Surface state analysis

Surface state analysis, Total:172 items.

The international standard classification for "Surface state analysis" includes: Generalities. Terminology. Standardization. Documentation (Vocabularies) , Chemical analysis , Chemical technology (Vocabularies) , Surface active agents , IT applications in science , Tobacco, tobacco products and related equipment .

The Chinese standard classification for "Surface state analysis" includes: Physics and Mechanics , Basic standards and general methods , Basic standards and general methods for surface active agent , Computer application , Tobacco curing machinery .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 28894-2012 Surface chemical analysis - Handling of specimens prior to analysis
GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis
GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
GB/T 42415-2023 Surface active agents―Determination of static interfacial tension
GB/T 21007-2007 Surface chemical analysis—Information formats
GB/T 19499-2004 Surface chemical analysis - Data transfer forma
GB/T 29557-2013 Surface chemical analysis—Depth Profiling—Measurment of sputtered depth
GB/T 13592-1992 Terms relating to surface analysis
GB/T 30815-2014 Surface chemical analysis―Guidelines for preparation and mounting of specimens for analysis
GB/T 22461-2008 Surface chemical analysis - Vocabulary

Professional Standard - Chemical Industry

HG/T 6138-2023 Specific surface area and pore size analyzer

Group Standards of the People's Republic of China

T/ZSA 110-2022 Specific surface area and pore size analyzer

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33498-2017 Surface chemical analysis―Characterization of nanostructured materials

Professional Standard - Tobacco

YC/T 271.8-2008 Tobacco machinery - Modality design - Part 8: Surface protection and surface treatment

SCC

AWWA MTC69697 Morphological Analyses of Organic UF Membranes: Surface Morphology and Pore Size Distribution
BS ISO 18115:2001+A2:2007 Surface chemical analysis. Vocabulary
BS ISO 18115:2001 Surface chemical analysis. Vocabulary
07/30172470 DC BS ISO 18117. Surface chemical analysis. Handling of specimens prior to analysis
BS PD ISO/TR 14187:2011 Surface chemical analysis. Characterization of nanostructured materials
BS 6829-0:1989 Analysis of surface active agents (raw materials)-General introduction
BS 6829-0:1987 Analysis of surface active agents (raw materials)-General introduction
BS PD ISO/TR 14187:2020 Surface chemical analysis. Characterization of nanostructured materials
BS PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
AENOR UNE-EN 61725:1998 Analytical expression for daily solar profiles
AWWA WQTC58872 Particle Characterization Using Dynamic Digital Image Analysis

International Organization for Standardization (ISO)

ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry
ISO/DIS 20579-2:2024 Surface chemical analysis
ISO/CD 24237:2023 Surface chemical analysis
ISO/CD 20289:2017 Surface chemical analysis
ISO/CD 20579-2:2023 Surface chemical analysis
ISO 18118:2022 Surface chemical analysis
ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
ISO 18115:2001 Surface chemical analysis - Vocabulary
ISO/CD 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: Spectral analysis of surface profiles
ISO 14975:2000 Surface chemical analysis - Information formats
ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles
ISO/TR 15969:2021 Surface chemical analysis — Depth profiling — Measurement of sputtered depth
ISO/TR 14187:2020 Surface chemical analysis — Characterization of nanostructured materials
ISO 18115-3:2022 Surface chemical analysis — Vocabulary — Part 3: Terms used in optical interface analysis
ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
ISO/DIS 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: One third octave band spectral analysis of surface profiles
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 18115:2001/Amd 2:2007 Surface chemical analysis - Vocabulary; Amndment 2
ISO 18115:2001/Amd 1:2006 Surface chemical analysis - Vocabulary; Amendment 1
ISO 14976:1998 Surface chemical analysis - Data transfer format
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 18116:2005 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis

