Electronic nose analysis method?
Electronic nose analysis method?, Total:337 items.
The international standard classification for "Electronic nose analysis method?" includes: Physicochemical methods of analysis , Optical measuring instruments , Other standards related to analytical chemistry , Optical equipment , Test conditions and procedures in general , Other standards related to optics and optical measurements , Cadmium, cobalt and their alloys , Veterinary medicine , Metalliferous minerals , Nickel, chromium and their alloys , Magnesium and magnesium alloys , Non-metalliferous minerals , Aluminium and aluminium alloys , Other non-ferrous metals and their alloys , Gases for industrial application , Copper and copper alloys , Lead, zinc, tin and their alloys , Chemical analysis of metals , Testing of metals , Metallic coatings , Aluminium , Chemical analysis , Farming and forestry in general , Refractories , Education , Semiconductor devices , Chemical reagents , Farming and forestry , Other metalliferous minerals , Cement. Gypsum. Lime. Mortar , Production of metals .
The Chinese standard classification for "Electronic nose analysis method?" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Heavy metals and their alloys analysis method , Animal quarantine, veterinary and epidemic prevention , Iron ore , Heavy metal ore , Light metals and their alloys analysis method , Oil shale , Building material raw material ore , Heavy metals and their alloys , Rare refractory metals and their compounds , Precious metals and its alloy analysis method , Industrial gas and chemical gas , Rare scattered metals and their alloys , Semimetal and semiconductor material analysis method , Technical Management , Fireproof material in general , Light metal ore , Special instruments for teaching , chromatograph , Semiconductor discrete devices in general , Chemical reagent in general , Forestry chemical raw material , Cement .
Professional Standard - Energy
- NB/SH/T 6009-2020 Test method for odor of petroleum wax by electronic nose
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB 10267.1-1988 Analytical method for calcium metal Determination of chlorine by chloride ion selective electrode method
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
- GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
- GB/T 17360-2008 Quantitative analysis method of low content Si and Mn in steel with electron probe microanalysis
- GB/T 6987.27-2001 Aluminium and aluminium alloys-Determination of copper content-Ion selective electrode method
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 43749-2024 Microbeam analysis—Electron probe microanalysis—Quantitative analysis of anhydrous carbonate minerals
- GB/T 43361-2023 Gas analysis—Analytical methods validation for hydrogen fuel in proton exchange membrane(PEM) fuel cell applications for road vehicles
- GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis
- GB/T 17506-1998 The method of electron probe microanalysis as corrosive layer on ferrous metals of ship
- GB/T 17363.1-2009 Nondestructive mensuration of gold content in the gold products - Part 1: Method of electron probe microanalysis
- GB/T 15074-1994 General guide for EPMA quantitative analysis
- GB/T 8220.12-1998 Methods for chemical analysis of bismuth--Determination of nickel content--Electrothermal atomic absorption spectrometric method
- GB/T 8647.2-2006 The methods for chemical analysis of nickel - Determination of aluminium content - Electrothermal atomic absorption spectrometric method
- GB/T 8220.13-1998 Methods for chemical analysis of bismuth--Determination of silver and cadmium content--Electrothermal atomic absorption spectrometric method
- GB/T 43883-2024 Microbeam analysis—Analytical electron microscopy—Method for determining the number density of nanoparticles in a metal
- GB/T 13748.21-2009 Chemical analysis methods of magnesium and magnesium alloys - Part 21 : Determination of elements by photoelectric direct reading atomic emission spectrometry
- GB/T 21638-2008 Guide for electron beam microananlysis of defect in steel materials
- GB/T 4324.22-2012 Methods for chemical analysis of tungsten - Part 22: Determination of manganese content - Inductively coupled plasma atomic emission spectrometry
- GB/T 3256.5-1982 Chemical analysis of zirconium powder for electro-vacuum uses;The atomic absorption spectrophotometric method for determination of calcium and magnesium
- GB/T 23273.6-2009 Methods for chemical analysis of cobalt oxalate - Part 6: Determination of chlorine ion content - Ion selective electrode method
- GB/T 43610-2023 Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
- GB/T 3884.5-2012 Methods for chemical analysis of copper concentrates - Part 5: Determination of fluoride content - Ion selective electrode method
- GB/T 19501-2004 General guide for electron backscatter diffraction analysis
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 10267.1-1988 Method for analysis of calcium metal. The determination of chlorine content by chloride. Selective electrode
- GB/T 13748.21-2009(英文版) Chemical analysis methods for magnesium and magnesium alloys Part 21: Determination of element content by photoelectric direct reading atomic emission spectrometry
