depth xps
depth xps, Total:4 items.
The international standard classification for "depth xps" includes: Chemical analysis .
The Chinese standard classification for "depth xps" includes: Basic standards and general methods .
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34326-2017 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 29557-2013 Surface chemical analysis—Depth Profiling—Measurment of sputtered depth
SCC
- 12/30241146 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
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