X-ray Electron Spectroscopy Applications

X-ray Electron Spectroscopy Applications, Total:140 items.

The international standard classification for "X-ray Electron Spectroscopy Applications" includes: Chemical analysis , Optical measuring instruments , Measurement of electrical and magnetic quantities , IT applications in science , Other standards related to analytical chemistry , Optical equipment , Protection against crime , Electronic components in general .

The Chinese standard classification for "X-ray Electron Spectroscopy Applications" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Integrated test system , Computer application , Electronic element in general , Electrochemical, thermochemistry and optical profile type analyzer , Crime judging technology .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
GB/T 17507-1998 General specification of thin biological STANDARDs for X-ray EDS microanalysis in electron microscope
GB/Z 32490-2016 Surface chemical analysis--X-ray photoelectron spectroscopy--Procedures for determining backgrounds
GB/T 33352-2024 General rules of screening application of restricted substances in electrical and electronic products—X-Ray fluorescence spectrometry
GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
GB/T 33352-2016e General rules of screening application of restricted substances in electrical and electronic products—X-Ray fluorescence spectrometry
GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale

Professional Standard - Electron

SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
GB/T 33352-2016 General rules of screening application of restricted substances in electrical and el ectronic products一X-Ray fluorescence spectrometry

Professional Standard - Public Safety Standards

GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1215-2013 Characterization of Single-Walled Carbon Nanotubes Using Scanning Electron Microscopy and Energy Spectroscopy
DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy

Fujian Provincial Standard of the People's Republic of China

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Professional Standard - Nuclear Industry

EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis

Group Standards of the People's Republic of China

T/CSTM 01199-2024 Multilayer metal film-Measurement and analysis method of layer structure-X-ray photoelectron spectroscopy

Military Standard of the People's Republic of China-General Armament Department

GJB 5814-2006 Testing method of X-ray dose enhancement effect for military electronic devices

American Society for Testing and Materials (ASTM)

ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E2735-14(2020) Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM E1523-97 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1523-15 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1523-24 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry

German Institute for Standardization

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English

British Standards Institution (BSI)

BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
BS ISO 14701:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
BS ISO 19318:2021 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction

International Organization for Standardization (ISO)

ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p
ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO 18118:2024 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis

GSO

BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
OS GSO ISO 18554:2017 Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
GSO ISO 18554:2017 Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
GSO ISO 15470:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
GSO ISO 14701:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness
GSO ISO/TR 18392:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for determining backgrounds
OS GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
BH GSO ISO 13424:2017 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
BH GSO ISO 20903:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results
BH GSO ISO 16243:2017 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
OS GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

SCC

11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
DIN ISO 16129 E:2020 Draft Document - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
AWWA 51768 Identification of Low Pressure Reverse Osmosis Membrane Failure by X-Ray Photoelectron Spectroscopy
BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
09/30191895 DC BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
BS ISO 19318:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
10/30212265 DC BS ISO 14701. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness

Korean Agency for Technology and Standards (KATS)

KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 15470-2020 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 19318-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
KS D ISO 18118-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h

Association Francaise de Normalisation

NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF M60-512:1984 X AND GAMMA REFERENCE RADIATIONS FOR CALIBRATING DOSEMETERS AND DOSE RATEMETERS AND FOR DETERMINING THEIR RESPONSE AS A FUNCTION OF PHOTON ENERGY.
NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
NF ISO 16243:2012 Chemical Analysis of Surfaces - X-ray Photoelectron Spectroscopy (XPS) Data Logging and Reporting

KR-KS

KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale

Standard Association of Australia （SAA）

AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales

RU-GOST R

GOST 25645.118-1984 Cosmic X-rays of the discrete sources. Energy spectra and angular coordinates