Surface Analysis Surface Analysis System

Surface Analysis Surface Analysis System, Total:311 items.

The international standard classification for "Surface Analysis Surface Analysis System" includes: Generalities. Terminology. Standardization. Documentation (Vocabularies) , Chemical technology (Vocabularies) , Chemical analysis , IT applications in science , Chemical laboratories. Laboratory equipment .

The Chinese standard classification for "Surface Analysis Surface Analysis System" includes: Physics and Mechanics , Basic standards and general methods , Computer application , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 28894-2012 Surface chemical analysis - Handling of specimens prior to analysis
GB/T 29557-2013 Surface chemical analysis—Depth Profiling—Measurment of sputtered depth
GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
GB/T 42360-2023 Surface chemical analysis―Total reflection X-ray fluorescence analysis of water
GB/T 19499-2004 Surface chemical analysis - Data transfer forma
GB/T 13592-1992 Terms relating to surface analysis
GB/Z 44564-2024 Safety instrumented systems—Process analysis technology systems
GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
GB/T 22461-2008 Surface chemical analysis - Vocabulary
GB/Z 32494-2016 Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information
GB/T 20175-2006 Surface chemical analysis-Sputter depth profiling-Optimization using layered systems as reference materials
GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon
GB/T 21007-2007 Surface chemical analysis—Information formats
GB/T 30815-2014 Surface chemical analysis―Guidelines for preparation and mounting of specimens for analysis

Professional Standard - Chemical Industry

HG/T 6138-2023 Specific surface area and pore size analyzer

Group Standards of the People's Republic of China

T/ZSA 110-2022 Specific surface area and pore size analyzer

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 32996-2016 Surface chemical analysis-Analysis of metal oxide films by glow-discharge optical emission spectrometry
GB/T 33498-2017 Surface chemical analysis―Characterization of nanostructured materials

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon

Professional Standard - Nuclear Industry

EJ/T 979-1995 Accumulation method for determination of surface radon exhalation rate

International Organization for Standardization (ISO)

ISO/DIS 20579-2:2024 Surface chemical analysis
ISO/CD 24237:2023 Surface chemical analysis
ISO/CD 20289:2017 Surface chemical analysis
ISO/CD 20579-2:2023 Surface chemical analysis
ISO 18118:2022 Surface chemical analysis
ISO 18115:2001 Surface chemical analysis - Vocabulary
ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
ISO/CD 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: Spectral analysis of surface profiles
ISO 14975:2000 Surface chemical analysis - Information formats
ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles
ISO/TR 15969:2021 Surface chemical analysis — Depth profiling — Measurement of sputtered depth
ISO/TR 14187:2020 Surface chemical analysis — Characterization of nanostructured materials
ISO 18115-3:2022 Surface chemical analysis — Vocabulary — Part 3: Terms used in optical interface analysis
ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
ISO/DIS 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: One third octave band spectral analysis of surface profiles
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 18115:2001/Amd 2:2007 Surface chemical analysis - Vocabulary; Amndment 2
ISO 18115:2001/Amd 1:2006 Surface chemical analysis - Vocabulary; Amendment 1
ISO 14976:1998 Surface chemical analysis - Data transfer format
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 18116:2005 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
ISO 18337:2015 Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope
ISO 14976:1998/Cor 1:1999 Surface Chemical Analysis Data Transfer Format Technical Corrigendum 1
ISO 24465:2023 Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device
ISO/TR 14187:2011 Surface chemical analysis - Characterization of nanostructured materials
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 893:1989 Surface active agents; technical alkane sulfonates; methods of analysis
ISO/TS 15338:2020 Surface chemical analysis — Glow discharge mass spectrometry — Operating procedures
ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
ISO 893:1978 Surface active agents — Technical sodium alkane sulphonates — Methods of analysis
ISO/TR 15969:2001 Surface chemical analysis - Depth profiling - Measurement of sputtered depth
ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
ISO 14606:2022 Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials
ISO 14606:2000 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
ISO 14606:2015 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
ISO/TS 25138:2019 Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry
ISO 895:1977 Surface active agents; Technical sodium secondary alkylsulphates; Methods of analysis
ISO 894:1977 Surface active agents; Technical sodium primary alkylsulphates; Methods of analysis
ISO 17331:2004/Amd 1:2010 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy; Amendment 1

