Horizontal resolution detection
Horizontal resolution detection, Total:29 items.
The international standard classification for "Horizontal resolution detection" includes: Chemical analysis .
The Chinese standard classification for "Horizontal resolution detection" includes: Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
- GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
Taiwan Provincial Standard of the People's Republic of China
- CNS 10928-1984 Method of Test for Fiber Optic Devices (Reflactive Index Profile Transverse Interference Method)
International Organization for Standardization (ISO)
- ISO/FDIS 23124:2023 Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
- ISO/DIS 23124:2023 Surface Chemical Analysis — Measurement of lateral and axial resolutions of Raman microscope
- ISO 23124:2024 Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
- ISO 18337:2015 Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope
- ISO 18516:2019 Surface chemical analysis — Determination of lateral resolution and sharpness in beam based methods with a range from nanometres to micrometres
- ISO/TR 19319:2013 Surface chemical analysis - Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
- ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
- ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
British Standards Institution (BSI)
- BS ISO 23124:2024 Surface chemical analysis. Measurement of lateral and axial resolutions of a Raman microscope
- 23/30420097 DC BS ISO 23124 Surface Chemical Analysis. Measurement of lateral and axial resolutions of Raman microscope
- BS ISO 18337:2015 Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
- BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
- BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
- 15/30291643 DC BS ISO 18516. Surface chemical analysis. Determination of lateral resolution and sharpness in beam based methods
IET - Institution of Engineering and Technology
- RDO DIR FIND SUPERRES-1991 Radio Direction Finding and Superresolution
GSO
- OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- BH GSO ISO/TR 19319:2016 Surface chemical analysis -- Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
- GSO ISO/TR 19319:2013 Surface chemical analysis -- Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
Association Francaise de Normalisation
- NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
German Institute for Standardization
- DIN ISO 18516 E:2020-01 Surface chemical analysis - Determination of lateral resolution and sharpness in beam based methods with a range from nanometers to micrometers
- DIN ISO 18516:2020-11 Surface chemical analysis - Determination of lateral resolution and sharpness in beam based methods with a range from nanometers to micrometers (ISO 18516:2019); Text in English
Standard Association of Australia （SAA）
- AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
Korean Agency for Technology and Standards (KATS)
- KS D ISO 19319:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
YU-JUS
- JUS H.N8.250-1989 Testing of paper and board. Determination of machine and cross directi- on
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