Electron Spectroscopy Depth Analysis
Electron Spectroscopy Depth Analysis, Total:6 items.
The international standard classification for "Electron Spectroscopy Depth Analysis" includes: Chemical analysis .
The Chinese standard classification for "Electron Spectroscopy Depth Analysis" includes: Basic standards and general methods .
Professional Standard - Electron
- SJ/T 10457-1993 Standard guide for depth profiling in auger electron spectroscopy
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
International Organization for Standardization (ISO)
- ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
British Standards Institution (BSI)
- BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
Deep Auger Electron Spectroscopy,Depth of Auger Electron Spectroscopy,Auger Electron Spectroscopy Depth Analysis,Electron Spectroscopy Depth Analysis Method,Depth Analysis Method in Electron Spectroscopy,Electron Spectroscopy Depth Analysis,Depth of Auger Electron Spectroscopy
