Diffraction point
Diffraction point, Total:110 items.
The international standard classification for "Diffraction point" includes: Non-destructive testing of metals , Refractories , Non-destructive testing , Optics and optical measurements in general , Particle size analysis. sieving , Physicochemical methods of analysis , Radiation protection , Welded joints , Springs , Cosmetics. Toiletries , Other standards related to optics and optical measurements , Optical measuring instruments , Materials for aerospace construction , Protection against crime .
The Chinese standard classification for "Diffraction point" includes: Metal physical property test method , Siliceous refractory , X ray, magnetic powder, fluorescent light and other defectoscope , Electron optics and other physical optics instrument , Sieving, Sieve Plate and Sieve Screen , Powder metallurgy analysis method , Basic standards and general methods , Radiological sanitation protection , Welding and cutting , Spring , Cosmetics , Office supplies and office implements , Basic standards for aviation and aerospace materials , Crime judging technology .
Professional Standard - Ferrous Metallurgy
- YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
- YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 19077.1-2003 Particle size analysis-Laser diffraction method
- GB/T 42208-2022 Nanotechnologies—Measurement of nanoparticle size in multiphase system—Image method of transmission electron microsopy
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 23413-2009 Determination of crystallite size and micro - strain of nano - Materials - X - ray diffraction line broadening method
- GB/T 19501-2004 General guide for electron backscatter diffraction analysis
- GB/T 19077-2016 Particle size analysis―Laser diffraction methods
- GB/T 43690-2024 Test method for diffraction efficiency of imaging diffractive optical elements
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 36923-2018 Identification of pearl powder—X-ray diffraction analysis
- GB/T 41115-2021 Non-destructive testing of welds—Ultrasonic testing—Use of time-of-flight diffraction technique (TOFD)
- GB/T 39520-2020 Test method for determination the residual stress of spring by X-ray diffraction
Professional Standard - Machinery
- JB/T 8239.1-1999 Basic parameters for diffraction grating
- JB/T 11144-2011 X-ray diffractometer
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 8239.2-1999 Specification for diffraction grating
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 9400-1999 Specification for X-ray diffractometer
National Metrological Technical Specifications of the People's Republic of China
- JJF 1447-2014 Calibration specification for ultrasonic flaw detector by time-of-flight diffraction
- JJF 1967-2022 Calibration Specification for Reflection Gratings by Laser Diffraction
Professional Standard - Agriculture
- SN/T 5579-2023 Determination of the graphitization degree of carbon materials - X-ray diffraction method
- 57药典 四部-2020 0451 X-ray diffraction method
- 77药典 四部-2015 0451 X-ray diffraction method
- 2355药典 二部-2010 Appendix IX FX-Ray Powder Diffraction Method
- 784兽药典 一部-2015 Appendix Contents 0400 Spectroscopy 0451 X-ray Diffraction
National Metrological Verification Regulations of the People's Republic of China
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 629-1989 Polycrystalline X-ray Diffractometer
Professional Standard - Education
- JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry
- JY 141-1982 Demonstration Instrument for Interference, Diffraction and Polarization of Light
工业和信息化部
- YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
- YS/T 1178-2017 Phase analysis for aluminum slag-X-ray diffraction spectroscopy
- YB/T 4677-2018 Precision seamless steel tubes for motorcycle shock absorber
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
- SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry
国家质量监督检验检疫总局
- SN/T 4760-2017 Identification of import zinc concentrates-X-ray diffraction method
Professional Standard - Aviation
- HB 6742-1993 Determination of Crystal Orientation for Monocrystal Blade - X-ray Back-reflection Laue Photograph Method
Professional Standard - Public Safety Standards
- GA/T 2079-2023 Forensic sciences-Examination methods for minerals-X-ray diffractometry
Professional Standard - Commodity Inspection
- SN/T 3975-2014 Identification method of bauxite - X ray diffractometry
水利部
- SL 536-2011 Standard test method for verifying the alignment of X-ray diffraction instrumentation for residual stress measurement
ITU-R - International Telecommunication Union/ITU Radiocommunication Sector
- ITU-R P.526-2-1992 Propagation by Diffraction
- ITU-R P.526-7-2001 Propagation by Diffraction
- ITU-R P.526-4-1995 Propagation by Diffraction
- ITU-R P.526-12-2012 Propagation by diffraction
- ITU-R P.526-3-1994 Propagation by Diffraction
- ITU-R P.526-5-1997 Propagation by Diffraction
- ITU-R P.526-14-2018 Propagation by diffraction
- ITU-R P.526-9-2005 Propagation by diffraction
- ITU-R P.526-6-1999 Propagation by Diffraction
- ITU-R P.526-8-2003 Propagation by diffraction (Question ITU-R 202/3)
SCC
- ITU-R P.526-15-2019 Propagation by diffraction
- VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