RO-ASRO

STAS 11195-1987 SURFACE AGENTS Analysis method
SR 110-9-1995 Sugar. Methods of analysis. Determination of the apparent mass

AT-ON

ONORM M 1113-1982 Technical surfaces; methods of surjace analyzing Surjaces techniqu.es; methodes de essai des surfaces

British Standards Institution (BSI)

BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
BS ISO 18117:2009(2015) Surface chemical analysis — Handling of specimens prior to analysis
BS ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
BS ISO 18115-3:2022 Surface chemical analysis. Vocabulary - Terms used in optical interface analysis
BS ISO 14975:2000 Surface chemical analysis - Information formats
BS ISO 14975:2001 Surface chemical analysis. Information formats
BS ISO 14975:2000(2012) Surface chemical analysis — Information formats
BS ISO 13473-4:2024 Characterization of pavement texture by use of surface profiles - One third octave band spectral analysis of surface profiles
PD ISO/TR 14187:2020 Surface chemical analysis. Characterization of nanostructured materials
BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
DD ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles. Spectral analysis of texture profiles
BS ISO 14976:1998 Surface chemical analysis - Data transfer format
BS EN 61725:1997 Analytical expression for daily solar profiles
PD ISO/TR 15969:2021 Surface chemical analysis. Depth profiling. Measurement of sputtered depth
BS ISO 18116:2005 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 14606:2022 Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
DD ISO/TR 15969:2001 Surface chemical analysis. Depth profiling. Measurement of sputtered depth
BS DD ISO/TR 15969:2001 Surface chemical analysis - Depth profiling - Measurement of sputtered depth
BS PD ISO/TR 15969:2021 Surface chemical analysis. Depth profiling. Measurement of sputtered depth
BS DD ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles - Spectral analysis of texture profiles
BS ISO 18337:2015 Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
BS 6829-0:1991(2008) Analysis of surface active agents (raw materials) — Part 0 : General introduction
BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
21/30385921 DC BS ISO 18115-3. Surface chemical analysis. Vocabulary. Part 3. Terms used in optical interface analysis
23/30475865 DC BS ISO 13473-4. Characterization of pavement texture by use of surface profiles. Part 4. One third octave band spectral analysis of surface profiles
24/30482073 DC BS ISO 20289 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
BS ISO 24465:2023 Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
BS 6351-2:1983 Electric surface heating - Guide to the design of electric surface heating systems
21/30440164 DC BS ISO 14606. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
BS ISO 18115-1:2013 Surface chemical analysis. Vocabulary. General terms and terms used in spectroscopy
BS DD ISO/TS 25138:2011 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
BS ISO 18115-1:2010 Surface chemical analysis - Vocabulary - General terms and terms used in spectroscopy
BS ISO 11039:2012 Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
BS EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
BS ISO 14606:2000 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
PD ISO/TS 25138:2019 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
BS ISO 14606:2015 Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
BS ISO 14606:2001 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
21/30404376 DC BS ISO 24465. Surface chemical analysis. Determination of the minimum detectability of Surface Plasmon Resonance device
BS 6829-0:1991 Analysis of surface active agents (raw materials) - General introduction
BS 6351-2:1983(1999) Electric surface heating — Part 2 : Guide to the design of electric surface heating systems
BS EN IEC 61207-3:2019 Gas Analyzers. Expression of performance. Paramagnetic oxygen analysers
BS ISO 11505:2012 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon

Defense Logistics Agency

DLA A-A-50767-1983 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 2-2001 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 3-2006 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 1-1995 ANALYZER, SURFACE FINISH

Standard Association of Australia （SAA）

AS ISO 18115:2006 Surface chemical analysis - Vocabulary
AS ISO 14975:2006 Surface chemical analysis - Information formats
AS ISO 14976:2006 Surface chemical analysis - Data transfer format
AS ISO 18116:2006 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
AS ISO 18116:2006(R2016) Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
AS ISO 13473.2:2024 Characterization of pavement texture by use of surface profiles, Part 2: Terminology and basic requirements related to pavement texture profile analysis
AS ISO 14606:2006 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials

Korean Agency for Technology and Standards (KATS)

KS D ISO 18115:2006 Surface chemical analysis－Vocabulary
KS D ISO 18115-2021 Surface chemical analysis－Vocabulary
KS D ISO 18115-2006(2021) Surface chemical analysis－Vocabulary
KS D ISO 18115-2006(2016) Surface chemical analysis－Vocabulary
KS D ISO 14975-2011(2016) Surface chemical analysis－Information formats
KS D ISO 14975-2021 Surface chemical analysis－Information formats
KS D ISO 14706-2003(2018) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
KS D ISO 14975:2011 Surface chemical analysis-Information formats
KS D ISO 14975-2011(2021) Surface chemical analysis－Information formats
KS D ISO TR 15969-2021 Surface chemical analysis－Depth profiling－Measurement of sputtered depth
KS D ISO 14606-2023 Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials
KS C IEC 61725-2020 Analytical expression for daily solar profiles
KS D ISO 14976:2011 Surface chemical analysis－Data transfer format
KS D ISO 14976-2011(2016) Surface chemical analysis－Data transfer format
KS C IEC 61725-2005(2020) Analytical expression for daily solar profiles
KS D ISO 14976-2011(2021) Surface chemical analysis－Data transfer format
KS D ISO TR 15969-2011(2021) Surface chemical analysis－Depth profiling－Measurement of sputtered depth
KS D ISO TR 15969-2011(2016) Surface chemical analysis－Depth profiling－Measurement of sputtered depth
KS D ISO 14976-2021 Surface chemical analysis－Data transfer format
KS D ISO TR 15969:2011 Surface chemical analysis－Depth profiling－Measurement of sputtered depth
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 14606:2003 Surface chemical analysis－Sputter depth profiling－Optimization using layered systems as reference materials
KS D ISO 19319-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 17560-2003(2018) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
KS M ISO 893-2023 Surface active agents－Technical alkane sulfonates－Methods of analysis
KS M ISO 893-2007(2018) Surface active agents－Technical alkane sulfonates－Methods of analysis
KS M ISO 894-2007(2018) Surface active agents－Technical sodium primary alkylsulphates－Methods of analysis
KS D ISO 14606-2003(2018) Surface chemical analysis - Sputter length distribution - Optimization using hierarchical system as standard material
KS D ISO 17973-2021 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS M ISO 895-2007(2018) Surface active agents－Technical sodium secondary alkylsulphates－Methods of analysis
KS M ISO 456-2007(2022) Surface active agents－Analysis of soaps－Determination of free caustic alkali
KS M ISO 895-2023 Surface active agents－Technical sodium secondary alkylsulphates－Methods of analysis
KS M ISO 894-2023 Surface active agents－Technical sodium primary alkylsulphates－Methods of analysis
KS M ISO 456-2007(2017) Surface active agents－Analysis of soaps－Determination of free caustic alkali
KS M ISO 456:2007 Surface active agents－Analysis of soaps－Determination of free caustic alkali
KS M ISO 893:2007 Surface active agents－Technical alkane sulfonates－Methods of analysis
KS D ISO 17973-2011(2016) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 14706:2003 Surface chemical analysis－Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence(TXRF) spectroscopy

