analyze
analyze, Total:7 items.
The international standard classification for "analyze" includes: Chemical analysis .
The Chinese standard classification for "analyze" includes: Basic standards and general methods , Electron optics and other physical optics instrument .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 20175-2006 Surface chemical analysis-Sputter depth profiling-Optimization using layered systems as reference materials
- GB/T 29557-2013 Surface chemical analysis—Depth Profiling—Measurment of sputtered depth
Professional Standard - Electron
- SJ/T 10457-1993 Standard guide for depth profiling in auger electron spectroscopy
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
- GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
SCC
- NS 193:1945 Tool profiles for plowed and double plowed tables (TG and DTG profiles)
- AWWA JAW6135 Journal AWWA — The Anatomy of an Ozone Plant
Secondary ion mass spectrometry depth profiling,Depth profiling method for surface chemical analysis of arsenic in silicon by secondary ion mass spectrometry,analyze,Deep Profiling Secondary Ion Mass Spectrometry,Auger Electron Spectroscopy Depth Analysis,Anatomy of a cupping instrument,Secondary Ion Depth Profiling,xps aes depth analysis,xps depth analysis,xps depth analysis,Electron Spectroscopy Depth Analysis Method,Depth Analysis Method in Electron Spectroscopy,Electron Spectroscopy Depth Analysis,parser,xps analysis,"Anatomy",Composition Analysis
