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structural analysis x-ray

structural analysis x-ray, Total:143 items.

The international standard classification for "structural analysis x-ray" includes: Inorganic chemicals in general , Chemical analysis , Construction materials , Wood-based panels in general , Cosmetics. Toiletries , Electronic tubes , Radiation protection , Chemical analysis of metals , Non-destructive testing , Refractories , Other iron and steel products , Cement. Gypsum. Lime. Mortar , Occupational safety. Industrial hygiene .

The Chinese standard classification for "structural analysis x-ray" includes: Inorganic chemicals in general , Basic standards and general methods , Cement , Artificial board , Cosmetics , Other electron tube , Radiological sanitation protection , Metal physical property test method , X ray, magnetic powder, fluorescent light and other defectoscope , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Optical instrument in general , Siliceous refractory , Beneficiation reagent .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 13710-1992 detail for specification of X - Ray tubes for analysis
  • GB/T 36923-2018 Identification of pearl powder—X-ray diffraction analysis
  • GB/T 5225-1985 Metal materials-Quantitative phase analysis-Value Kmethod of X-ray diffraction
  • GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
  • GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
  • GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
  • GB/T 32774-2016 X-ray inspection method for internal structure characteristics of wooden door
  • GB/T 42360-2023 Surface chemical analysis―Total reflection X-ray fluorescence analysis of water
  • GB/T 30904-2014 Inorganic chemicals for industrial use―Crystal form analysis―X-ray diffraction method
  • GB/T 19140-2003 Technologic rules for X-ray fluorescence analysis of cements
  • GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment

Group Standards of the People's Republic of China

  • T/CSTM 01199-2024 Multilayer metal film-Measurement and analysis method of layer structure-X-ray photoelectron spectroscopy
  • T/CSTM 00166.2-2020 Characterization for graphene materials Part 2 X-ray diffraction

Professional Standard - Education

  • JY/T 008-1996 General rules for crystal and molecular structure determination of small molecules by four-circle single crystal X-ray diffractometer
  • JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer

Professional Standard - Commodity Inspection

  • SN/T 5499-2023 Determination of talc content in minerals by full spectrum fittingX-ray diffraction method

Professional Standard - Non-ferrous Metal

  • YS/T 1178-2024 Phase analysis for aluminium slags and ashes—X-ray diffraction method
  • YS/T 1178-2017 Phase analysis for aluminum slag-X-ray diffraction spectroscopy

Professional Standard - Machinery

  • JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
  • JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
  • JB/T 9401-1999 Side window fluorescence analysis X-ray tube

Professional Standard - Ferrous Metallurgy

  • YB/T 5320-2006 Metal materials -- Quantitative phase analysis -- Value K method of X-ray diffraction
  • YB/T 4177-2008 Determination of chemical composition in slag by X-ray fluorescence spectrometry
  • YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
  • YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method

Professional Standard - Nuclear Industry

  • EJ/T 1068-1998 Plutonium-238 sources fluorescence analysis for x-ray
  • EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis
  • EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
  • EJ/T 1067-1998 Americium-241 sources fluorescence analysis for X-ray

Professional Standard - Building Materials

Professional Standard - Energy and Power Planning

  • DL/T 1151.22-2012 Analytical Methods of Scale and Corrosion Products in Power Plants - Part 22: Standard Test Methods of X-ray Fluorescence Spectrometry and X-ray Diffraction

Professional Standard - Water Conservancy

  • SL 547-2011 Residual stress analysis for hydraulic steel structure by X-ray diffraction method

Occupational Health Standard of the People's Republic of China

  • GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

Taiwan Provincial Standard of the People's Republic of China

  • CNS 11942.23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys

Association Francaise de Normalisation

  • NF T25-111-3:1991 Carbon fibres- Texture and structure- Part 3: Azimutal analysis of the diffraction of the X-rays
  • NF C74-111:1985 Electromedical equipment. Radiology equipment. X radiation equipment. Radiodiagnostic X-ray tube assemblies. Construction and tests. Requirements.
  • NF X43-600-2*NF ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by x-ray diffraction - Part 2 : method by indirect analysis
  • NF B49-422-2*NF EN 12698-2:2008 Chemical analysis of nitride bonded silicon carbide refractories - Part 2 : XRD methods.

