16242:2011 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)
- ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
- ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
- ISO/PRF 5861:2024 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
British Standards Institution (BSI)
- BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
GSO
- BH GSO ISO 16243:2017 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- OS GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- BH GSO ISO 16242:2017 Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES)
- GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Association Francaise de Normalisation
- NF ISO 16243:2012 Chemical Analysis of Surfaces - X-ray Photoelectron Spectroscopy (XPS) Data Logging and Reporting
- NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
- NF ISO 16242:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie des électrons Auger (AES)
- NF X21-072*NF ISO 16242:2012 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES).
German Institute for Standardization
- DIN ISO 16242:2020-05 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES) (ISO 16242:2011); Text in English
- DIN ISO 16242:2020 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES) (ISO 16242:2011); Text in English
SCC
- 10/30199175 DC BS ISO 16243. Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- 10/30199172 DC BS ISO 16242. Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
- DIN ISO 16242 E:2019 Draft Document - Surface chemical analysis - Recording and reporting data in auger electron spectroscopy (AES) (ISO 16242:2011); Text in English
RU-GOST R
- GOST R ISO 16243-2016 State system for insuring the uniformity of measurements Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- GOST R ISO 16242-2016 State system for insuring the uniformity of measurements. Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
- GOST 25645.148-1989 Solar gamma-radiation. Energy spectrum
American Society for Testing and Materials (ASTM)
- ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
IPC - Association Connecting Electronics Industries
- IPC WP-008 CD-2005 Setting Up Ion Chromatography Capability
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC WP-008-2005 Setting Up Ion Chromatography Capability
Korean Agency for Technology and Standards (KATS)
- KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
