xps depth analysis
xps depth analysis, Total:2 items.
The international standard classification for "xps depth analysis" includes: Chemical analysis .
The Chinese standard classification for "xps depth analysis" includes: Basic standards and general methods .
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34326-2017 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
SCC
- 12/30241146 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
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