YU-JUS

JUS H.E0.005-1979 Surface active agents. Glossarj. List V. Analysis

SCC

BS ISO 18115:2001 Surface chemical analysis. Vocabulary
BS ISO 18115:2001+A2:2007 Surface chemical analysis. Vocabulary
07/30172470 DC BS ISO 18117. Surface chemical analysis. Handling of specimens prior to analysis
BS PD ISO/TR 14187:2011 Surface chemical analysis. Characterization of nanostructured materials
BS 6829-0:1987 Analysis of surface active agents (raw materials)-General introduction
BS 6829-0:1989 Analysis of surface active agents (raw materials)-General introduction
BS PD ISO/TR 14187:2020 Surface chemical analysis. Characterization of nanostructured materials
BS PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
AENOR UNE-EN 61725:1998 Analytical expression for daily solar profiles
09/30191895 DC BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
DANSK DS/EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
BS PD ISO/TS 25138:2019 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
NS-EN 14670:2005 Surface active agents — Sodium dodecyl sulfate — Analytical method
BS DD ISO/TS 25138:2010 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
BS 6829-1.5:1990 Analysis of surface active agents (raw materials). General methods-Methods for determination of water content
ASTM D452-91(2013)e1 Standard Test Method for Sieve Analysis of Surfacing for Asphalt Roofing Products
AWWA MTC69697 Morphological Analyses of Organic UF Membranes: Surface Morphology and Pore Size Distribution
BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis

GSO

GSO ISO 14976:2013 Surface chemical analysis -- Data transfer format
GSO ISO 18117:2013 Surface chemical analysis -- Handling of specimens prior to analysis
BH GSO ISO 18117:2016 Surface chemical analysis -- Handling of specimens prior to analysis
OS GSO ISO/TS 13473-4:2014 Characterization of pavement texture by use of surface profiles -- Part 4: Spectral analysis of surface profiles
GSO ISO/TS 13473-4:2014 Characterization of pavement texture by use of surface profiles -- Part 4: Spectral analysis of surface profiles
GSO ISO 14975:2013 Surface chemical analysis -- Information formats
BH GSO ISO 14975:2016 Surface chemical analysis -- Information formats
GSO ISO/TR 14187:2013 Surface chemical analysis -- Characterization of nanostructured materials
GSO ISO/TR 15969:2013 Surface chemical analysis -- Depth profiling -- Measurement of sputtered depth
BH GSO ISO/TR 15969:2016 Surface chemical analysis -- Depth profiling -- Measurement of sputtered depth
OS GSO ISO/TR 14187:2013 Surface chemical analysis -- Characterization of nanostructured materials
OS GSO ISO/TR 15969:2013 Surface chemical analysis -- Depth profiling -- Measurement of sputtered depth
OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
GSO ISO 18116:2008 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
OS GSO ISO 14606:2013 Surface chemical analysis -- Sputter depth profiling -- Optimization using layered systems as reference materials
OS GSO ISO 18116:2008 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
OS GSO ISO 14976:2013 Surface chemical analysis -- Data transfer format
OS GSO IEC 61725:2014 Analytical expression for daily solar profiles
BH GSO IEC 61725:2016 Analytical expression for daily solar profiles
BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
OS GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
BH GSO ISO 13424:2017 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
OS GSO ISO 893:2015 Surface active agents -- Technical alkane sulfonates -- Methods of analysis
OS GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
GSO ISO/TR 19693:2024 Surface chemical analysis — Characterization of functional glass substrates for biosensing applications
GSO ISO 15472:2013 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
OS GSO ISO 13473-2:2013 Characterization of pavement texture by use of surface profiles -- Part 2: Terminology and basic requirements related to pavement texture profile analysis
GSO ISO/TS 25138:2013 Surface chemical analysis -- Analysis of metal oxide films by glow-discharge optical-emission spectrometry
OS GSO ISO 895:2015 Surface active agents -- Technical sodium secondary alkylsulphates -- Methods of analysis
OS GSO ISO 894:2015 Surface active agents -- Technical sodium primary alkylsulphates -- Methods of analysis
OS GSO ISO 456:1994 Surface active agents: Analysis of soaps - Determination of free caustic alkali
GSO ISO 893:2015 Surface active agents -- Technical alkane sulfonates -- Methods of analysis
GSO ISO 14606:2013 Surface chemical analysis -- Sputter depth profiling -- Optimization using layered systems as reference materials
OS GSO ISO 11505:2015 Surface chemical analysis -- General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

Japanese Industrial Standards Committee (JISC)