- GB/T 11067.4-2006 Methods for chemical analysis of silver - Determination of antimony content - The inductively coupled plasma atomic emission spectrometric method
- GB/T 43088-2023 Microbeam analysis—Analytical electron microscopy—Measurement of the dislocation density in thin metals
- GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- GB/T 5121.27-2008 Methods for chemical analysis of copper and copper alloys - Part 27:The inductively coupled plasma atomic emission spectromertric method
- GB/T 8220.6-1998 Methods for chemical analysis of bismuth--Determination of lead content--Electrothermal atomic absorption spectrometric method
- GB/T 4324.21-2012 Methods for chemical analysis of tungsten - Part 21: Determination of chromium content - Inductively coupled plasma atomic emission spectrometry
- GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
- GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
- GB/T 1819.15-2006 Methods for chemical analysis of tin concentrates―Determination of fluorine content―The ion-selective electrode method
- GB/T 4325.12-2013 Methods for chemical analysis of molybdenum—Part 12:Determination of silicon content—Inductively coupled plasma atomic emission spectrometry
- GB/T 14506.12-1993 Sillicate rocks. Determination of fluorine content. Ion selective electrode method
- GB/T 27621-2011 Protocol of PCR for equine rhinopneumonitis virus
- GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)
- GB/T 3260.7-2013 Methods for Chemical Analysis of Tin - Part 7: Determination of Aluminium Content - Electrothermal Atomic Absorption Spectrometric Method
- GB/T 15075-1994 Method for testing EPMA instrument
- GB/T 6730.28-1986 Methods for chemical analysis of iron ores; The ion-selective electrode method for the determination of fluorine content
- GB/T 43087-2023 Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials
- GB/T 23513.4-2009 Chemical analysis methods for germanium concentrate—Part 4:Determination of fluoride content—ISE
- GB/T 15074-2008 General guide of quantitative analysis by EPMA
- GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis
- GB/T 8151.9-2012 Methods for chemical analysis of zinc concentrates—Part 9:Determination of fluorine content—The ion selective electrode method
- GB/T 32277-2015 Test method for instrumental neutron activation analysis (INAA) of silicon
- GB/T 4324.7-2012 Methods for chemical analysis of tungsten - Part 7: Determination of cobalt content - Inductively coupled plasma atomic emission spectrometry
- GB/T 30703-2014 Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
- GB/T 4324.20-2012 Methods for chemical analysis of tungsten - Part 20: Determination of vanadium content - Inductively coupled plasma atomic emission spectrometry
- GB/T 17506-2008 The analysis method of corrosive layer on ferrous metals of ship with EPMA
- GB/T 15616-1995 Qantitative method for electron probe microanalysis of metals and alloys
- GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis
- GB/T 17360-1998 Method of quantitative electron probe microanalysis on low contents of Si and Mn in steels
- GB/T 11067.3-2006 Methods for chemical analysis of silver - Determination of selenium and tellurium content - Inductively coupled plasma atomic emission spectrometric method
- GB/T 4324.11-2012 Methods for chemical analysis of tungsten - Part 11: Determination of aluminum content - Inductively coupled plasma atomic emission spectrometry
- GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis
- GB/T 8151.9-1987 Methods for chemical analysis of zinc concentrates--The ion selective electrode method for the determination of fluorine content
- GB/T 32055-2015 Microbeam analysis―Electron probe microanalysis―Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
- GB/T 28634-2012 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
- GB/T 20975.25-2008 Methods for chemical analysis of aluminium and aluminium alloys - Part 25:Inductively coupled plasma atomic emission spectrometric method
- GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
- GB/T 4324.13-2008 Methods for chemical analysis of tungsten - Determination of calcium content - The inductively coupled plasma atomic emission spectrometry
- GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
Professional Standard - Aviation
- HB 5219.5-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Iron Content with Atomical Absorption Spectrometry Method
- HB 20090-2012 Functional reliability simulation analysis method for avionics products
- HB 5219.13-1998 Methods for Chemical Analysis Ofmagnesium Alloy - Determination of Zinc Content Through Atomical Absorption Spectrometry
- HB/Z 5088.6-1999 Analysis Method for Electronickelling Solution - Determination of Copper Content with Atomic Absorption Spectrometry Method
- HB/Z 5091-1978 Analytical method of chrome plating solution
- HB/Z 5091.6-1999 Analysis Method for Chrome Plating Solution Determination of Copper Content Through Atomic Absorption Spectrometry
- HB/Z 5088-1978 Analytical method of electroplating nickel solution
- HB 20091-2012 Stress damage analysis method for avionics products
- HB 5219.8-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Manganese Content with Atomical Absorption Spectrometry Method
