surface xps
surface xps, Total:16 items.
The international standard classification for "surface xps" includes: Chemical analysis .
The Chinese standard classification for "surface xps" includes: Basic standards and general methods .
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33502-2017 Surface chemical analysis―Recording and reporting data in X-ray photoelectron spectroscopy(XPS）
- GB/T 34326-2017 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
GSO
- BH GSO ISO 16243:2017 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- OS GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Association Francaise de Normalisation
- NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
- NF ISO 16243:2012 Chemical Analysis of Surfaces - X-ray Photoelectron Spectroscopy (XPS) Data Logging and Reporting
International Organization for Standardization (ISO)
- ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
- ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
- ISO/PRF 5861:2024 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
British Standards Institution (BSI)
- BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- 23/30442725 DC Draft BS ISO 5861. Surface chemical analysis. X-ray photoelectron spectroscopy. Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
- 19/30364173 DC BS ISO 22581. Surface chemical analysis by XPS. Data management and treatment. Near real time information from the X-ray photoelectron spectroscopy survey scan. Rules for identification of, and correction for, the presence of surface contamination by c...
SCC
- 10/30199175 DC BS ISO 16243. Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
RU-GOST R
- GOST R ISO 16243-2016 State system for insuring the uniformity of measurements Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
å¦‚ä½•ç ¨XPSè°±å›¾ç¡ ®å®šå…ƒç´ çš„ä»·æ€,xps surface,xps aes surface,xps+ surface,surface xps,xps surface depth,xps+ surface depth,xps surface depth,xps surface depth,xps surface,xps surface but depth,surface xps,xps surface atoms,xps xps,xps + xps,surface xps sample preparation,xps shallow surface
