Spectral Surface Analysis

Spectral Surface Analysis, Total:202 items.

The international standard classification for "Spectral Surface Analysis" includes: Chemical analysis , Physicochemical methods of analysis .

The Chinese standard classification for "Spectral Surface Analysis" includes: Basic standards and general methods .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
GB/Z 32490-2016 Surface chemical analysis--X-ray photoelectron spectroscopy--Procedures for determining backgrounds
GB/T 19502-2023 Surface chemical analysis—General rules for glow discharge optical emission spectrometry (GD-OES)
GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
GB/T 19502-2004 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OSE) - Introlduction to use
GB/T 29559-2013 Surface chemical analysis—Analysis of zinc and/or aluminium based metallic coatings by glow discharge optical emission spectrometry
GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
GB/T 42360-2023 Surface chemical analysis―Total reflection X-ray fluorescence analysis of water
GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 32997-2016 Surface chemical analysis―General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
GB/T 32996-2016 Surface chemical analysis-Analysis of metal oxide films by glow-discharge optical emission spectrometry

未注明发布机构

DIN ISO 14707 E:2022-08 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
DIN ISO 16962 E:2018-06 Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
AS ISO 24237:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
DIN ISO 14707 E:2017-09 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
DIN ISO 11505 E:2017-09 Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

Taiwan Provincial Standard of the People's Republic of China

CNS 14341-1999 Optical spectrum analyzer

British Standards Institution (BSI)

BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
BS DD ISO/TS 25138:2011 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
DD ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles. Spectral analysis of texture profiles
BS ISO 14707:2000 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
BS ISO 14707:2015 Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
PD ISO/TS 25138:2019 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
BS ISO 13473-4:2024 Characterization of pavement texture by use of surface profiles - One third octave band spectral analysis of surface profiles
BS ISO 18115-1:2013 Surface chemical analysis. Vocabulary. General terms and terms used in spectroscopy
BS ISO 18115-1:2010 Surface chemical analysis - Vocabulary - General terms and terms used in spectroscopy
BS DD ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles - Spectral analysis of texture profiles
BS ISO 16962:2017 Surface chemical analysis. Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
BS ISO 11505:2012 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
BS ISO 14707:2021 Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
BS DD ISO/TS 15338:2009 Surface chemical analysis - Glow discharge Mass spectrometry (GD-MS) - Introduction to use
PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
BS PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
23/30475865 DC BS ISO 13473-4. Characterization of pavement texture by use of surface profiles. Part 4. One third octave band spectral analysis of surface profiles
BS PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
BS ISO 24417:2022 Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
BS ISO 14706:2014 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
BS ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
BS ISO 14706:2001 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 14701:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 18115-1:2023 Surface chemical analysis. Vocabulary. General terms and terms used in spectroscopy
BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
21/30405786 DC BS ISO 24417. Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
BS ISO 18115-3:2022 Surface chemical analysis. Vocabulary - Terms used in optical interface analysis
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS PD ISO/TR 23173:2021 Surface chemical analysis. Electron spectroscopies. Measurement of the thickness and composition of nanoparticle coatings

GSO

GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
GSO ISO/TS 13473-4:2014 Characterization of pavement texture by use of surface profiles -- Part 4: Spectral analysis of surface profiles
OS GSO ISO/TS 13473-4:2014 Characterization of pavement texture by use of surface profiles -- Part 4: Spectral analysis of surface profiles
GSO ISO 15472:2013 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
GSO ISO/TS 25138:2013 Surface chemical analysis -- Analysis of metal oxide films by glow-discharge optical-emission spectrometry
GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
OS GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
BH GSO ISO 13424:2017 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
BH GSO ISO 14707:2016 Surface chemical analysis -- Glow discharge optical emission spectrometry (GD-OES) -- Introduction to use
OS GSO ISO/TS 15338:2013 Surface chemical analysis -- Glow discharge mass spectrometry (GD-MS) -- Introduction to use
GSO ISO/TS 15338:2013 Surface chemical analysis -- Glow discharge mass spectrometry (GD-MS) -- Introduction to use
OS GSO ISO 14707:2013 Surface chemical analysis -- Glow discharge optical emission spectrometry (GD-OES) -- Introduction to use
BH GSO ISO 11505:2017 Surface chemical analysis -- General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
BH GSO ISO/TS 15338:2016 Surface chemical analysis -- Glow discharge mass spectrometry (GD-MS) -- Introduction to use
GSO ISO 14707:2013 Surface chemical analysis -- Glow discharge optical emission spectrometry (GD-OES) -- Introduction to use
OS GSO ISO 11505:2015 Surface chemical analysis -- General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
GSO ISO 11505:2015 Surface chemical analysis -- General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
BH GSO ISO 16962:2016 Surface chemical analysis -- Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
GSO ISO 16962:2013 Surface chemical analysis -- Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
GSO ISO 14701:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness
GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
GSO ISO/TR 18392:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for determining backgrounds
BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 24236:2013 Surface chemical analysis -- Auger electron spectroscopy -- Repeatability and constancy of intensity scale
GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BH GSO ISO 16243:2017 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

