SN/T 4020-2013 in English
VALIDDetermination of impurity elements content in pure iron-X-ray fluorescence spectrometry
- Issued on:2013-11-06
- Implemented on:2014-06-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$156.00
Scope
This standard specifies the method for the determination of wavelength dispersive X-ray fluorescence spectroscopy of impurity elements in pure iron. This standard is applicable to the determination of the impurity elements silicon, manganese, phosphorus, sulfur, chromium, copper, nickel and aluminum in pure iron. The measurement range of each element is shown in Table 1.

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