- HB/Z 5218.25-2004 Methods for chemical analysis of aluminium alloys-Part 25:Determination of boron content by ion selective electrode method
- HB/Z 5098-1978 Analysis method of electroplating indium solution
- HB 5219.11-1998 Methods for Chemical Analysis of Magnesium Alloy- Determination of Nickel Content Through Atomical Absorption Spectrometry
- HB 5219.20-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Silver Content with Atomical Absorption Spectrometry Method
- HB 5219.3-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Copper Content with Atomical Absorption Spectrometry Method
- HB 20089-2012 Stress analysis methods for avionics products
- HB/Z 5091.5-1999 Analysis Method for Chrome Plating Solution Determination of Ferrous Content Through Atomic Absorption Spectrometry
- HB/Z 5103-1978 Analysis method of electroplating rhodium solution
- HB 8422-2014 Quantitative detection method of EPMA for trace elements in alloys
- HB/Z 5088.5-1999 Analysis Method for Nickel Plating Solution Determination of Ferrous Content Through Atomic Absorption Spectrometry
- HB/Z 5102-1978 Analysis method of electroplating palladium solution
Professional Standard - Electron
- SJ/T 11027-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of magnesium (spectrophotometric-atomic absorption method)
- SJ/T 11032-1996 Methods of analysis for gold-copper and gold-nickel brazing for electronic devices-Determination of zinc (spectrophotometric atomic absorption method)
- SJ/T 11016-1996 Methods of analysis for pure silver brazing for electronic devices - Determination of bismuth (spectrophotometric strychnine-potasssium iodide method)
- SJ/T 11028-2015 Analytical methods for gold copper brazing for electron device Determination of copper by EDTA volumetry
- SJ/T 11012-1996 Method of analysis for pure silver brazing for electronic devices - Determination of magnesium and zinc (spectrophotometric-atomic absorption method)
- SJ/T 10553-2021 Method of emission specthchemical analysis of impurities in ZrO2 for use in electron ceramics
- SJ/T 10893-1996 General rules for chemical analysis of electronic glass
- SJ/T 11025-1996 Analytical methods for silver copper brazing for electron device Determination of lead by atomic absorption spectrophotometry
- SJ/T 10552-2021 Method of emission specthchemical analysis of impurities in TiO2 for use in electron ceramics
- SJ/T 11018-2016 Analytical methods for pure silver brazing for electron device Determination of sulphur by combustion-iodimetry
- SJ/T 11028-1996 Methods of analysis for gold-copper brazing for electronic devices - Determination of copper (Volumetric - EDTA method)
- SJ/T 11029-1996 Methods of analysis for gold-nickel brazing for electronic devices - Determination of nickel (Volumetric - EDTA method)
- SJ/T 11029-2015 Analytical methods for gold nickel brazing for electron device Determination of nickel by EDTA volumetry
- SJ/T 10904-1996 Determination of fluorine in electronic glass - Specific ion electrode methods
- SJ 3239-1989 General requirement for gas chromatography analysis method
- SJ/T 11017-1996 Methods of analysis for pure silver drazing fro electronic devices - Determination of phosphorus (spectrophotometric phosphomolybdate method)
- SJ/T 11026-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of iron, cadmium and zinc (spectrophotometric-atomic absorption method)
- SJ/T 11018-1996 Methods of analysis for pure silver brazing for electronic devices-Determination of sulfur (iodimetric combustion method)
- SJ/T 11023-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of bismuth (spectrophotometric-atomic absorption method)
- SJ/T 11024-1996 Methods of analysis for silver-copper brazing for electronic devices-Determination of antimony (spectrophotometric-atomic absorption method)
- SJ/T 10922-1996 Potassium silicate solution for use in electronic industry - General rules of analysis
- SJ/T 11020-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of copper (iodimetric method)
- SJ/T 11013-1996 Methods of analysis for pure silver brazing for electronic devices - Determination of cadmium (spectrophotometric-atomic absorption method)
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34500.1-2017 Chemical analysis methods for rare earth residue and waste water - Part 1: Determination of fluorine content - Ion selective electrode analysis
- GB/T 34333-2017 Refractory products--Determination by inductively coupled plasma atomic emission spectrometry(ICP-AES)
- GB/T 33037-2016 Detection and identification of Caulophilus oryzae(Gyllenhal)
- GB/T 34172-2017 Microbeam analysis--Electron backscatter diffraction--Phase analysis method of metal and alloy
- GB/T 1819.15-2017 Methods for chemical analysis of tin concentrates - Part 15: Determination of fluorine content - The ion-selective electrode method
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
- GB/T 33838-2017 Microbeam analysis―Scanning electron microscopy―Methods of evaluating image sharpness
Professional Standard - Education
- JY/T 0581-2020 General analysis rules for transmission electron microscope
- JY/T 0579-2020 General rules of analytical methods for eleetron paramagnetic resonance spectroscopy