JIS K 0147:2004 Surface chemical analysis -- Vocabulary
JIS K 0142:2000 Surface chemical analysis -- Information formats
JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
JIS K 0154:2017 Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis
JIS K 0141:2000 Surface chemical analysis -- Data transfer format
JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
JIS K 0146:2002 Surface chemical analysis -- Sputter depth profiling -- Optimization using layered systems as reference materials

Association Francaise de Normalisation

NF ISO 18117:2009 Analyse chimique des surfaces - Manipulation des échantillons avant analyse
NF X21-065*NF ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
NF ISO 18116:2006 Chemical analysis of surfaces - Guidelines for the preparation and assembly of samples for analysis
NF X21-052/A2:2008 Surface chemical analysis - Vocabulary - Amendment 2.
NF X21-052/A1:2008 Surface chemical analysis - Vocabulary - AMENDMENT 1.
NF X21-056*NF ISO 18116:2006 Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling
NF ISO 893:1990 Surfactants - Technical alkanesulfonates - Method of analysis
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF EN 14670:2005 Surfactants - Sodium dodecyl sulfate - Method of analysis
NF T73-292*NF EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analysis method.
NF EN 61725:1998 Expression analytique des profils solaires journaliers
NF X21-062*NF ISO 14606:2008 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials
NF ISO 14606:2008 Chemical analysis of surfaces - Thickness profiling by bombardment - Optimization using single- or multi-layer systems as reference materials
NF T73-275:1982 Surface active agents. Technical ethoxylated fatty amines. Methods of analysis.
NF T73-233*NF ISO 893:1990 Surface active agents. Technical alkane sulfonates. Methods of analysis.

German Institute for Standardization

DIN ISO/TS 13473-4:2009-02 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
DIN ISO/TS 13473-4:2009 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
DIN EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method; German version EN 14670:2005
DIN EN 61725:1998-03 Analytical expression for daily solar profiles (IEC 61725:1997); German version EN 61725:1997
DIN 28400-6:1980-10 Vacuum technology; terms and definitions, surface analysis techniques
DIN 28400-6:1980 Vacuum technology; terms and definitions, surface analysis techniques
DIN EN 14670:2005-09 Surface active agents - Sodium dodecyl sulfate - Analytical method; German version EN 14670:2005
DIN ISO 13473-2 E:1999-10 Characterization of pavement texture by use of surface profiles - Part 2: Terminology and basic requirements related to pavement texture profile analysis
DIN ISO 13473-2:2004 Characterization of pavement texture by use of surface profiles - Part 2: Terminology and basic requirements related to pavement texture profile analysis (ISO 13473-2:2002)
DIN ISO 13473-2:2004-07 Characterization of pavement texture by use of surface profiles - Part 2: Terminology and basic requirements related to pavement texture profile analysis (ISO 13473-2:2002)

KR-KS

KS D ISO 14706-2003(2023) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
KS D ISO 17560-2003(2023) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
KS M ISO 893-2007(2023) Surface active agents－Technical alkane sulfonates－Methods of analysis
KS M ISO 894-2007(2023) Surface active agents－Technical sodium primary alkylsulphates－Methods of analysis
KS M ISO 895-2007(2023) Surface active agents－Technical sodium secondary alkylsulphates－Methods of analysis

BSI

DANSK DS/ISO 13473-4:2024 Characterization of pavement texture by use of surface profiles – Part 4: One third octave band spectral analysis of surface profiles

American Society for Testing and Materials (ASTM)

