xps analysis
xps analysis, Total:4 items.
The international standard classification for "xps analysis" includes: Chemical analysis .
The Chinese standard classification for "xps analysis" includes: Basic standards and general methods .
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34326-2017 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
SCC
- 12/30241146 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
International Organization for Standardization (ISO)
- ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
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