What does Auger Electron Spectroscopy measure?
What does Auger Electron Spectroscopy measure?, Total:51 items.
The international standard classification for "What does Auger Electron Spectroscopy measure?" includes: Chemical analysis , Optical equipment , Measurement of electrical and magnetic quantities , IT applications in science .
The Chinese standard classification for "What does Auger Electron Spectroscopy measure?" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Integrated test system , Computer application .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
- GB/T 25187-2010 Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
- GB/Z 32494-2016 Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information
- GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
- GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy
- GB/T 36533-2018 Determination of the chemical state of micro-iron in silicate—Auger electron spectroscopy
- GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
- GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- GB/T 35158-2017 Verification method for Auger electron spectrometers
Professional Standard - Machinery
- JB/T 6976-1993 Auger Electron Spectroscopy Element Identification Method
Professional Standard - Electron
- SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
- SJ/T 10457-1993 Standard guide for depth profiling in auger electron spectroscopy
American Society for Testing and Materials (ASTM)
- ASTM E1127-24 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
- ASTM E1127-08(2015) Standard Guide for Depth Profiling in Auger Electron Spectroscopy
- ASTM E1127-08 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
- ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E1127-91(1997) Standard Guide for Depth Profiling in Auger Electron Spectroscopy
- ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E995-25 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
- ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
- ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
- ASTM E983-04 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
- ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GCC Standardization Organization
- GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- GSO ISO/TR 18394:2021 Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information
- GSO ISO 16242:2015 Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES)
- GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
- BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
- BH GSO ISO 16242:2017 Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES)
British Standards Institution (BSI)
- BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
- PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
- BS PD ISO/TR 18394:2006 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
- BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
- BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
- BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- BS ISO 15471:2016 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
Association Francaise de Normalisation
- NF ISO 24236:2006 Chemical analysis of surfaces - Auger electron spectroscopy - Repeatability and constancy of the energy scale
- NF ISO 16242:2012 Surface Chemical Analysis - Auger Electron Spectroscopy (AES) Data Recording and Reporting
Korean Agency for Technology and Standards (KATS)
- KS D ISO 15471-2005(2020) Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
- KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS D ISO 15471-2020 Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
- KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
International Organization for Standardization (ISO)
- ISO/TR 18394:2016 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
