Diffraction pattern
Diffraction pattern, Total:132 items.
The international standard classification for "Diffraction pattern" includes: Other standards related to optics and optical measurements , Optical measuring instruments , Inorganic chemicals in general , Pigments and extenders , Colours and measurement of light , Particle size analysis. sieving , Radiation protection , Aluminium and aluminium alloys , Other products of the chemical industry , Cosmetics. Toiletries , Refractories , Protection against crime .
The Chinese standard classification for "Diffraction pattern" includes: Electron optics and other physical optics instrument , Inorganic chemicals in general , Basic standard and general method for pigment , Electron beam tube , Sieving, Sieve Plate and Sieve Screen , Powder metallurgy analysis method , Radiological sanitation protection , Metal chemical property test method , Office supplies and office implements , Other chemical products in general , Cosmetics , Siliceous refractory , Crime judging technology .
工业和信息化部
- YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
- SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry
- YS/T 1178-2017 Phase analysis for aluminum slag-X-ray diffraction spectroscopy
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
- YB/T 5360-2020 Metal Materials-Determination of quantitative pole figure- XRD method
Professional Standard - Machinery
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 8239.1-1999 Basic parameters for diffraction grating
- JB/T 11144-2011 X-ray diffractometer
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 8239.2-1999 Specification for diffraction grating
Professional Standard - Agriculture
- 57药典 四部-2020 0451 X-ray diffraction method
- 784兽药典 一部-2015 Appendix Contents 0400 Spectroscopy 0451 X-ray Diffraction
- 2355药典 二部-2010 Appendix IX FX-Ray Powder Diffraction Method
- 77药典 四部-2015 0451 X-ray diffraction method
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 6996.3-1986 Linear test chart B of transparencies for television
- GB/T 6996.8-1986 Registration test chart A of transparencies for television
- GB/T 19501-2004 General guide for electron backscatter diffraction analysis
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB 6996.8-1986 Registration test chart of transparencies for television
- GB/T 6996.12-1986 Gray scale test chart A of transparencies for television
- GB/T 19077-2016 Particle size analysis―Laser diffraction methods
- GB 6996.12-1986 Grayscale test chart of transparencies for television
- GB/T 13170.15-1991 Test charts of reflection for television. Grayscale test chart B
- GB/T 43690-2024 Test method for diffraction efficiency of imaging diffractive optical elements
- GB 6996.2-1986 Linear test chart A of transparencies for television
- GB/T 30904-2014 Inorganic chemicals for industrial use―Crystal form analysis―X-ray diffraction method
- GB/T 13170.14-1991 Test charts of reflection for television. Grayscale test chart A
- GB/T 6996.13-1986 Gray scale test chart B of transparencies for television
- GB/T 13170.2-1991 Test charts of reflection for television. Linear test chart A
- GB/T 6996.2-1986 Linear test chart A of transparencies for television
- GB 6996.9-1986 Registration test chart B of transparencies for television
- GB/T 19077.1-2003 Particle size analysis-Laser diffraction method
- GB/T 6996.9-1986 Registration test chart B of transparencies for television
- GB/T 30793-2014 Measuring ratio of anatase to rutile in titanium dioxide pigments by X-ray diffraction
- GB/T 13170.10-1991 Test charts of reflection for television. Registration test chart B
- GB/T 13170.3-1991 Test charts of reflection for television. linear test chart B
- GB/T 13170.9-1991 Test charts of reflection for television. Registration test chart A
Professional Standard - Non-ferrous Metal
- YS/T 785-2012 Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
- YS/T 976-2014 Determination of α-alumina content in calcined alumina by X-ray diffraction
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 629-1989 Polycrystalline X-ray Diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
Professional Standard - Education