- DANSK DS/ISO 13320:2020 Particle size analysis – Laser diffraction methods
International Telecommunication Union (ITU)
- ITU-R P.526-2013 Propagation by diffraction
- ITU-R P.526-11-2009 Propagation by diffraction
- ITU-R P.526-11 SPANISH-2009 Propagation by diffraction Propagaci髇 por difracci髇
- ITU-R P.526-11 FRENCH-2009 Propagation by diffraction Propagation par diffraction
- ITU-R P.526-10-2007 Propagation by diffraction
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
Korean Agency for Technology and Standards (KATS)
- KS M 0043-2009 General rules for X-ray diffractometric analysis
- KS M 0043-2019 General rules for X-ray diffractometric analysis
- KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
- KS A ISO 13320:2022 Particle size analysis — Laser diffraction methods
- KS A ISO 13320-2014(2019) Particle size analysis — Laser diffraction methods
- KS B ISO 15902:2008 Optics and photonics-Diffractive optics-Vocabulary
IET - Institution of Engineering and Technology
- GEOMET THEO DIFF-1994 Geometrical Theory of Diffraction
- THEO EDGE DIFF ELECTRO-2009 Theory of Edge Diffraction in Electromagnetics: Origination and validation of the physical theory of diffraction
- APRT ANT DIFF THEO-1981 Aperture Antennas and Diffraction Theory
- GEOMET THEO DIFF ELECTRO WAV-1979 Geometrical Theory of Diffraction for Electromagnetic Waves
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 10-2015 X-ray optical systems - Diffraction gratings
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 Blatt 10-2014 Roentgenoptische Systeme - Beugungsgitter
American Society for Testing and Materials (ASTM)
- ASTM UOP905-91 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-08 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-20 Platinum Agglomeration by X-Ray Diffraction
Universal Oil Products Company (UOP)
- UOP 905-2008 Platinum Agglomeration by X-Ray Diffraction
British Standards Institution (BSI)
- BS ISO 13320:2020 Particle size analysis. Laser diffraction methods
- BS ISO 13320:2009 Particle size analysis - Laser diffraction methods
- BS ISO 13320:2010 Particle size analysis. Laser diffraction methods
- BS EN ISO/IEC 15408-4:2023 Information security, cybersecurity and privacy protection. Evaluation criteria for IT security - Framework for the specification of evaluation methods and activities
Society of Automotive Engineers (SAE)
- SAE J784-1971 Residual Stress Measurement by X-Ray Diffraction
- SAE HS-784-2003 SAE Residual Stress Measurement by X-Ray Diffraction, 2003 Edition
SAE - SAE International
- SAE J784A-1971 Residual Stress Measurement by X-Ray Diffraction
Japanese Industrial Standards Committee (JISC)
- JIS Z 8825:2022 Particle size analysis -- Laser diffraction methods
- JIS Z 8825:2013 Particle size analysis.Laser diffraction methods
- JIS K 0131:1996 General rules for X-ray diffractometric analysis
GSO
- BH GSO ISO 13320:2016 Particle size analysis -- Laser diffraction methods
- GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
- OS GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
- ISO/TS 5973:2024 Laser diffraction measurements — Good practice
KR-KS
- KS A ISO 13320-2022 Particle size analysis — Laser diffraction methods
German Institute for Standardization
- DIN ISO 13320:2022-12 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
- DIN ISO 13320 E:2022-05 Particle size analysis - Laser diffraction methods
- DIN EN ISO 15902:2020-05 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019); German version EN ISO 15902:2020
American National Standards Institute (ANSI)
- ANSI/HPS N43.2-2021 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
- ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
- ANSI/ASTM E1426:1994 Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress
United States Navy
- NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION
Danish Standards Foundation
- DS/ISO 13320:2009 Particle size analysis - Laser diffraction methods
BSI
- BS PD ISO/TS 5973:2024 Laser diffraction measurements. Good practice
- DANSK DS/ISO/TS 5973:2024 Laser diffraction measurements – Good practice
International Organization for Standardization (ISO)
- ISO 13320:2020 Particle size analysis — Laser diffraction methods
- ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
- ISO 13320:2009 Particle size analysis - Laser diffraction methods
- ISO/CD TS 5973.2:2023 Good practice for laser diffraction measurements
- ISO/CD TS 5973 Good practice for laser diffraction measurements
GOSTR
- GOST 6912.2-1993 Alumina. X-rays difractial method for the determination of alfa-oxide-aluminium
GOST
- GOST R 50152-1992 Alumina. X-rays difractional method for the determination of alfa-oxide-aluminium
CU-NC
- NC 33-26-1984 Oil and Oil Derivatives Determination of Smoke Point
diffraction,cloud point pour point,pour point cloud point,soften point,pour point cloud point,Point softening point meter,Diffraction Powder Diffraction,annealing point strain point,point board point,Dot concentration deviation,Secondary Diffraction Diffraction Spot,Neutron Diffraction Peaks,Neutron Diffraction Technique Diffraction,Diffraction point,point and pour point,Diffraction Diffraction,point monitoring point,Diffraction point,electron diffraction diffraction