SY/T 7420-2018 in English
VALIDSpecifications for logging by X-ray fluorescence spectrum elements
- Issued on:2018-10-29
- Implemented on:2019-03-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
Price(USD):
$180.00
$175.00
$175.00
Introduction
This standard provides specifications for the application of X-ray fluorescence spectroscopy in elemental logging. It outlines the procedures for sample preparation, instrument calibration, data acquisition, and analysis. The document defines the technical requirements for equipment, operational conditions, and quality control measures. It also includes guidelines for the interpretation of results and the documentation of the logging process. The standard aims to ensure consistency and reliability in elemental analysis during geological surveys. It covers the principles of X-ray fluorescence spectroscopy and its integration into logging operations. The content is structured to support both technical implementation and regulatory compliance.
*** Please note: This description may not be accurate, please refer to the official documentation.
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