GSO

OS GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
BH GSO ISO 22048:2016 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
OS GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
BH GSO ISO 17974:2016 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
GSO ISO 14976:2013 Surface chemical analysis -- Data transfer format
GSO ISO 18117:2013 Surface chemical analysis -- Handling of specimens prior to analysis
BH GSO ISO 18117:2016 Surface chemical analysis -- Handling of specimens prior to analysis
OS GSO ISO/TS 13473-4:2014 Characterization of pavement texture by use of surface profiles -- Part 4: Spectral analysis of surface profiles
GSO ISO/TS 13473-4:2014 Characterization of pavement texture by use of surface profiles -- Part 4: Spectral analysis of surface profiles
GSO ISO 14975:2013 Surface chemical analysis -- Information formats
BH GSO ISO 14975:2016 Surface chemical analysis -- Information formats
GSO ISO/TR 14187:2013 Surface chemical analysis -- Characterization of nanostructured materials
GSO ISO/TR 15969:2013 Surface chemical analysis -- Depth profiling -- Measurement of sputtered depth
BH GSO ISO/TR 15969:2016 Surface chemical analysis -- Depth profiling -- Measurement of sputtered depth
OS GSO ISO/TR 14187:2013 Surface chemical analysis -- Characterization of nanostructured materials
OS GSO ISO/TR 15969:2013 Surface chemical analysis -- Depth profiling -- Measurement of sputtered depth
OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
GSO ISO 18116:2008 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
OS GSO ISO 18116:2008 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
OS GSO ISO 14976:2013 Surface chemical analysis -- Data transfer format
OS GSO IEC 61725:2014 Analytical expression for daily solar profiles
BH GSO IEC 61725:2016 Analytical expression for daily solar profiles

British Standards Institution (BSI)

BS ISO 22048:2004 Surface chemical analysis. Information format for static secondary-ion mass spectrometry
BS ISO 22048:2004(2005) Surface chemical analysis — Information format for static secondary - ion mass spectrometry
BS ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
BS ISO 18117:2009(2015) Surface chemical analysis — Handling of specimens prior to analysis
BS ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
BS ISO 18115-3:2022 Surface chemical analysis. Vocabulary - Terms used in optical interface analysis
BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
BS ISO 14975:2000 Surface chemical analysis - Information formats
BS ISO 14975:2000(2012) Surface chemical analysis — Information formats
BS ISO 14975:2001 Surface chemical analysis. Information formats
BS ISO 9276-6:2008 Representation of results of particle size analysis - Descriptive and quantitative representation of particle shape and morphology
BS ISO 13473-4:2024 Characterization of pavement texture by use of surface profiles - One third octave band spectral analysis of surface profiles
BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
PD ISO/TR 14187:2020 Surface chemical analysis. Characterization of nanostructured materials
BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
DD ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles. Spectral analysis of texture profiles
BS ISO 14976:1998 Surface chemical analysis - Data transfer format
BS EN 61725:1997 Analytical expression for daily solar profiles
PD ISO/TR 15969:2021 Surface chemical analysis. Depth profiling. Measurement of sputtered depth
BS ISO 18116:2005 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis

Korean Agency for Technology and Standards (KATS)

KS D ISO 22048-2020 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 22048-2005(2020) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 17974-2021 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 18115:2006 Surface chemical analysis－Vocabulary
KS D ISO 18115-2021 Surface chemical analysis－Vocabulary
KS D ISO 18115-2006(2021) Surface chemical analysis－Vocabulary
KS D ISO 18115-2006(2016) Surface chemical analysis－Vocabulary
KS D ISO 17974-2011(2016) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 17974-2011(2021) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 14975-2011(2016) Surface chemical analysis－Information formats
KS D ISO 17974:2011 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 14975-2021 Surface chemical analysis－Information formats
KS D ISO 14706-2003(2018) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
KS D ISO 14975:2011 Surface chemical analysis-Information formats
KS D ISO 14975-2011(2021) Surface chemical analysis－Information formats
KS D ISO TR 15969-2021 Surface chemical analysis－Depth profiling－Measurement of sputtered depth
KS C IEC 61725-2020 Analytical expression for daily solar profiles
KS D ISO 14976:2011 Surface chemical analysis－Data transfer format
KS D ISO 14976-2011(2016) Surface chemical analysis－Data transfer format
KS D ISO TR 15969-2011(2021) Surface chemical analysis－Depth profiling－Measurement of sputtered depth
KS C IEC 61725-2005(2020) Analytical expression for daily solar profiles
KS D ISO 14976-2011(2021) Surface chemical analysis－Data transfer format
KS D ISO TR 15969-2011(2016) Surface chemical analysis－Depth profiling－Measurement of sputtered depth
KS D ISO 14976-2021 Surface chemical analysis－Data transfer format