- JY 141-1982 Demonstration Instrument for Interference, Diffraction and Polarization of Light
- JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37054-2018 Nanotechnology—Testing ratio of anatase to rutile in nano-titanium dioxide—X-ray diffraction
- GB/T 36923-2018 Identification of pearl powder—X-ray diffraction analysis
Fujian Provincial Standard of the People's Republic of China
- DB35/T 1914-2020 Determination of β-crystal content in β-crystal polypropylene pipes and fittings (X-ray diffraction method)
Professional Standard - Ferrous Metallurgy
- YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method
国家质量监督检验检疫总局
- SN/T 4760-2017 Identification of import zinc concentrates-X-ray diffraction method
National Metrological Technical Specifications of the People's Republic of China
- JJF 1967-2022 Calibration Specification for Reflection Gratings by Laser Diffraction
Professional Standard - Public Safety Standards
- GA/T 2079-2023 Forensic sciences-Examination methods for minerals-X-ray diffractometry
Professional Standard - Commodity Inspection
- SN/T 3975-2014 Identification method of bauxite - X ray diffractometry
水利部
- SL 536-2011 Standard test method for verifying the alignment of X-ray diffraction instrumentation for residual stress measurement
ITU-R - International Telecommunication Union/ITU Radiocommunication Sector
- ITU-R P.526-2-1992 Propagation by Diffraction
- ITU-R P.526-4-1995 Propagation by Diffraction
- ITU-R P.526-12-2012 Propagation by diffraction
- ITU-R P.526-7-2001 Propagation by Diffraction
- ITU-R P.526-3-1994 Propagation by Diffraction
- ITU-R P.526-5-1997 Propagation by Diffraction
- ITU-R P.526-14-2018 Propagation by diffraction
- ITU-R P.526-9-2005 Propagation by diffraction
- ITU-R P.526-6-1999 Propagation by Diffraction
- ITU-R P.526-8-2003 Propagation by diffraction (Question ITU-R 202/3)
SCC
- ITU-R P.526-15-2019 Propagation by diffraction
- VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
- DANSK DS/ISO 13320:2020 Particle size analysis – Laser diffraction methods
- 09/30179503 DC BS ISO 29301. Microbeam analysis. Analytical transmission electron microscopy. Methods for calibrating image magnification by using reference materials giving a periodic diffraction pattern
IT-UNI
- UNI 6966-1971 Determination of the number of polar patterns in polycrystals by X-ray diffraction
International Telecommunication Union (ITU)
- ITU-R P.526-2013 Propagation by diffraction
- ITU-R P.526-11-2009 Propagation by diffraction
- ITU-R P.526-11 SPANISH-2009 Propagation by diffraction Propagaci髇 por difracci髇
- ITU-R P.526-11 FRENCH-2009 Propagation by diffraction Propagation par diffraction
- ITU-R P.526-10-2007 Propagation by diffraction
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
Japanese Industrial Standards Committee (JISC)
- JIS Z 8791:2011 Methods of measuring diffraction efficiency and associated optical characteristics of hologram
- JIS Z 8825:2022 Particle size analysis -- Laser diffraction methods
- JIS Z 8825:2013 Particle size analysis.Laser diffraction methods
- JIS K 0131:1996 General rules for X-ray diffractometric analysis
Korean Agency for Technology and Standards (KATS)
- KS M 0043-2009 General rules for X-ray diffractometric analysis
- KS M 0043-2019 General rules for X-ray diffractometric analysis
- KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
- KS A ISO 13320:2022 Particle size analysis — Laser diffraction methods
- KS A ISO 13320-2014(2019) Particle size analysis — Laser diffraction methods
IET - Institution of Engineering and Technology
- GEOMET THEO DIFF-1994 Geometrical Theory of Diffraction
- THEO EDGE DIFF ELECTRO-2009 Theory of Edge Diffraction in Electromagnetics: Origination and validation of the physical theory of diffraction
- APRT ANT DIFF THEO-1981 Aperture Antennas and Diffraction Theory
- GEOMET THEO DIFF ELECTRO WAV-1979 Geometrical Theory of Diffraction for Electromagnetic Waves
British Standards Institution (BSI)
- BS ISO 10110-16:2023 Optics and photonics. Preparation of drawings for optical elements and systems. Diffractive surfaces
- BS ISO 13320:2020 Particle size analysis. Laser diffraction methods