SCC

BS PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
BS PD ISO/TS 25138:2019 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
09/30191895 DC BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS DD ISO/TS 25138:2010 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry
BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
BS ISO 16962:2005 Surface chemical analysis. Analysis of zinc- and/or aluminium-basedmetal lic coatings by glow-discharge optical-emission spectrometry
12/30255191 DC BS ISO 11505. Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
05/30124119 DC ISO 15338. Surface chemical analysis. Glow discharge mass spectrometry (GD-MS). Introduction to use
BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
DIN ISO 14707 E:2017 Draft Document - Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use (ISO 14707:2015); Text in German and English
DIN ISO 16962 E:2018 Draft Document - Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry (ISO 16962:2017); Text in German and English
ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
10/30212265 DC BS ISO 14701. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS EN 61290-1-1:1998 Optical spectrum analyzer

German Institute for Standardization

DIN ISO/TS 13473-4:2009-02 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
DIN ISO/TS 13473-4:2009 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles (ISO/TS 13473-4:2008)
DIN ISO 11505:2018-02 Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry (ISO 11505:2012)
DIN ISO 16962:2018 Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry (ISO 16962:2017)
DIN ISO 14707:2023-05 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use (ISO 14707:2021)
DIN ISO 14707:2023 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use (ISO 14707:2021)
DIN ISO 14707:2018 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use (ISO 14707:2015)
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 11505:2018 Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry (ISO 11505:2012)
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English

International Organization for Standardization (ISO)

ISO/CD 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: Spectral analysis of surface profiles
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO/TS 13473-4:2008 Characterization of pavement texture by use of surface profiles - Part 4: Spectral analysis of surface profiles
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO/TS 15338:2020 Surface chemical analysis — Glow discharge mass spectrometry — Operating procedures
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO/TS 25138:2019 Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry
ISO/DIS 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: One third octave band spectral analysis of surface profiles
ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
ISO 16962:2017 Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
ISO/TS 25138:2010 Surface chemical analysis - Analysis of metal oxide films by glow-discharge optical-emission spectrometry
ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
ISO 16962:2005 Surface chemical analysis - Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
ISO 14707:2000 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
ISO 14707:2021 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
ISO 24417:2022 Surface chemical analysis — Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
ISO 14707:2015 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
ISO/TS 18507:2015 Surface chemical analysis - Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
ISO/TR 18394:2006 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
ISO 11505:2012 Surface chemical analysis - General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
ISO 18115-1:2010 Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy
ISO 18115-1:2013 Surface chemical analysis .Vocabulary.Part 1: General terms and terms used in spectroscopy
ISO/TS 15338:2009 Surface chemical analysis - Glow discharge mass spectrometry (GD-MS) - Introduction to use
ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
ISO 17331:2004/Amd 1:2010 Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy; Amendment 1
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO/TR 23173:2021 Surface chemical analysis - Electron spectroscopies - Measurement of the thickness and composition of nanoparticle coatings
ISO 24236:2005 Surface chemical analysis - Auger electron spectroscopy - Repeatability and constancy of intensity scale

Association Francaise de Normalisation

NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF ISO 14707:2006 Analyse chimique des surfaces - Spectrométrie d'émission optique à décharge luminescente - Introduction à son emploi
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
NF X21-053*NF ISO 14707:2006 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to use
NF X21-069-1:2010 Surface chemical analysis - Vocabulary - Part 1 : general terms and terms used in spectroscopy.
NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.

KR-KS

KS D ISO 14707-2003(2023) Surface chemical analysis - Glow discharge emission spectroscopy (GD-OES) - Introduction
KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale

Korean Agency for Technology and Standards (KATS)

KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 14706:2003 Surface chemical analysis－Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence(TXRF) spectroscopy
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 19319-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 17973:2011 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters

Defense Logistics Agency

DLA A-A-50767-1983 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 2-2001 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 3-2006 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 1-1995 ANALYZER, SURFACE FINISH

Japanese Industrial Standards Committee (JISC)

JIS K 0150:2009 Surface chemical analysis -- Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry
JIS K 0144:2018 Surface chemical analysis -- Glow discharge optical emission spectrometry (GD-OES) -- Introduction to use
JIS K 0144:2001 Surface chemical analysis -- Glow discharge optical emission spectrometry (GD-OES) -- Introduction to use
JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
JIS K 0147-1:2017 Surface chemical analysis -- Vocabulary -- Part 1: General terms and terms used in spectroscopy

American Society for Testing and Materials (ASTM)

ASTM E1257-93(2003) Standard Guide for Evaluating Grinding Materials Used for Surface Preparation in Spectrochemical Analysis

Standard Association of Australia （SAA）

AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS ISO 24237:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale

AT-ON

ONORM M 6253 Teil.1-1985 Water analysis; determination ofanionic Surfactants by the methylene blue spectrometric method

RO-ASRO

STAS 1706/17-1971 CUPPER speelrochemical analysis

U.S. Air Force

AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER