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Surface energy analysis

Surface energy analysis, Total:154 items.

The international standard classification for "Surface energy analysis" includes: Chemical analysis , Generalities. Terminology. Standardization. Documentation (Vocabularies) , Chemical technology (Vocabularies) , IT applications in science .

The Chinese standard classification for "Surface energy analysis" includes: Basic standards and general methods , Physics and Mechanics , Computer application .


国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
  • GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
  • GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy
  • GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
  • GB/Z 32494-2016 Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information
  • GB/T 28894-2012 Surface chemical analysis - Handling of specimens prior to analysis
  • GB/T 21007-2007 Surface chemical analysis—Information formats
  • GB/T 22461-2008 Surface chemical analysis - Vocabulary
  • GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
  • GB/T 13592-1992 Terms relating to surface analysis
  • GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
  • GB/T 25187-2010 Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
  • GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
  • GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
  • GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis
  • GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
  • GB/T 33498-2017 Surface chemical analysis―Characterization of nanostructured materials

Professional Standard - Chemical Industry

Group Standards of the People's Republic of China

Korean Agency for Technology and Standards (KATS)

  • KS C IEC 61725-2005(2020) Analytical expression for daily solar profiles
  • KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 17973-2021 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D ISO 17973-2011(2016) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D ISO 19319-2020 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 18115:2006 Surface chemical analysis-Vocabulary
  • KS D ISO 18115-2021 Surface chemical analysis-Vocabulary
  • KS D ISO 18115-2006(2021) Surface chemical analysis-Vocabulary
  • KS D ISO 18115-2006(2016) Surface chemical analysis-Vocabulary
  • KS D ISO 17974-2021 Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
  • KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 15471-2020 Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 17973-2011(2021) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D ISO 17974-2011(2016) Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
  • KS D ISO 14975-2011(2016) Surface chemical analysis-Information formats
  • KS D ISO 14975-2021 Surface chemical analysis-Information formats
  • KS D ISO 15472-2003(2018) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
  • KS D ISO 14706-2003(2018) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
  • KS D ISO 14975:2011 Surface chemical analysis-Information formats
  • KS D ISO 14975-2011(2021) Surface chemical analysis-Information formats
  • KS D ISO TR 15969-2021 Surface chemical analysis-Depth profiling-Measurement of sputtered depth
  • KS D ISO 17973:2011 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
  • KS D ISO 15471-2005(2020) Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters

GSO

  • OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
  • GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
  • BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
  • BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
  • GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
  • OS GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
  • GSO ISO 15472:2013 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
  • BH GSO ISO 13424:2017 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
  • GSO ISO/TR 19693:2024 Surface chemical analysis — Characterization of functional glass substrates for biosensing applications
  • GSO ISO 14976:2013 Surface chemical analysis -- Data transfer format
  • OS GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
  • GSO ISO 15471:2013 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
  • BH GSO ISO 17974:2016 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
  • GSO ISO 18117:2013 Surface chemical analysis -- Handling of specimens prior to analysis
  • BH GSO ISO 18117:2016 Surface chemical analysis -- Handling of specimens prior to analysis
  • OS GSO ISO/TS 13473-4:2014 Characterization of pavement texture by use of surface profiles -- Part 4: Spectral analysis of surface profiles
  • GSO ISO/TS 13473-4:2014 Characterization of pavement texture by use of surface profiles -- Part 4: Spectral analysis of surface profiles
  • BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
  • GSO ISO/TR 18394:2021 Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information
  • GSO ISO 14975:2013 Surface chemical analysis -- Information formats
  • BH GSO ISO 14975:2016 Surface chemical analysis -- Information formats
  • GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis

British Standards Institution (BSI)

  • BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS ISO 24465:2023 Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
  • BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
  • BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
  • BS ISO 18117:2009(2015) Surface chemical analysis — Handling of specimens prior to analysis
  • BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
  • BS ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
  • 21/30404376 DC BS ISO 24465. Surface chemical analysis. Determination of the minimum detectability of Surface Plasmon Resonance device
  • 23/30469291 DC BS ISO 17973. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
  • PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
  • BS ISO 18115-3:2022 Surface chemical analysis. Vocabulary - Terms used in optical interface analysis
  • BS ISO 14975:2000 Surface chemical analysis - Information formats
  • BS ISO 15471:2016 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
  • PD ISO/TR 19693:2018 Surface chemical analysis. Characterization of functional glass substrates for biosensing applications
  • BS ISO 14975:2000(2012) Surface chemical analysis — Information formats
  • BS ISO 14975:2001 Surface chemical analysis. Information formats
  • BS ISO 13473-4:2024 Characterization of pavement texture by use of surface profiles - One third octave band spectral analysis of surface profiles
  • BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis

International Organization for Standardization (ISO)

  • ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
  • ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
  • ISO/DIS 20579-2:2024 Surface chemical analysis
  • ISO/CD 24237:2023 Surface chemical analysis
  • ISO/CD 20289:2017 Surface chemical analysis
  • ISO/CD 20579-2:2023 Surface chemical analysis
  • ISO 18118:2022 Surface chemical analysis
  • ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
  • ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
  • ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
  • ISO 18115:2001 Surface chemical analysis - Vocabulary
  • ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
  • ISO/CD 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: Spectral analysis of surface profiles
  • ISO/TR 18394:2016 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
  • ISO 14975:2000 Surface chemical analysis - Information formats
  • ISO/TR 19693:2018 Surface chemical analysis - Characterization of functional glass substrates for biosensing applications
  • ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles
  • ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • ISO/TR 15969:2021 Surface chemical analysis — Depth profiling — Measurement of sputtered depth

Association Francaise de Normalisation

  • NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
  • NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
  • NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
  • NF ISO 18117:2009 Analyse chimique des surfaces - Manipulation des échantillons avant analyse
  • NF ISO 24236:2006 Chemical analysis of surfaces - Auger electron spectroscopy - Repeatability and constancy of the energy scale
  • NF X21-065*NF ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
  • NF ISO 16242:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie des électrons Auger (AES)
  • NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.

SCC

  • BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
  • 09/30191895 DC BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
  • BS ISO 18115:2001 Surface chemical analysis. Vocabulary
  • BS ISO 18115:2001+A2:2007 Surface chemical analysis. Vocabulary
  • BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
  • BS PD ISO/TR 18394:2006 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
  • BS PD ISO/TR 19693:2018 Surface chemical analysis. Characterization of functional glass substrates for biosensing applications
  • BS ISO 15471:2004 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
  • ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
  • 07/30172470 DC BS ISO 18117. Surface chemical analysis. Handling of specimens prior to analysis

RO-ASRO

AT-ON

  • ONORM M 1113-1982 Technical surfaces; methods of surjace analyzing Surjaces techniqu.es; methodes de essai des surfaces

German Institute for Standardization

  • DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • DIN ISO/TS 13473-4:2009-02 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
  • DIN ISO/TS 13473-4:2009 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
  • DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English

Defense Logistics Agency

Standard Association of Australia (SAA)

  • AS ISO 18115:2006 Surface chemical analysis - Vocabulary
  • ISO 17973:2024 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
  • AS ISO 14975:2006 Surface chemical analysis - Information formats

YU-JUS

BSI

  • BS ISO 17973:2024 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis

Japanese Industrial Standards Committee (JISC)

  • JIS K 0147:2004 Surface chemical analysis -- Vocabulary
  • JIS K 0142:2000 Surface chemical analysis -- Information formats
  • JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
  • JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
  • JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis

KR-KS

  • KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
  • KS D ISO 14706-2003(2023) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer