What is the quality of Rigaku’s X-ray spectrometer?

What is the quality of Rigaku’s X-ray spectrometer?, Total:77 items.

The international standard classification for "What is the quality of Rigaku’s X-ray spectrometer?" includes: Other standards related to optics and optical measurements , Chemical analysis , IT applications in science , Other standards related to nuclear energy , Iron ores .

The Chinese standard classification for "What is the quality of Rigaku’s X-ray spectrometer?" includes: Electron optics and other physical optics instrument , Ionizating Radiation Measurement , Basic standards and general methods , Computer application , General nuclear instrument , Iron ore , Optical Measurement .

Professional Standard - Machinery

JB/T 11145-2011 X-ray fluorescence spectrometer

未注明发布机构

DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

National Metrological Technical Specifications of the People's Republic of China

JJF 2024-2023 Calibration Specification for Energy Dispersive X-Ray Fluorescence Spectrometers
JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/Z 42358-2023 Iron ores—Wavelength dispersive X-ray fluorescence spectrometers—Determination of precision
GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
GB/T 42360-2023 Surface chemical analysis―Total reflection X-ray fluorescence analysis of water
GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales

工业和信息化部/国家能源局

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
JB/T 12962.1-2016 Energy dispersive X-ray fluorescence spectrometer. Part 1: General specification
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer

Professional Standard - Commodity Inspection

SN/T 4020-2013 Determination of impurity elements content in pure iron-X-ray fluorescence spectrometry

National Metrological Verification Regulations of the People's Republic of China

JJG 810-1993 Wavelength Dispersive X-Ray Fluorescence Spectrometers
JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer

Group Standards of the People's Republic of China

T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer

Professional Standard - Agriculture

JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer

Professional Standard - Non-ferrous Metal

YS/T 739.1-2023 Chemical analysis methods of aluminium electrolyte- Part 1: Determination of elements content – X-ray fluorescence spectrometry method

Korean Agency for Technology and Standards (KATS)

KS E 3045-2002(2007) X-ray fluorescence spectrometric analysis for iron ores
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 3497-2002(2017) Metallic coatings－Measurement of coating thickness－X-ray spectrometric methods
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters

British Standards Institution (BSI)

BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision

International Organization for Standardization (ISO)

ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

GSO

BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
GSO ISO 15472:2013 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales

German Institute for Standardization

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles

Association Francaise de Normalisation

NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.

KR-KS

KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale

SCC

BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
DIN 51418-1 E:2007 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
VDI/VDE 5575 BLATT 2-2019 X-ray optical systems - measurement methods; Measurement setup and methods for evaluating x-ray optical systems

Japanese Industrial Standards Committee (JISC)

JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

RU-GOST R

GOST 22091.8-1984 X-ray devices. Method of measuring spectral structure and relative spectrum contamination
GOST 14828-1969 Instruments for physical-chemical quantities measurement. Radiospectrometers. Terms
GOST 22091.6-1984 X-ray devices. Methods of measuring X-radiation exposure dose power and X-radiation exposure dose per pulse
GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation

IN-BIS

IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers
IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer

Standard Association of Australia （SAA）

AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales

VN-TCVN

TCVN 6704-2008 Gasoline.Determination of lead by X-Ray spectroscopy

VDI - Verein Deutscher Ingenieure

VDI/VDE 5575 Blatt 2-2013 X-ray optical systems - Measurement methods - Measurement set-up and methods for the evaluation of X-ray optical systems

Others: