Sign In |Help & Support
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)

How to prepare samples for X-ray photoelectron spectrometer

How to prepare samples for X-ray photoelectron spectrometer, Total:91 items.

The international standard classification for "How to prepare samples for X-ray photoelectron spectrometer" includes: Chemical analysis , IT applications in science , Optical measuring instruments , Measurement of electrical and magnetic quantities , Other standards related to nuclear energy , Other standards related to analytical chemistry , Other standards related to optics and optical measurements .

The Chinese standard classification for "How to prepare samples for X-ray photoelectron spectrometer" includes: Basic standards and general methods , Computer application , Electron optics and other physical optics instrument , Integrated test system , General nuclear instrument , Electrochemical, thermochemistry and optical profile type analyzer .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
  • GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
  • GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
  • GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
  • GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
  • GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
  • GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
  • GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
  • GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
  • GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
  • GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens

Professional Standard - Electron

  • SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
  • SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers

Professional Standard - Machinery

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales

National Metrological Technical Specifications of the People's Republic of China

  • JJF 2024-2023 Calibration Specification for Energy Dispersive X-Ray Fluorescence Spectrometers

工业和信息化部/国家能源局

  • JB/T 12962.1-2016 Energy dispersive X-ray fluorescence spectrometer. Part 1: General specification
  • JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
  • JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer

National Metrological Verification Regulations of the People's Republic of China

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

German Institute for Standardization

  • DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
  • DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English

British Standards Institution (BSI)

  • BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
  • BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
  • BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis

International Organization for Standardization (ISO)

  • ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
  • ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis

GSO

  • OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
  • BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
  • OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
  • BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
  • GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
  • OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
  • BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
  • BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

SCC

  • 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • DIN ISO 16129 E:2020 Draft Document - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
  • ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
  • BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
  • BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters

Korean Agency for Technology and Standards (KATS)

  • KS D ISO 21270:2005 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 21270-2005(2020) Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 21270-2020 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
  • KS D ISO 19319-2020 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer

American Society for Testing and Materials (ASTM)

  • ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
  • ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
  • ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
  • ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
  • ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
  • ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
  • ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
  • ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E902-05 Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
  • ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E1523-97 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
  • ASTM E1523-15 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy

KR-KS

Standard Association of Australia (SAA)

  • AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

Japanese Industrial Standards Committee (JISC)

Association Francaise de Normalisation

  • NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.

IN-BIS

  • IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers