x-ray diffraction ray fluorescence
x-ray diffraction ray fluorescence, Total:175 items.
The international standard classification for "x-ray diffraction ray fluorescence" includes: Radiation protection , Construction materials , Chemical analysis , Occupational safety. Industrial hygiene , Other standards related to optics and optical measurements , Cement. Gypsum. Lime. Mortar , Other iron and steel products , Refractories , Radiographic equipment , Protection against crime , Cosmetics. Toiletries , Springs , Non-destructive testing , Testing of metals .
The Chinese standard classification for "x-ray diffraction ray fluorescence" includes: Radiological sanitation protection , Cement , Basic standards and general methods , Electron optics and other physical optics instrument , Optical Measurement , Beneficiation reagent , Siliceous refractory , Medical radiographic equipment , Crime judging technology , Cosmetics , Spring , X ray, magnetic powder, fluorescent light and other defectoscope , Metal physical property test method .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 42360-2023 Surface chemical analysis―Total reflection X-ray fluorescence analysis of water
- GB/T 19140-2003 Technologic rules for X-ray fluorescence analysis of cements
National Health Commission of the People's Republic of China
- GBZ 115-2023 Standard for radiological protection in low-energy radiation generating devices
Occupational Health Standard of the People's Republic of China
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
Professional Standard - Machinery
- JB/T 9401-1999 Side window fluorescence analysis X-ray tube
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 11145-2011 X-ray fluorescence spectrometer
- JB/T 11144-2011 X-ray diffractometer
- JB/T 9400-2010 Specification of X-ray diffractometer
Professional Standard - Agriculture
- 58药典 四部-2020 0461 X-ray fluorescence spectrometry
- 2355药典 二部-2010 Appendix IX FX-Ray Powder Diffraction Method
- 784兽药典 一部-2015 Appendix Contents 0400 Spectroscopy 0451 X-ray Diffraction
- 57药典 四部-2020 0451 X-ray diffraction method
- 77药典 四部-2015 0451 X-ray diffraction method
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4249-2021 Radiation health protection requirements for low-energy ray devices
Professional Standard - Nuclear Industry
- EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
- EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis
- EJ/T 1068-1998 Plutonium-238 sources fluorescence analysis for x-ray
- EJ/T 1067-1998 Americium-241 sources fluorescence analysis for X-ray
- EJ/T 1100-1999 Bore-hole apparatus for X-ray fluorescence analysis
- EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer
工业和信息化部
- JB/T 14323-2021 X-ray fluorescence separator
- YS/T 1178-2017 Phase analysis for aluminum slag-X-ray diffraction spectroscopy
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
- YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
- SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry
Professional Standard - Electricity
- DL/T 1151.22-2012 Analytical Methods of Scale and Corrosion Products in Power Plants - Part 22: Standard Test Methods of X-ray Fluorescence Spectrometry and X-ray Diffraction
未注明发布机构
- DIN 51418-2 E:2014-06 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- DIN 51003:2022-05 Total reflection x-ray fluorescence - Principles and definitions
- DIN 51003 E:2021-05 Total reflection x-ray fluorescence - Principles and definitions
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 810-1993 Wavelength Dispersive X-Ray Fluorescence Spectrometers
- JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer
- JJG 629-1989 Polycrystalline X-ray Diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
Professional Standard - Building Materials
- JC/T 1085-2008 X-ray fluorescence analyzer for cement
Professional Standard - Education
- JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry
- JY/T 0569-2020 General rules for wavelength dispersive X-ray fluorescence spectrometry
Professional Standard - Geology
- DZ 0029-1992 HYX-3 microcomputer X-ray fluorescence instrument
国家能源局
- SY/T 7324-2016 X-ray fluorescence logging instrument calibration method
- SY/T 7420-2018 Specifications for logging by X-ray fluorescence spectrum elements
Professional Standard - Ferrous Metallurgy
- YB/T 4177-2008 Determination of chemical composition in slag by X-ray fluorescence spectrometry
- YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method
国家质量监督检验检疫总局
- SN/T 4760-2017 Identification of import zinc concentrates-X-ray diffraction method
Professional Standard - Medicine
- YY/T 0094-2013 X-ray fluorescent screens for medical diagnosis
- YY/T 0094-2004 X-ray fluorescent screens for medical diagnosis
National Metrological Technical Specifications of the People's Republic of China
- JJF 1306-2011 Calibration Specification for X-Ray Fluorescence Coating Thickness Instruments
- JJF 1952-2021 Calibration Specification for Sulfur X-ray Fluorescence Spectrometry Analyzers
Professional Standard - Commodity Inspection
- SN/T 4020-2013 Determination of impurity elements content in pure iron-X-ray fluorescence spectrometry
- SN/T 3975-2014 Identification method of bauxite - X ray diffractometry
- SN/T 3231-2012 Determination of asbestos in talcum―Polarized light microscope and X-ray diffraction method
Professional Standard - Public Safety Standards
- GA/T 2079-2023 Forensic sciences-Examination methods for minerals-X-ray diffractometry
Group Standards of the People's Republic of China
- T/CAIA SH003-2015 Rice -Determination of cadmium-X ray fluorescence spectrometry method?
