Surface energy analysis
Surface energy analysis, Total:154 items.
The international standard classification for "Surface energy analysis" includes: Chemical analysis , Generalities. Terminology. Standardization. Documentation (Vocabularies) , Chemical technology (Vocabularies) , IT applications in science .
The Chinese standard classification for "Surface energy analysis" includes: Basic standards and general methods , Physics and Mechanics , Computer application .
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
- GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
- GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy
- GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
- GB/Z 32494-2016 Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information
- GB/T 28894-2012 Surface chemical analysis - Handling of specimens prior to analysis
- GB/T 21007-2007 Surface chemical analysis—Information formats
- GB/T 22461-2008 Surface chemical analysis - Vocabulary
- GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
- GB/T 13592-1992 Terms relating to surface analysis
- GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
- GB/T 25187-2010 Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
- GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
- GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
- GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis
- GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
- GB/T 33498-2017 Surface chemical analysis―Characterization of nanostructured materials
Professional Standard - Chemical Industry
- HG/T 6138-2023 Specific surface area and pore size analyzer
Group Standards of the People's Republic of China
- T/ZSA 110-2022 Specific surface area and pore size analyzer
Korean Agency for Technology and Standards (KATS)
- KS C IEC 61725-2005(2020) Analytical expression for daily solar profiles
- KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS D ISO 17973-2021 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D ISO 17973-2011(2016) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D ISO 19319-2020 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS D ISO 18115:2006 Surface chemical analysis-Vocabulary
- KS D ISO 18115-2021 Surface chemical analysis-Vocabulary
- KS D ISO 18115-2006(2021) Surface chemical analysis-Vocabulary
- KS D ISO 18115-2006(2016) Surface chemical analysis-Vocabulary
- KS D ISO 17974-2021 Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
- KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS D ISO 15471-2020 Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
- KS D ISO 17973-2011(2021) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D ISO 17974-2011(2016) Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
- KS D ISO 14975-2011(2016) Surface chemical analysis-Information formats
- KS D ISO 14975-2021 Surface chemical analysis-Information formats
- KS D ISO 15472-2003(2018) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
- KS D ISO 14706-2003(2018) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
- KS D ISO 14975:2011 Surface chemical analysis-Information formats
- KS D ISO 14975-2011(2021) Surface chemical analysis-Information formats
- KS D ISO TR 15969-2021 Surface chemical analysis-Depth profiling-Measurement of sputtered depth
- KS D ISO 17973:2011 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D ISO 15471-2005(2020) Surface chemical analysis-Auger electron spectroscopy-Description of selected instrumental performance parameters
- KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
GSO
- OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
- GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
- BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
- BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
- OS GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
- GSO ISO 15472:2013 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- BH GSO ISO 13424:2017 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
- GSO ISO/TR 19693:2024 Surface chemical analysis — Characterization of functional glass substrates for biosensing applications
- GSO ISO 14976:2013 Surface chemical analysis -- Data transfer format
- OS GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
- GSO ISO 15471:2013 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
- BH GSO ISO 17974:2016 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
- GSO ISO 18117:2013 Surface chemical analysis -- Handling of specimens prior to analysis
- BH GSO ISO 18117:2016 Surface chemical analysis -- Handling of specimens prior to analysis
- OS GSO ISO/TS 13473-4:2014 Characterization of pavement texture by use of surface profiles -- Part 4: Spectral analysis of surface profiles
- GSO ISO/TS 13473-4:2014 Characterization of pavement texture by use of surface profiles -- Part 4: Spectral analysis of surface profiles
- BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- GSO ISO/TR 18394:2021 Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information
- GSO ISO 14975:2013 Surface chemical analysis -- Information formats
- BH GSO ISO 14975:2016 Surface chemical analysis -- Information formats
- GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
British Standards Institution (BSI)
- BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 24465:2023 Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
- BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
