Electron bulk

Electron bulk, Total:82 items.

The international standard classification for "Electron bulk" includes: Physicochemical methods of analysis , Other methods of testing of metals , Other standards related to protection against fire , Chemical analysis .

The Chinese standard classification for "Electron bulk" includes: Basic standards and general methods , Metallographic testing method , Fire-fighting in general .

National Metrological Verification Regulations of the People's Republic of China

JJG(电子) 12021-1989 1481 type TV waveform monitor verification regulations
JJG(电子) 12032-1989 Verification Regulations for 148 Type TV Insertion Test Signal Generator
JJG(电子) 310006-2006 Specification for verification of noise detectors for particle collision of devices
JJG(电子) 02011-1995 Verification Regulations of HP8405A Vector Voltmeter
JJG(电子) 05013-1988 AV2551 type potentiometer dynamic contact resistance change measuring instrument trial verification regulations
JJG(电子) 05009-1988 TS-109 Type Electrolytic Capacitor Semi-automatic Sorting Apparatus Trial Verification Regulations
JJG(电子) 04026-1989 BJ2985 type crystal triode maintenance voltage tester verification regulations
JJG(电子) 11005-1988 18.6MHz and above frequency band electronic oscillator trial verification regulations
JJG(电子) 30902-2006 Specification for verification of absolute spectral response rate of photodetectors
JJG(电子) 05011-1988 Trial Verification Regulations for WZC-1A Potentiometer Comprehensive Tester
JJG(电子) 31001-2006 Specification for verification of testing system for integrated circuits' electrostatic discharge susceptibility
JJG(电子) 05005-1987 B-102 Tantalum Electrolytic Capacitor Leakage Current Tester Trial Verification Regulations
JJG(电子) 02009-1995 Verification Regulations for Analog Electronic Voltmeter
JJG(电子) 02006-1988 262 Type Low Thermal EMF DC Voltage Divider Trial Verification Regulations
JJG(电子) 306003-2006 Specification for verification of leakage current testers
JJG(电子) 08001-1989 Verification Regulations for DB-1 Electric Field Standard Device
JJG(电子) 18004-1989 HP4140B Picoampere Ammeter/DC Voltage Source Verification Regulations
JJG(电子) 18007-1991 Verification Regulations for Resistance Vacuum Gauge
JJG(电子) 05002-1987 GY2610 Leakage Current Tester Trial Verification Regulations
JJG(电子) 12033-1989 Verification Regulations for TV Video Level Standard Device
JJG(电子) 05003-1987 CO-2 Type Precision Inductance Bridge Trial Verification Regulations
JJG(电子) 12020-1989 Verification Regulations for TV Video Level Meter
JJG(电子) 05037-1991 HY2501 Precision Resistance Bridge Verification Regulations
JJG(电子) 05038-1991 Calibration Regulations for Type 715 Potentiometer Linear Oscilloscope
JJG(电子) 12022-1989 VS13 type black and white TV electronic test card generator verification regulations

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
GB/T 30703-2014 Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
GB/T 19501-2004 General guide for electron backscatter diffraction analysis
GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
GB/T 36165-2018 Determination of average grain size of metal—Electron backscatter diffraction (EBSD)method

National Metrological Technical Specifications of the People's Republic of China

JJF(电子) 18-1982 Calibration method of CO-3 small inductance bridge
JJF(电子) 30801-2006 Calibration Specifications for Electrostatic Discharge Generators
JJF(电子) 01-1982 Verification method of general electronic counter
JJF(电子) 17-1982 Calibration method of LCD-1 large inductance measuring instrument
JJF(电子) 04-1982 Verification method of DT-1 vector voltmeter
JJF(电子) 16-1982 Calibration Method of CO-2 Precision Inductance Bridge
JJF(电子) 19-1982 Verification method of GS-5A electronic tube tester
JJF(电子) 30802-2006 Specification for calibration of generators of voltage sag, short interruption and voltage change

工业和信息化部

YB/T 4677-2018 Precision seamless steel tubes for motorcycle shock absorber

Shanghai Provincial Standard of the People's Republic of China

DB31/T 1156-2019 The identification of electrical fire melted mark—Electronic back scattering diffraction method

Professional Standard - Non-ferrous Metal

YS/T 1652-2023 Texture testing of zirconium and zirconium alloy— Electron backscatter diffraction method