Gosstandart of Russia

German Institute for Standardization

  • DIN 51418-2:1996-09 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
  • DIN 51418-1:1996-09 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN 51418-1:2025-05 X-ray spectrometry – X-ray emission and X-ray fluorescence analysis (XRF) – Part 1: General vocabulary
  • DIN 51418-2 Supplement 1:2000-04 X-ray spectrometry - X-Ray Emission- and X-ray Fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation
  • DIN 51418-1 E:2007-07 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
  • DIN 51418-1 E:2024-08 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: General vocabulary; Text in German and English
  • DIN 51418-2 E:2014 Draft Document - X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
  • DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
  • DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
  • DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN 51418-1 E:2007 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN 51418-2 E:2014-06 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
  • DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
  • DIN 51418-2 Bb.1:2000 X-ray spectrometry - X-Ray Emission- and X-ray Fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation
  • DIN 6812:2021-06 Medical X-ray equipment up to 300 kV - Rules of construction for structural radiation protection
  • DIN 6812:2013-06 Medical X-ray equipment up to 300 kV - Rules of construction for structural radiation protection
  • DIN EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods English version of DIN EN 12698-2:2007-06
  • DIN 6812:2021 Medical X-ray equipment up to 300 kV - Rules of construction for structural radiation protection
  • DIN 51418-2 Supplement 1:2000 X-ray spectrometry - X-Ray Emission- and X-ray Fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation

Portuguese Institute of Quality

Korean Agency for Technology and Standards (KATS)

Japanese Industrial Standards Committee (JISC)

British Standards Institution (BSI)

International Organization for Standardization (ISO)

  • ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
  • ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
  • ISO 17867:2020 Particle size analysis — Small angle X-ray scattering (SAXS)
  • ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
  • ISO/TS 13762:2001 Particle size analysis - Small angle X-ray scattering method
  • ISO 20289:2025 Surface chemical analysis — Total reflection X-ray fluorescence analysis of water
  • ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 2: Method by indirect analysis
  • ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis

The Directorate General of Specifications and Metrology (DGSM)

  • OS GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
  • OS GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
  • OS GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
  • OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis

GCC Standardization Organization

  • GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
  • GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
  • GSO ISO 16258-2:2021 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 2: Method by indirect analysis
  • GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis

American Society for Testing and Materials (ASTM)

  • ASTM STP 485-1971 Energy dispersive X-ray analysis
  • ASTM STP 485 Energy Dispersion X-Ray Analysis
  • ASTM E1621-21 Standard Guide for X-Ray Emission Spectrometric Analysis
  • ASTM STP 376-1965 X RAY AND OPTICAL EMISSION ANALYSIS OF HIGH-TEMPERATURE ALLOYS
  • ASTM STP 349-1964 Symposium on X-ray and Electron Probe Analysis
  • ASTM D5380-09 Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
  • ASTM E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis

International Electrotechnical Commission (IEC)

  • IEC 60522:1976 Inherent filtration of an X-ray tube assembly
  • IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube

Kingdom of Bahrain Testing and Metrology Directorate

  • BH GSO ISO 13424:2017 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
  • BH GSO IEC 62495:2016 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
  • BH GSO ISO 16258-2:2022 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 2: Method by indirect analysis
  • BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis

Belgian Standards Institute

  • NBN 400-4-1969 Radiation equipment: medical X-ray generators and accessories. Structural features that prevent X-ray radioactivity

Ente Nazionale Italiano di Unificazione

  • UNI 10705:1999 X-ray fluorescence analysis on paintings
  • UNI EN ISO 12677:2011 Chemical analysis of refractory products by X-ray fluorescence (XRF) - Fused cast-bead method
  • UNI 8144:1980 Radiation safety for x-ray diffraction and fluorescence analysis equipment.
  • UNI ISO 16258-2:2017 Workplace air -- Analysis of respirable crystalline silica by X-ray diffraction - Part 2: Method by indirect analysis

Danish Standards Foundation

American National Standards Institute (ANSI)

  • ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment

European Committee for Standardization (CEN)

  • EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods

Association for Electrical, Electronic & Information Technologies (VDE)

  • VDE 0412-20-2011 Strahlungsmessgeraete - Tragbare Roentgenfluoreszenz-Analysegeraete mit Kleinstroentgenroehre (IEC 62495:2011)