- BS ISO 18117:2009(2015) Surface chemical analysis — Handling of specimens prior to analysis
- BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
- BS ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
- 21/30404376 DC BS ISO 24465. Surface chemical analysis. Determination of the minimum detectability of Surface Plasmon Resonance device
- 23/30469291 DC BS ISO 17973. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
- BS ISO 18115-3:2022 Surface chemical analysis. Vocabulary - Terms used in optical interface analysis
- BS ISO 14975:2000 Surface chemical analysis - Information formats
- BS ISO 15471:2016 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
- PD ISO/TR 19693:2018 Surface chemical analysis. Characterization of functional glass substrates for biosensing applications
- BS ISO 14975:2000(2012) Surface chemical analysis — Information formats
- BS ISO 14975:2001 Surface chemical analysis. Information formats
- BS ISO 13473-4:2024 Characterization of pavement texture by use of surface profiles - One third octave band spectral analysis of surface profiles
- BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
International Organization for Standardization (ISO)
- ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
- ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
- ISO/DIS 20579-2:2024 Surface chemical analysis
- ISO/CD 24237:2023 Surface chemical analysis
- ISO/CD 20289:2017 Surface chemical analysis
- ISO/CD 20579-2:2023 Surface chemical analysis
- ISO 18118:2022 Surface chemical analysis
- ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
- ISO 18115:2001 Surface chemical analysis - Vocabulary
- ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
- ISO/CD 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: Spectral analysis of surface profiles
- ISO/TR 18394:2016 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
- ISO 14975:2000 Surface chemical analysis - Information formats
- ISO/TR 19693:2018 Surface chemical analysis - Characterization of functional glass substrates for biosensing applications
- ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles
- ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- ISO/TR 15969:2021 Surface chemical analysis — Depth profiling — Measurement of sputtered depth
Association Francaise de Normalisation
- NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
- NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
- NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
- NF ISO 18117:2009 Analyse chimique des surfaces - Manipulation des échantillons avant analyse
- NF ISO 24236:2006 Chemical analysis of surfaces - Auger electron spectroscopy - Repeatability and constancy of the energy scale
- NF X21-065*NF ISO 18117:2009 Surface chemical analysis - Handling of specimens prior to analysis
- NF ISO 16242:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie des électrons Auger (AES)
- NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
SCC
- BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
- 09/30191895 DC BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- BS ISO 18115:2001 Surface chemical analysis. Vocabulary
- BS ISO 18115:2001+A2:2007 Surface chemical analysis. Vocabulary
- BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
- BS PD ISO/TR 18394:2006 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
- BS PD ISO/TR 19693:2018 Surface chemical analysis. Characterization of functional glass substrates for biosensing applications
- BS ISO 15471:2004 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
- ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
- 07/30172470 DC BS ISO 18117. Surface chemical analysis. Handling of specimens prior to analysis
RO-ASRO
- STAS 11195-1987 SURFACE AGENTS Analysis method
- SR 110-9-1995 Sugar. Methods of analysis. Determination of the apparent mass
AT-ON
- ONORM M 1113-1982 Technical surfaces; methods of surjace analyzing Surjaces techniqu.es; methodes de essai des surfaces
German Institute for Standardization
- DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- DIN ISO/TS 13473-4:2009-02 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
- DIN ISO/TS 13473-4:2009 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
- DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
Defense Logistics Agency
- DLA A-A-50767-1983 ANALYZER, SURFACE FINISH
- DLA A-A-50767 VALID NOTICE 2-2001 ANALYZER, SURFACE FINISH
- DLA A-A-50767 VALID NOTICE 3-2006 ANALYZER, SURFACE FINISH
- DLA A-A-50767 VALID NOTICE 1-1995 ANALYZER, SURFACE FINISH
Standard Association of Australia (SAA)
- AS ISO 18115:2006 Surface chemical analysis - Vocabulary
- ISO 17973:2024 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- AS ISO 14975:2006 Surface chemical analysis - Information formats
YU-JUS
- JUS H.E0.005-1979 Surface active agents. Glossarj. List V. Analysis
BSI
- BS ISO 17973:2024 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
Japanese Industrial Standards Committee (JISC)
- JIS K 0147:2004 Surface chemical analysis -- Vocabulary
- JIS K 0142:2000 Surface chemical analysis -- Information formats
- JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
- JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
KR-KS
- KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
- KS D ISO 14706-2003(2023) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
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