Tritium Electron Spectroscopy
Tritium Electron Spectroscopy, Total:54 items.
The international standard classification for "Tritium Electron Spectroscopy" includes: Chemical analysis , IT applications in science , Optical equipment , Measurement of electrical and magnetic quantities , Optical measuring instruments .
The Chinese standard classification for "Tritium Electron Spectroscopy" includes: Oceanology , Basic standards and general methods , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Computer application , Electron optics and other physical optics instrument , Integrated test system .
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 35570-2017 Determination of tritium activity concentration in sea water―Low-background liquid scintillation spectrometry method
- GB/T 35158-2017 Verification method for Auger electron spectrometers
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 09-1992 Verification Regulations for Electron Spectrometer
Professional Standard - Education
- JY/T 013-1996 General rules for electron spectroscopic analysis
Professional Standard - Agriculture
- JJG(教委) 013-1996 Verification Regulations for Electron Spectrometer
Professional Standard - Electron
- SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
- GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
- GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
- GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
未注明发布机构
- DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Professional Standard - Machinery
- JB/T 6976-1993 Auger Electron Spectroscopy Element Identification Method
American National Standards Institute (ANSI)
- ANSI N42.30-2002 Performance Specification for Tritum Monitors
Korean Agency for Technology and Standards (KATS)
- KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
- KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
- KS D ISO 21270-2020 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
- KS D ISO 21270:2005 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
- KS D ISO 21270-2005(2020) Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
Association Francaise de Normalisation
- NF M60-309:2001 Nuclear energy - Nuclear fuel technology-Waste - Tritium releasing assay in tritiated waste packages by ionization chamber
American Society for Testing and Materials (ASTM)
- ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
- ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
- ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
- ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
German Institute for Standardization
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
British Standards Institution (BSI)
- BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
- BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
GSO
- BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
International Organization for Standardization (ISO)
- ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
SCC
- 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
- IEEE N42.30-2002 American National Standard for Performance Specification for Tritium Monitors
Electron Spectroscopy,Elemental Electron Spectroscopy,Electron spectroscopy,X-ray electron spectroscopy,Scanning Electron Spectroscopy,Electron spectroscopy instrument,Electron microscope + electron spectroscopy,Electron spectrometer,Electron Spectroscopy Elements,x-electron spectroscopy,electron microscopy electron spectroscopy,Electron Spectrum Scanning,electron spectrum aes,Electron Spectroscopy Applications,Tritium Electron Spectroscopy,Electron Spectroscopy and Energy Spectroscopy,Electron Spectroscopy,Electron Spectrum-