GB/T 33498-2017 in English
VALIDSurface chemical analysis―Characterization of nanostructured materials
- Issued on:2017-03-03
- Implemented on:2018-01-01
- File Format:PDF
- Delivery:Via email within 5 business days
$650.00
《GB/T 33498-2017表面化学分析 纳米结构材料表征》由TC38(全国微束分析标准化技术委员会)归口,TC38SC2(全国微束分析标准化技术委员会表面化学分析分会)执行,主管部门为国家标准化管理委员会。
Scope
This International Standard describes the kind of information that can be obtained on nanostructured materials using surface analysis techniques and gives some examples (see Clause 4). This standard addresses not only general problems or difficulties when characterizing nanostructured materials, but also specific approaches or difficulties when using specific methods (see Chapter 5). When the size of an object or material component approaches a few nanometers, the distinction between "bulk", "surface" and "particle" analysis becomes blurred. In addition to clarifying some general issues when characterizing nanostructured materials, this standard focuses on issues specifically related to the chemical analysis of the surface of nanostructured materials. This standard involves a variety of analysis and characterization methods, but its focus is still on methods within the professional scope of surface chemical analysis, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning probe microscopy. Certain types of measurements of nanoparticle surface properties, such as surface potential, are often performed in solution and are not covered by this standard. Despite their many similarities, nanoscale-thick films and uniform nanoparticle assemblies face different challenges in characterizing them. This standard exemplifies characterization methods applicable to both thin films and particles or nano-objects. Properties that can be determined include the presence of contamination, the thickness of the coating, and the surface chemistry before and after processing. In addition to identifying the types of information that can be obtained, this standard also outlines general and specific technical issues that must be considered before or during analysis, including information to be determined, stability and probe effects, environmental effects, sample handling issues and Interpretation of data. This International Standard presents information on nanomaterials that can be obtained using a specific set of surface analysis methods, but such information cannot by its nature be complete. However, this standard provides important approaches, ideas and issues, and provides many references to facilitate more in-depth analysis of these issues as required.

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