GB/T 33502-2017 in English

VALID

Surface chemical analysis―Recording and reporting data in X-ray photoelectron spectroscopy(XPS）

Issued on:2017-03-03
Implemented on:2018-01-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $210.00
$204.00

Standard No:	GB/T 33502-2017
Document status:	VALID
Title in English:	Surface chemical analysis―Recording and reporting data in X-ray photoelectron spectroscopy(XPS）
Title in Chinese:	表面化学分析 X射线光电子能谱（XPS）数据记录与报告的规范要求
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2017-03-03
Implemented on:	2018-01-01
ICS Classification:	71.040.40-Chemical analysis
Chinese Classification:	G04-Basic standards and general methods
Professional Classification:	GB-National Standard
Related Keywords:	x-ray photoelectron spectroscopy surface chemical analysis ― recording xps） scopethis standard photoelectron x-ray
Related Topics:	xps data xps and aes xps data xps spectrum xps report When xps data xps+ data What analysis is used for x-electron spectroscopy surface energy spectrum xps half peak requirement aes and xps energy spectrum xps energy spectrum xps and aes X-ray and ultraviolet photoelectron spectroscopy X-ray Photoelectron Spectroscopy and Ultraviolet Photoelectron Spectroscopy aes and xps xps requirements xps surface xps chemical analysis Spectral Data Analysis xps spectrum chemical analysis records cobalt xps data xps data everywhere Spectroscopy data xps aes surface xps data peak xps data peak X-ray Energy Spectroscopy Qualitative Analysis Basis x-ray and surface analysis Electron Spectroscopy and Energy Spectroscopy Analyze x with xps energy spectrum xps atom characteristic x-ray spectroscopy xps+data peak xps with Spectral data X-ray Spectroscopy Sample Preparation xps spectroscopy X-ray spectroscopy data xps+ surface aes and xps surface xps xps and x aes and xps Spectral data xps surface photoelectron spectroscopy xps xps+ atom xps+ spectrum XPS Optoelectronics xps energy spectrum and aes energy spectrum characteristic x-ray spectroscopy Analyzing Spectral Data Sample Preparation for X-ray Photoelectron Spectroscopy surface xps xps sample preparation requirements x-ray photoelectron spectroscopy and x-ray x How to analyze spectral data X-ray photoelectron spectroscopy and x-rays X-ray photoelectron spectroscopy sample preparation requirements Characteristic x-ray and energy spectrum analysis XPS sample preparation requirements xps surface atoms xps and x x-ray spectrometer Detection Analysis of X-ray Photoelectron Spectroscopy xps ray xps spectral peak xps vs high energy xps xps data report UV Photoelectron Spectroscopy and X-ray Photoelectron Spectroscopy The main basis for X-ray structure analysis X-ray Spectroscopy Phase Analysis xps photoelectron spectroscopy X-ray Photoelectron Spectroscopy Sample Preparation surface xps sample preparation xps spectrum xps and aes What can X-ray spectroscopy analyze? xps sample preparation requirements Sample Preparation Requirements for X-ray Photoelectron Spectroscopy xps spectrum item GBT33502 GB/T 33502-2017 xps data carbon calibration xps data carbon spectrum XPS surface sensitive xps analysis software Spectral sample surface requirements

《GB/T 33502-2017表面化学分析 X射线光电子能谱（XPS）数据记录与报告的规范要求》由TC38（全国微束分析标准化技术委员会）归口，TC38SC2（全国微束分析标准化技术委员会表面化学分析分会）执行，主管部门为国家标准化管理委员会。

Scope

This standard specifies the minimum requirements for the information that should be reported by the analyst after analyzing the sample using X-ray photoelectron spectroscopy (XPS). Includes original and analytically recorded information.

More samples: QC/T 942-2021 JJG 21-2008 DL/T 368-2010

Sample only — not a preview of GB/T 33502-2017

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