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Database: 365,228(8 Aug 2026)

xps chemical analysis

xps chemical analysis, Total:208 items.

The international standard classification for "xps chemical analysis" includes: Chemical analysis , Paper and board , Analytical chemistry , Analytical chemistry in general , Aluminium and aluminium alloys , Abrasives , Laboratory medicine , Other iron and steel products .

The Chinese standard classification for "xps chemical analysis" includes: Basic standards and general methods , Paper , Chemistry , Light metals and their alloys analysis method , Grinding material and apparatus , Medical laboratory equipment , Technical Management , Beneficiation reagent .


中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 34326-2017 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
  • GB/T 33502-2017 Surface chemical analysis―Recording and reporting data in X-ray photoelectron spectroscopy(XPS)

Taiwan Provincial Standard of the People's Republic of China

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

未注明发布机构

Group Standards of the People's Republic of China

Professional Standard - Light Industry

  • QB/T 1272-1991 Preparation of samples for chemical analysis of finished fur products and general rules for chemical analysis

Professional Standard - Machinery

Professional Standard - Medicine

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

Military Standard of the People's Republic of China-General Armament Department

Professional Standard - Building Materials

国务院稀土领导小组

Professional Standard - Electron

  • SJ/T 10087.5-1991 Methods of chemical analysis for glass raw materials for colour picture tubes - Methods for chemical analysis of litharge

Professional Standard - Ferrous Metallurgy

未注明发布机构

Association Francaise de Normalisation

  • NF ISO 16243:2012 Chemical Analysis of Surfaces - X-ray Photoelectron Spectroscopy (XPS) Data Logging and Reporting
  • NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
  • NF A06-511:1955 Chemical analysis of lead. Preparation of samples for chemical analysis.
  • NF X46-031:2008 Lead diagnosis - Chemical analysis of paints for the acid-soluble fraction of lead

GSO

  • BH GSO ISO 16243:2017 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • OS GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • OS GSO ISO/TS 13530:2013 Water quality -- Guidance on analytical quality control for chemical and physicochemical water analysis

International Organization for Standardization (ISO)

  • ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • ISO 16531:2020 Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
  • ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
  • ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
  • ISO/PRF 5861:2024 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
  • ISO/CD 24237:2023 Surface chemical analysis
  • ISO/DIS 20579-2:2024 Surface chemical analysis
  • ISO 18118:2022 Surface chemical analysis
  • ISO/CD 20289:2017 Surface chemical analysis
  • ISO/CD 20579-2:2023 Surface chemical analysis
  • ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
  • ISO/TS 13530:2009 Water quality - Guidance on analytical quality control for chemical and physicochemical water analysis
  • ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis

British Standards Institution (BSI)

  • BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • BS ISO 16531:2020 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
  • 19/30399949 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
  • 23/30442725 DC Draft BS ISO 5861. Surface chemical analysis. X-ray photoelectron spectroscopy. Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
  • BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
  • BS ISO 78-2:1999 Chemistry - Layout for standards - Methods of chemical analysis
  • BS EN 1744-1:2010 Tests for chemical properties of aggregates. Chemical analysis
  • BS EN 1744-1:2009+A1:2012 Tests for chemical properties of aggregates. Chemical analysis
  • BS EN 1744-1:2009 Tests for chemical properties of aggregates - Chemical analysis
  • BS EN 1744-1:1998 Tests for chemical properties of aggregates - Chemical analysis

SCC

  • 10/30199175 DC BS ISO 16243. Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • 12/30241146 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
  • AAMI TIR72:2017 Dialysis fluid chemical composition
  • NS-EN 1744-1:1998 Tests for chemical properties of aggregates — Part 1: Chemical analysis
  • NS-EN 1744-1:2009+A1:2012 Tests for chemical properties of aggregates — Part 1: Chemical analysis
  • UNE-EN 1744-1:2010 Tests for chemical properties of aggregates - Part 1: Chemical analysis

CU-NC

CZ-CSN

PL-PKN

RU-GOST R

  • GOST R ISO 16243-2016 State system for insuring the uniformity of measurements Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • GOST R 57516-2017 Beryllium. Methods of chemical analysis
  • GOST 1367.11-1983 Antimony. Chemical-spectral method of analysis

Japanese Industrial Standards Committee (JISC)

American Society for Testing and Materials (ASTM)

Korean Agency for Technology and Standards (KATS)

YU-JUS

NL-NEN

TH-TISI

KR-KS

Standard Association of Australia (SAA)

  • AS 2347:1998 Zinc and zinc alloys - Sampling for chemical and spectrochemical analysis

BR-ABNT

RO-ASRO

CL-INN

HU-MSZT

AENOR

AR-IRAM

GOST

SE-SIS

AT-ON

IN-BIS