- BS ISO 13320:2009 Particle size analysis - Laser diffraction methods
- BS ISO 13320:2010 Particle size analysis. Laser diffraction methods
- BS EN ISO/IEC 15408-4:2023 Information security, cybersecurity and privacy protection. Evaluation criteria for IT security - Framework for the specification of evaluation methods and activities
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 10-2015 X-ray optical systems - Diffraction gratings
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 Blatt 10-2014 Roentgenoptische Systeme - Beugungsgitter
American Society for Testing and Materials (ASTM)
- ASTM UOP905-08 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-91 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-20 Platinum Agglomeration by X-Ray Diffraction
- ASTM D5357-03 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-Ray Diffraction
- ASTM D5357-19 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
- ASTM RR-D32-1036 1993 D5357-Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
- ASTM D3906-03(2008) Standard Test Method for Determination of Relative X-ray Diffraction Intensities of Faujasite-Type Zeolite-Containing Materials
- ASTM D3906-19 Standard Test Method for Determination of Relative X-ray Diffraction Intensities of Faujasite-Type Zeolite-Containing Materials
- ASTM RR-D32-1010 1984 D3906-Test Method for Determination of Relative X-ray Diffraction Intensities of Faujasite-Type Zeolite-Containing Materials
Universal Oil Products Company (UOP)
- UOP 905-2008 Platinum Agglomeration by X-Ray Diffraction
RU-GOST R
- GOST R 8.696-2010 State system for ensuring the uniformity of measurements. Interplanar spacings in crystals and the intensity distribution in diffraction patterns. Method for measurement by means of an electron diffractometer
- GOST R 59738-2021 Optics and photonics. Diffraction gratings. Types, main dimensions and parameters
Society of Automotive Engineers (SAE)
- SAE HS-784-2003 SAE Residual Stress Measurement by X-Ray Diffraction, 2003 Edition
- SAE J784-1971 Residual Stress Measurement by X-Ray Diffraction
SAE - SAE International
- SAE J784A-1971 Residual Stress Measurement by X-Ray Diffraction
GSO
- BH GSO ISO 13320:2016 Particle size analysis -- Laser diffraction methods
- GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
- OS GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
- ISO/TS 5973:2024 Laser diffraction measurements — Good practice
KR-KS
- KS A ISO 13320-2022 Particle size analysis — Laser diffraction methods
American National Standards Institute (ANSI)
- ANSI/HPS N43.2-2021 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
- ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
- ANSI/ASTM E1426:1994 Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress
German Institute for Standardization
- DIN ISO 13320:2022-12 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
- DIN ISO 13320 E:2022-05 Particle size analysis - Laser diffraction methods
Danish Standards Foundation
- DS/ISO 13320:2009 Particle size analysis - Laser diffraction methods
United States Navy
- NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION
International Organization for Standardization (ISO)
- ISO/FDIS 10110-16 Optics and photonics — Preparation of drawings for optical elements and systems — Part 16: Diffractive surfaces
- ISO 10110-16:2023 Optics and photonics — Preparation of drawings for optical elements and systems — Part 16: Diffractive surfaces
- ISO 13320:2020 Particle size analysis — Laser diffraction methods
- ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
- ISO 13320:2009 Particle size analysis - Laser diffraction methods
- ISO/CD TS 5973.2:2023 Good practice for laser diffraction measurements
- ISO/CD TS 5973 Good practice for laser diffraction measurements
BSI
- BS PD ISO/TS 5973:2024 Laser diffraction measurements. Good practice
- DANSK DS/ISO/TS 5973:2024 Laser diffraction measurements – Good practice
GOSTR
- GOST 6912.2-1993 Alumina. X-rays difractial method for the determination of alfa-oxide-aluminium
GOST
- GOST R 50152-1992 Alumina. X-rays difractional method for the determination of alfa-oxide-aluminium
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