xps surface but depth
xps surface but depth, Total:44 items.
The international standard classification for "xps surface but depth" includes: Chemical analysis , Heat treatment and coating , Measuring instruments .
The Chinese standard classification for "xps surface but depth" includes: Basic standards and general methods , Heat treatment , Measuring tool and instrument .
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34326-2017 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 29557-2013 Surface chemical analysis—Depth Profiling—Measurment of sputtered depth
- GB/T 9451-1988 Determination of total or effective thickness of thin surface hardened layers of steel parts
- GB/T 9451-2005 Determination of total or effective thickness of thin surface hardened layers of steel parts
Professional Standard - Machinery
- JB/T 6081-2007 Depth dial indicator
- JB/T 6081-1992 Depth dial indicator
机械工业部
- JB 6081-1992 Depth dial indicator
International Organization for Standardization (ISO)
- ISO 16531:2020 Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- ISO/TR 15969:2001 Surface chemical analysis - Depth profiling - Measurement of sputtered depth
- ISO/TR 15969:2021 Surface chemical analysis — Depth profiling — Measurement of sputtered depth
- ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- ISO 4970:1979 Steel; Determination of total or effective thickness of thin surface-hardened layers
British Standards Institution (BSI)
- BS ISO 16531:2020 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- DD ISO/TR 15969:2001 Surface chemical analysis. Depth profiling. Measurement of sputtered depth
- BS DD ISO/TR 15969:2001 Surface chemical analysis - Depth profiling - Measurement of sputtered depth
- BS PD ISO/TR 15969:2021 Surface chemical analysis. Depth profiling. Measurement of sputtered depth
- 19/30399949 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- PD ISO/TR 15969:2021 Surface chemical analysis. Depth profiling. Measurement of sputtered depth
- BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- BS EN ISO 13473-1:2019 Characterization of pavement texture by use of surface profiles - Determination of mean profile depth
- BS EN 10328:2005 Iron and steel - Determination of the conventional depth and hardening after surface heating
Korean Agency for Technology and Standards (KATS)
- KS D ISO TR 15969-2011(2016) Surface chemical analysis－Depth profiling－Measurement of sputtered depth
- KS D ISO TR 15969-2011(2021) Surface chemical analysis－Depth profiling－Measurement of sputtered depth
- KS D ISO TR 15969:2011 Surface chemical analysis－Depth profiling－Measurement of sputtered depth
- KS D ISO TR 15969-2021 Surface chemical analysis－Depth profiling－Measurement of sputtered depth
SCC
- 12/30241146 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- AS 1982:1977 Methods for the measurement of case depth in steels
- UNE 7374:1976 DETERMINATION OF THE EFFECTIVE DEPTH OF HARDENING AFTER SURFACE HEATING
GSO
- OS GSO ISO/TR 15969:2013 Surface chemical analysis -- Depth profiling -- Measurement of sputtered depth
- BH GSO ISO/TR 15969:2016 Surface chemical analysis -- Depth profiling -- Measurement of sputtered depth
- GSO ISO/TR 15969:2013 Surface chemical analysis -- Depth profiling -- Measurement of sputtered depth
SE-SIS
- SIS 11 70 08-1975 Determination of case hardened depth in steel
- SIS SS 11 70 11-1979 Sintered steel — Determination of case hardened depth
- SIS 11 70 07-1975 Determination of hardened depth in steel after surface harden ing
(U.S.) Ford Automotive Standards
- FORD FLTM EU-BA 050-2-2000 DETERMINATION OF EFFECTIVE CASE DEPTH OF CASE HARDENED COMPONENTS
- FORD FLTM EU-BA 050-02-2000 DETERMINATION OF EFFECTIVE CASE DEPTH OF CASE HARDENED COMPONENTS
IN-BIS
- IS 6416-1971 How to measure the depth of steel surfaces
Society of Automotive Engineers (SAE)
- SAE J423-1998 Methods of Measuring Case Depth
RO-ASRO
- SR ISO 4970:1994 Steel. Determination of total or effective thickness of thin surfacehardened layers
- STAS 12160-1984 Casehardcning DETERMINATION OF DEPTH NITRIDING
CZ-CSN
- CSN 42 0448-1985 Steel. Determination of the effective depth of face hardened cases
HU-MSZT
- MNOSZ 11191-1956 Depth table micron
PL-PKN
- PN M05011-1971 Heat treatment of steel Determination of the surface hardened depth
RU-GOST R
- GOST 34272-2017 Glass packaging. Vacuum lug finishes. Types 63, 66, 70 - deep
