Diffraction peaks of silicon
Diffraction peaks of silicon, Total:17 items.
The international standard classification for "Diffraction peaks of silicon" includes: Chemical analysis of metals , Refractories , Cement. Gypsum. Lime. Mortar , Other standards related to optics and optical measurements .
The Chinese standard classification for "Diffraction peaks of silicon" includes: Metal physical property test method , Siliceous refractory , Electron optics and other physical optics instrument .
Professional Standard - Ferrous Metallurgy
- YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer
- YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method
工业和信息化部
- YS/T 1160-2016 Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction
- YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40407-2021 X-ray powder diffraction analysis method for determining the phases in portland cement clinker
Group Standards of the People's Republic of China
- T/CASAS 014-2021 Measuring method for basal plane bending of SiC substrate — High resolution X-ray diffractometry
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 43690-2024 Test method for diffraction efficiency of imaging diffractive optical elements
Professional Standard - Machinery
- JB/T 11144-2011 X-ray diffractometer
Professional Standard - Chemical Industry
- HG/T 6149-2023 Determination of Silica Crystal Phase Content in Hydrogenation Catalyst and Its Support X-ray Diffraction Method
British Standards Institution (BSI)
- 24/30456782 DC BS ISO 16206 Phase quantitative analysis of residual quartz in silica bricks. X-ray diffraction method
- BS ISO 19950:2015 Aluminium oxide primarily used for the production of aluminium. Determination of alpha alumina content. Method using X-ray diffraction net peak areas
- BS EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - XRD methods
GSO
- BH GSO ISO 19950:2022 Aluminium oxide primarily used for the production of aluminium — Determination of alpha alumina content — Method using X-ray diffraction net peak areas
- GSO ISO 19950:2021 Aluminium oxide primarily used for the production of aluminium — Determination of alpha alumina content — Method using X-ray diffraction net peak areas
International Organization for Standardization (ISO)
- ISO 19950:2015 Aluminium oxide primarily used for the production of aluminium - Determination of alpha alumina content - Method using X-ray diffraction net peak areas
ITU-R - International Telecommunication Union/ITU Radiocommunication Sector
- ITU-R P.526-2-1992 Propagation by Diffraction
SCC
- ITU-R P.526-15-2019 Propagation by diffraction
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