未注明发布机构

DIN ISO 13067 E:2021-01 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34172-2017 Microbeam analysis--Electron backscatter diffraction--Phase analysis method of metal and alloy

Group Standards of the People's Republic of China

T/CSTM 00922-2024 Determination of grain orientation of electrical steel strip ( sheet )for power transformer—Electron backscatter diffraction (EBSD) method

International Organization for Standardization (ISO)

ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

SAE - SAE International

SAE AIR728A-1963 ELECTRONIC EQUIP. COOLING DESIGN CONCEPTS

Defense Logistics Agency

DLA DESC-DWG-85136 REV D-1993 HEAT SINKS, ELECTRICAL-ELECTRONIC COMPONENT, FIN STOCK, ALUMINUM ALLOY
DLA MIL-DTL-24251/3 D-2013 SHIELD, ELECTRON TUBE, HEAT DISSIPATING 7 AND 9 PIN, MINIATURE (SPLIT SHELL)
DLA MIL-DTL-24251/5 D-2013 SHIELD, ELECTRON TUBE, HEAT DISSIPATING, 7 AND 9 PIN, MINIATURE (OPEN SIDES)
DLA MIL-DTL-24251 F-2013 SHIELDS, RETAINERS (BASES), AND ADAPTERS, ELECTRON TUBE, HEAT DISSIPATING
DLA MIL-DTL-24251/6 E-2013 SHIELD, ELECTRON TUBE, HEAT DISSIPATING, 7 AND 9 PIN, MINIATURE (RETROFIT TYPE ONLY)
DLA MIL-DTL-24251/4 D-2013 RETAINER (BASE), AND ADAPTER, ELECTRON TUBE, HEAT DISSIPATING, 7 AND 9 PIN, MINIATURE

SCC

MIL MIL-DTL-24251/5D-2013 Shield, Electron Tube, Heat Dissipating, 7 and 9 Pin, Miniature (Open Sides)
MIL MIL-DTL-24251F-2013 Shields, Retainers (Bases), and Adapters, Electron Tube, Heat Dissipating
MIL MIL-DTL-24251/5C-2008 Shield, Electron Tube, Heat Dissipating, 7 and 9 Pin, Miniature (Open Sides)
MIL MIL-DTL-24251/6E-2013 Shield, Electron Tube, Heat Dissipating, 7 and 9 Pin, Miniature (Retrofit Type Only)
MIL MIL-DTL-24251/6D-2008 Shield, Electron Tube, Heat Dissipating, 7 and 9 Pin, Miniature (Retrofit Type Only)
MIL MIL-DTL-24251/3D-2013 Shield, Electron Tube, Heat Dissipating 7 and 9 Pin, Miniature (Split Shell)
MIL MIL-DTL-24251/3C-2008 Shield, Electron Tube, Heat Dissipating 7 and 9 Pin, Miniature (Split Shell)
MIL MIL-DTL-24251/4D-2013 Retainer (Base), and Adapter, Electron Tube, Heat Dissipating, 7 and 9 Pin, Miniature
MIL MIL-DTL-24251/4C-2008 Retainer (Base), and Adapter, Electron Tube, Heat Dissipating, 7 and 9 Pin, Miniature
MIL MIL-DTL-24251C-2003 SHIELDS, RETAINERS (BASES), AND ADAPTERS, ELECTRON TUBE, HEAT DISSIPATING (SUPERSEDING MIL-S-24251B)
MIL MIL-DTL-24251/6C-2003 SHIELD, ELECTRON TUBE, HEAT DISSIPATING, 7 AND 9 PIN, MINIATURE (RETROFIT TYPE ONLY) (SUPERSEDING MIL-S-24251/6B)
10/30195133 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

Association Francaise de Normalisation

NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

German Institute for Standardization

DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)

GSO

GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
GSO ISO 24173:2015 Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
OS GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size

British Standards Institution (BSI)

BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS ISO 24173:2024 Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

Society of Automotive Engineers (SAE)

SAE AIR728-1963 ELECTRONIC EQUIPMENT COOLING DESIGN CONCEPTS FOR HIGH MACH NUMBER AIRCRAFT

United States Navy

NAVY MIL-STD-2218-1992 THERMAL DESIGN, ANALYSIS, AND TEST PROCEDURES FOR AIRBORNE ELECTRONIC EQUIPMENT