GB/T 29557-2013 in English

VALID

Surface chemical analysis—Depth Profiling—Measurment of sputtered depth

Issued on:2013-07-19
Implemented on:2014-03-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $210.00
$204.00

Standard No:	GB/T 29557-2013
Document status:	VALID
Title in English:	Surface chemical analysis—Depth Profiling—Measurment of sputtered depth
Title in Chinese:	表面化学分析深度剖析溅射深度测量
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2013-07-19
Implemented on:	2014-03-01
ICS Classification:	71.040.40-Chemical analysis
Chinese Classification:	G04-Basic standards and general methods
Professional Classification:	GB-National Standard
Related Keywords:	surface chemical analysis depth profiling measurment sputter depth profiling sputter depth sputtered depth scopethis international standard surface chemical analysis technique
Related Topics:	Senior Composition Analysis surface chemistry depth Senior domestic component analysis Degree detection analysis surface chemistry analyze sputtering How to analyze the specific surface test Steradian measurement Steradian measurement Chemical Analysis Metrology Surface Analysis System Liquid Surface Analysis Haze Analysis Degree capacity analysis vast depth oxygen depth deep laser depth spectrum Measuring depth of xps xps measure depth surface chemical composition Surface Analysis System Surface Chemical Analysis Surface Analysis of Liquids x-ray depth Measuring depth of xps Secondary Antibody Depth Flow meter analysis depth of discharge xps measure depth will be deeply involved xps measure depth depth xps single chain depth depth of xps depth film Binding analysis Depth is completely covered by xps surface depth xps+ surface depth depth surface Analysis Depth surface chemistry xps surface depth xps surface depth Chemical Composition Determination Surface parser Surface Analysis Surface Analysis System depth xps xps surface but depth Spectroscopy Depth Surface state analysis Specific surface test analysis Surface Chemical Analysis Surface state analysis depth measurement depth measuring instrument Measurement and Analysis xps general survey depth deep Depth measured by xps sims depth depth of field Steradian measurement optical depth depth power Auger's Splash Depth 1 Auger Sputter Depth Surface Inspection Analysis surface hardness depth deep laser element depth longitudinal depth "Anatomy" metal surface depth Soil sample depth depth of analysis surface and depth depth measurement Liquid Surface Analysis Resolution Quantitative analysis of the surface Surface chemical analysis AES GBT29557 GB/T 29557-2013 How to measure carbonation depth Analytical Chemistry Cover Article deep sequencing technology aws surface polishing depth notch depth test Temperature meter insertion depth Anterior chamber depth measurement method Surface analysis method study paper Carbonization depth detection Surface oxide depth Carbonization depth test of plastic parts

《GB/T 29557-2013表面化学分析深度剖析溅射深度测量》由TC38（全国微束分析标准化技术委员会）归口，TC38SC2（全国微束分析标准化技术委员会表面化学分析分会）执行，主管部门为国家标准化管理委员会。
本标准规定了溅射深度剖析中测量溅射深度的准则。
本标准适用于结合离子轰击剥离部分固体样品的表面化学分析技术,通常溅射深度可达几微米。

Scope

This International Standard specifies guidelines for measuring sputter depth in sputter depth profiling. This standard is applicable to the surface chemical analysis technique combined with ion bombardment to peel off some solid samples, usually the sputtering depth can reach several microns.

More samples: GB 18306-2015 DL/T 368-2010 QC/T 942-2021

Sample only — not a preview of GB/T 29557-2013

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