- T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer
- T/CACE 064-2022 Determination of coal gasification slag compositions—X-ray fluorescence spectrometric method
水利部
- SL 536-2011 Standard test method for verifying the alignment of X-ray diffraction instrumentation for residual stress measurement
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 36923-2018 Identification of pearl powder—X-ray diffraction analysis
- GB/T 39520-2020 Test method for determination the residual stress of spring by X-ray diffraction
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
- GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
Taiwan Provincial Standard of the People's Republic of China
- CNS 11942-23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
Guangdong Provincial Standard of the People's Republic of China
- DB44/T 1602-2015 Analysis Method of Stone Composition--X-ray Fluorescence Spectrometry
Professional Standard - Electron
- SJ 20714-1998 Test method for sub-surface damege of gallium arsenide polished wafer by X-ray double crystal diffraction
American National Standards Institute (ANSI)
- ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
- ANSI/HPS N43.2-2021 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
- ANSI/ASTM E1426:1994 Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress
SCC
- VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
- DIN 51418-1 E:2007 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- VDI/VDE 5575 BLATT 7-2019 X-ray optical systems - Refractive X-ray lenses
- DIN 51003 E:2021 Draft Document - Total reflection x-ray fluorescence - Principles and definitions
- DIN 51418-2 E:2014 Draft Document - X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- VDI/VDE 5575 BLATT 4:2018 X-ray optical systems — X-ray mirrors and X-ray mirror systems — Total reflection and multilayer mirrors
SAE - SAE International
- SAE AMS2650A-1991 FLUOROSCOPIC X-RAY INSPECTION
- SAE AMS2650-1984 FLUOROSCOPIC X-RAY INSPECTION
- SAE J784A-1971 Residual Stress Measurement by X-Ray Diffraction
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
Korean Agency for Technology and Standards (KATS)
- KS M 0043-2009 General rules for X-ray diffractometric analysis
- KS A 4911-1980(2000) DIMENSIONS FOR X-RAY FLUORESCENT SCREEN
- KS M 0017-2010 General rules for X-ray fluorescence spectrometric analysis
- KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
- KS D 1654-2003(2016) General rules for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 1654-2021 General rules for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 1898-1993 Method for fluorescent X-ray analysis of copper alloys
- KS D 2710-2019 Methods for X-ray fluorescence spectrometric analysis of ferroniobium
- KS D 1654-1993 General Rules for X-ray Fluorescence Spectrometric Analysis of Iron and Steel
- KS D 1898-2009 Methods for X-ray fluorescence spectrometric analysis of copper alloys
- KS D 1655-2008 Method for X-ray fluorescence spectrometric analysis of iron and steel
- KS L 5222-2009 Chemical analysis method of cement by x-ray fluorescence
- KS D 1655-1993 Method for X-Ray Fluorescence Spectrometric Analysis of Iron and Steel
- KS D 1898-2019 Copper alloys —Methods for X-ray fluorescence spectrometric analysis
- KS M 0017-2020 General rules for X-ray fluorescence spectrometric analysis
- KS D 1686-2011 Method for x-ray fluorescence spectrometric analysis of ferroalloys
- KS M 0017-1995 General rules for X-ray fluorescence spectrometric analysis
- KS D 1655-2019 Method for X-ray fluorescence spectrometric analysis of iron and steel
- KS E 3045-2002(2007) X-ray fluorescence spectrometric analysis for iron ores
- KS L 5222-2019 Chemical analysis method of cement by x-ray fluorescence
- KS L 3316-1988 Method for X-ray fluorescence spectrometric analysis of refractory products
- KS L 3316-1998 Method for X-ray fluorescence spectrometric analysis of refractory products
- KS D 1654-2003 General rules for X-ray fluorescence spectrometric analysis of iron and steel
- KS D 1686-2011(2021) Method for x-ray fluorescence spectrometric analysis of ferroalloys
- KS L 3316-2014(2019) Method for X-ray fluorescence spectrometric analysis of refractory products
- KS D 2597-1996 Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
- KS L 3316-2014 Method for X-ray fluorescence spectrometric analysis of refractory products
- KS L 3316-2019 Method for X-ray fluorescence spectrometric analysis of refractory products
- KS D 1686-2021 Method for x-ray fluorescence spectrometric analysis of ferroalloys
German Institute for Standardization
- DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51003:2004 Total reflection x-ray fluorescence - Principles and definitions
- DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN 6830-1:1975 Medical X-ray films used with intensifying screens; sensitometric simulation of the fluorescent radiation of calcium tungstate intensifying screens
- DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
DIN
- DIN 51003:2022 Total reflection X-ray fluorescence - Principles and definitions
RU-GOST R
- GOST 28033-1989 Steel. Method of X-ray-fluorescent analysis