ASTM E673-02a Standard Terminology Relating to Surface Analysis
ASTM E673-02b Standard Terminology Relating to Surface Analysis
ASTM E673-01 Standard Terminology Relating to Surface Analysis
ASTM E673-03 Standard Terminology Relating to Surface Analysis
ASTM E673-02 Standard Terminology Relating to Surface Analysis
ASTM E673-98E1 Standard Terminology Relating to Surface Analysis
ASTM D1001-51 Specification for Sieve Analysis of Granular Mineral Surfacing for Asphalt Roofing and Shingles
ASTM E1829-14(2020) Standard Guide for Handling Specimens Prior to Surface Analysis
ASTM E1829-09 Standard Guide for Handling Specimens Prior to Surface Analysis
ASTM E1829-97 Standard Guide for Handling Specimens Prior to Surface Analysis
ASTM E1078-14(2020) Standard Guide for Specimen Preparation and Mounting in Surface Analysis
ASTM E1829-02 Standard Guide for Handling Specimens Prior to Surface Analysis
ASTM E1829-14 Standard Guide for Handling Specimens Prior to Surface Analysis
ASTM E1078-14 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
ASTM D452-91(1997)e1 Standard Test Method for Sieve Analysis of Surfacing for Asphalt Roofing Products
ASTM D452/D452M-19 Standard Test Method for Sieve Analysis of Surfacing for Asphalt Roofing Products
ASTM D452-91(2008) Standard Test Method for Sieve Analysis of Surfacing for Asphalt Roofing Products

ET-QSAE

ES 515-2000 Surfactants - Detergents - Qualitative Analysis

Spanish Association for Standardization (UNE)

UNE-EN 61725:1998 ANALYTICAL EXPRESSION FOR DAILY SOLAR PROFILES.
UNE 55517:1984 SURFACE ACTIVE AGENTS. ANALYSIS OF TECHNICAL ALKYLBETAINES
UNE 55901:1986 ERRATUM SURFACE ACTIVE AGENTS. ANALYSIS OF SOAPS. DETERMINATION OF CAUSTIC FREE ALKALI
UNE 55510:1991 SURFACE ACTIVE AGENTS. TECHNICAL ALKANE SULFONATES. METHODS OF ANALYSIS.
UNE-EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method
UNE 55909:1985 SURFACE ACTIVE AGENTS. ANALYSIS OF SOAPS. DETERMINATION OF TOTAL FREE ALKALI

International Federation of Trucks and Engines

NAVISTAR CEMS DT-14-2009 Surface Waviness Definition via ALSA Analyzer
NAVISTAR CEMS DT-14-2016 VOID - Surface Waviness Definition via ALSA Analyzer

GB-REG

REG NASA-LLIS-0788--2000 Lessons Learned ?Surface Charging/Electrostatic Discharge Analysis

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc.

ASHRAE 3864-1995 Frequency Response Analysis of Ground-Coupled Building Envelope Surfaces

AGMA - American Gear Manufacturers Association

99FTM5-1999 Analysis of Micropitting on Prototype Surface Fatigue Test Gears

BE-NBN

NBN T 63-110-1980 Surface active agents - Technical sodium alkane sulphonates -Methods of analysis
NBN-ISO 893:1990 Surface active agents - Technical alkane sulfonates - Methods of analysis
NBN T 63-102-1980 Surface active agents - Analysis of soaps - Determination of free caustic alkali
NBN T 63-123-1980 Surface active agents - Analysis of soaps - Determination of low contents of free glycerol - Spectrophotometric method

Lithuanian Standards Office

LST EN 14670-2005 Surface active agents - Sodium dodecyl sulfate - Analytical method

IPC - Association Connecting Electronics Industries

IPC TM-650 2.3.39C-2004 Surface Organic Contaminant Identification Test (Infrared Analytical Method)
IPC TM-650 2.3.39B-1997 Surface Organic Contaminant Identification Test (Infrared Analytical Method)
IPC TM-650 2.3.39A-1988 Surface Organic Contaminant Identification Test (Infrared Analytical Method)

European Committee for Standardization (CEN)

EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method

Danish Standards Foundation

DS/EN 14670:2005 Surface active agents - Sodium dodecyl sulfate - Analytical method

US-FCR

FCR COE ER 1-1-11-1995 PROGRESS, SCHEDULES, AND NETWORK ANALYSIS SYSTEMS

American Gear Manufacturers Association

AGMA 99FTM5-1999 Analysis of Micropitting on Prototype Surface Fatigue Test Gears

GOST

GOST R ISO 6847-2023 Welding consumables. Deposition of a weld metal pad for chemical analysis

Society of Automotive Engineers (SAE)

SAE ARP4252-1989 Instrumental Methods of Determining Surface Cleanliness R(1995)