BE-NBN

NBN 88-02-1968 surface condition

Japanese Industrial Standards Committee (JISC)

JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
JIS K 0147:2004 Surface chemical analysis -- Vocabulary
JIS K 0142:2000 Surface chemical analysis -- Information formats
JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
JIS K 0154:2017 Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis
JIS K 0141:2000 Surface chemical analysis -- Data transfer format

RO-ASRO

STAS 11195-1987 SURFACE AGENTS Analysis method
SR 110-9-1995 Sugar. Methods of analysis. Determination of the apparent mass

AT-ON

ONORM M 1113-1982 Technical surfaces; methods of surjace analyzing Surjaces techniqu.es; methodes de essai des surfaces

Standard Association of Australia （SAA）

AS ISO 18115:2006 Surface chemical analysis - Vocabulary
AS ISO 14975:2006 Surface chemical analysis - Information formats
AS ISO 17974:2006(R2016) Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
AS ISO 17974:2006 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
AS ISO 14976:2006 Surface chemical analysis - Data transfer format
AS ISO 18116:2006 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
AS ISO 18116:2006(R2016) Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis

Defense Logistics Agency

DLA A-A-50767-1983 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 2-2001 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 3-2006 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 1-1995 ANALYZER, SURFACE FINISH

YU-JUS

JUS H.E0.005-1979 Surface active agents. Glossarj. List V. Analysis

American Society for Testing and Materials (ASTM)

ASTM E3149-18 Standard Guide for Facial Image Comparison Feature List for Morphological Analysis
ASTM E673-02a Standard Terminology Relating to Surface Analysis
ASTM E673-02b Standard Terminology Relating to Surface Analysis
ASTM E673-01 Standard Terminology Relating to Surface Analysis
ASTM E673-03 Standard Terminology Relating to Surface Analysis
ASTM E673-98E1 Standard Terminology Relating to Surface Analysis
ASTM E673-02 Standard Terminology Relating to Surface Analysis

Association Francaise de Normalisation

NF ISO 18117:2009 Analyse chimique des surfaces - Manipulation des échantillons avant analyse
NF EN 16637-2:2023 Construction products - Assessment of release of hazardous substances - Part 2: horizontal dynamic surface leaching test
NF X21-065*NF ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
NF ISO 17974:2009 Chemical Analysis of Surfaces - High Resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental and Chemical State Analysis
NF X21-067*NF ISO 17974:2009 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis.
NF ISO 18116:2006 Chemical analysis of surfaces - Guidelines for the preparation and assembly of samples for analysis
NF X21-052/A2:2008 Surface chemical analysis - Vocabulary - Amendment 2.
NF X21-052/A1:2008 Surface chemical analysis - Vocabulary - AMENDMENT 1.
NF E05-021:1997 GEOMETRICAL PRODUCT SPECIFICATIONS (GPS). SURFACE TEXTURE : PROFILE METHOD ; SURFACES HAVING STRATIFIED FUNCTIONAL PROPERTIES. PART 1 : FILTERING AND GENERAL MEASUREMENT CONDITIONS.
NF X21-056*NF ISO 18116:2006 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis

German Institute for Standardization

DIN ISO/TS 13473-4:2009-02 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
DIN ISO/TS 13473-4:2009 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)

U.S. Military Regulations and Norms

ARMY UFGS-06 61 16-2009 SOLID POLYMER (SOLID SURFACING) FABRICATIONS

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JEP179-2006 Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface- Mount Components
JEDEC JEP150-2005 Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface- Mount Components

KR-KS

KS D ISO 14706-2003(2023) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer

BSI

DANSK DS/ISO 13473-4:2024 Characterization of pavement texture by use of surface profiles – Part 4: One third octave band spectral analysis of surface profiles

ET-QSAE

ES 515-2000 Surfactants - Detergents - Qualitative Analysis

Spanish Association for Standardization (UNE)

UNE-EN 61725:1998 ANALYTICAL EXPRESSION FOR DAILY SOLAR PROFILES.