- GOST R 55410-2013 Refractory. Analysis by X-ray fluorescence (XRF)
- GOST R 55080-2012 Cast iron. Method of X-ray fluorescence (XRF) analysis
- GOST R 53203-2008 Petroleum products. Determination of sulfur by method of wavelength dispersive X-ray fluorescence spectrometry
GSO
- DL/T 1151.22-2023 Analysis methods for scale and corrosion products in thermal power plants Part 22: Wavelength dispersive X-ray fluorescence spectrometry and X-ray diffraction
- BH GSO IEC 62495:2016 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- OS GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
American Society for Testing and Materials (ASTM)
- ASTM UOP905-08 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-91 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-20 Platinum Agglomeration by X-Ray Diffraction
- ASTM F3094-14(2022) Standard Test Method for Determining Protection Provided By X-ray Shielding Garments Used in Medical X-ray Fluoroscopy from Sources of Scattered X-Rays
Universal Oil Products Company (UOP)
- UOP 905-2008 Platinum Agglomeration by X-Ray Diffraction
AT-ON
- ONORM S 5240-10-1998 Image quality assurance in X-ray diagnosis - Acceptancetesting in radiographic and fluoroscopic X-ray Systems
Japanese Industrial Standards Committee (JISC)
- JIS K 0119:2008 General rules for X-ray fluorescence analysis
- JIS K 0119:1997 General rules for X-ray fluorescence spectrometric analysis
- JIS G 1256:1997 Iron and steel -- Method for X-ray fluorescence spectrometric analysis
- JIS Z 4911:1989 Dimensions and form for X-ray fluorescent screen
- JIS H 1292:2018 Copper alloys -- Methods for X-ray fluorescence spectrometric analysis
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS G 1256:1982 Fluorescence X-ray analysis method of steel
- JIS M 8205:1983 X-ray fluorescence spectrometric analysis for iron ores
- JIS R 2216:2005 Methods for X-ray fluorescence spectrometric analysis of refractory products
- JIS H 1292:2005 Methods for X-ray fluorescence spectrometric analysis of copper alloys
- JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
- JIS K 0131:1996 General rules for X-ray diffractometric analysis
- JIS G 1256 AMD 1:2010 Iron and steel -- Method for X-ray fluorescence spectrometric analysis (Amendment 1)
- JIS G 1351:2006 Ferroalloys -- Method of X-ray fluorescence spectrometric analysis
- JIS H 1631:2008 Titanium alloys -- Method for X-ray fluorescence spectrometric analysis
- JIS Z 4910:1983 Anti-scatter grids
- JIS H 1292:1997 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
- JIS H 1287:2015 Nickel and nickel alloys -- Methods for X-ray fluorescence spectrometric analysis
ECIA - Electronic Components Industry Association
- CB-13-1990 X-Ray Fluorescence for Measuring Plating Thickness
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 Blatt 10-2014 Roentgenoptische Systeme - Beugungsgitter
- VDI/VDE 5575 Blatt 7-2007 X-Ray optical systems - Refractive X-ray optics - Definition of parameters
- VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 BLATT 7-2018 Roentgenoptische Systeme - Refraktive Roentgenlinsen
- VDI/VDE 5575 BLATT 9-2018 Roentgenoptische Systeme - Roentgenfilter
- VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 BLATT 9-2019 Roentgenoptische Systeme - Roentgenfilter
- VDI/VDE 5575 Blatt 3-2009 X-Ray optical systems - Cappilary x-ray optics
- VDI/VDE 5575 BLATT 3-2019 Roentgenoptische Systeme - Roentgenkapillaren
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 10-2015 X-ray optical systems - Diffraction gratings
- VDI/VDE 5575 Blatt 7-2011 X-Ray optical systems - Refractive X-ray lenses
- VDI/VDE 5575 Blatt 9-2012 X-ray optical systems - X-ray filters
- VDI/VDE 5575 Blatt 3-2011 X-ray optical systems - Capillary X-ray lenses
Society of Automotive Engineers (SAE)
- SAE J784-1971 Residual Stress Measurement by X-Ray Diffraction
- SAE HS-784-2003 SAE Residual Stress Measurement by X-Ray Diffraction, 2003 Edition
Electronic Components, Assemblies and Materials Association
- ECA CB-13-1990 X-Ray Fluorescence for Measuring Plating Thickness
KR-KS
- KS D 1655-2008(2019)(英文版) Method for X-ray fluorescence spectrometric analysis of iron and steel
SE-SIS
- SIS SS IEC 627:1986 X-ray equipment - Characteristics of anti-scatter grids used in X-ray equipment
- SIS SS IEC 520:1989 X-ray equipment — Entrance fieldsizes of electrooptical X-ray image intensifiers
International Organization for Standardization (ISO)
- ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
British Standards Institution (BSI)
- BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
International Electrotechnical Commission (IEC)
- IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
GOST
- GOST R 50152-1992 Alumina. X-rays difractional method for the determination of alfa-oxide-aluminium
GOSTR
- GOST 6912.2-1993 Alumina. X-rays difractial method for the determination of alfa-oxide-aluminium
VDE - VDE Verlag GmbH@ Berlin@ Germany
- VDE 0412-20-2011 Strahlungsmessgeraete - Tragbare Roentgenfluoreszenz-Analysegeraete mit Kleinstroentgenroehre (IEC 62495:2011)
Standard Association of Australia (SAA)
- AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
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