- JY/T 0567-2020 General rules for inductively coupled plasma optical emission spectrometry
- JY/T 020-1996 General rules for ion chromatograpy
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
- JY/T 0566-2020 General rules for atomic fluorescence spectrometry
- JY/T 0565-2020 General rules for electrothermal atomic absorption spectrometry
- JY/T 0583-2020 General analytical rules for the focused ion beam system
- JY/T 0575-2020 General rules of analytical methods for ion chromatography
- JY/T 010-1996 General rules for analytical scanning electron microscopy
- JY/T 0568-2020 General rules for inductively coupled plasma-mass spectrometry
Yunnan Provincial Standard of the People's Republic of China
- DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method
Professional Standard - Petroleum
- SY/T 6027-2012 Quantitative Analysis Method of Rock and Mineral by Electron Probe Microanalysis
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
- SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals
国家能源局
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
- SY/T 6027-2019 Quantitative analysis of rocks and minerals by electron probe microanalysis
Group Standards of the People's Republic of China
- T/HNNMIA 47-2023 Chemical analysis methods for ammonium molybdate - Determination of fluorine content - Ion selective electrode method
- T/CBMF 100-2021 Methods for chemical analysis of gypsum and gypsum products—Inductively coupled plasma atomic emission spectrometry method
- T/CBMF 101-2021 Methods for chemical analysis of carbonate rocks—Inductively coupled plasma atomic emission spectrometry method
- T/CIE 116-2021 Fault tree analysis method and procedure of electronic components
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
- GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
- GB/T 39486-2020 Chemical reagent—General rules for inductively coupled plasma mass spectrometry
- GB/T 17360-2020 Microbeam analysis- Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer
Professional Standard - Forestry
- LY/T 1644-2005 Test method for analysis of gallic acid
Military Standard of the People's Republic of China-General Armament Department
- GJB 4027A-2006 Methods of destructive physical analysis for military electronic components
- GJB 4027-2000 Destructive physical analysis method of military electronic components
未注明发布机构
- GJB 8897-2017 Failure analysis requirements and methods for military electronic components
- GJB 4027B-2021 Destructive physical analysis method of military electronic components
- ASTM RR-D01-1061 1989 D4940-Method for Conductimetric Analysis of Water Soluble IonicContamination of Blasing Abrasives
- ASTM RR-E01-1110 2009 E2594-Standard Test Method for Analysis of Nickel Alloys by Inductively Coupled Plasma Atomic Emission Spectrometry
- ASTM RR-E01-1126 2017 E3061-Test Method for Analysis of Aluminum and Aluminum Alloys by Inductively Coupled Plasma Atomic Emission Spectrometry (Performance Based Method)
Professional Standard - Non-ferrous Metal
- YS/T 1593.3-2023 Methods for chemical analysis of crude lithium carbonate—Part 3:Determination of fluoride ion content—Ion selective electrode method
- YS/T 536.13-2006 Methods for chemical analysis of bismuth. Determination of silver and cadmium content. Electrothermal atomic absorption spectrometric method
- YS/T 536.12-2009 Methods for chemical analysis of bismuth - Determination of nickel content - Electrothermal atomic absorption spectrometric method
- YS/T 536.2-2009 Methods for chemical analysis of bismuth - Determination of iron content - Electrothermal atomic absorption spectrometric method
- YS/T 536.6-2009 Methods for chemical analysis of bismuth—Determination of lead content—Electrothermal atomic absorption spectrometric method
- YS/T 536.12-2006 Bismuth Chemical Analysis Method Electrothermal Atomic Absorption Spectrometry Determination of Nickel Content
- YS/T 74.3-2010 Methods for chemical analysis of cadmium—Part 3:Determination of nickel content—Electrothermal atomic absorption spectrometric method
- YS/T 990.5-2014 Methods for chemical analysis of copper matte―Part 5:Determination of fluorine content―Ion-selective electrode method
- YS/T 586-2006 Method for chemical analysis of copper and copper alloys - The inductively coupled plasma atomic emission spectrometric method
- YS/T 276.5-2011 Methods for chemical analysis of indiumPart 5: Determination of iron content-Method 1: Graphite furnace atomic absorption spectrometryMethod 2: Flame atomic absorption spectrometry
- YS/T 574.5-2006 Chemical analysis of zirconium powder for electro-vacuum uses The atomic absorption spectrophotometric method for determination of calcium and magnesium
- YS/T 1072-2015 Chemical analysis methods of palladium-carbon―Determination of palladium contents―Inductively coupled plasma-atomic emission spectrometry
- YS/T 254.5-1994 Methods for chemical analysis of beryllium concentrates-beryl The ion selective electrode method for the determination of fluorine content
- YS/T 536.13-2009 Methods for chemical analysis of bismuth - Determination of cadmium content - Electrothermal atomic absorption spectrometric method
- YS/T 536.6-2006 Bismuth Chemical Analysis Method Electrothermal Atomic Absorption Spectrometry Determination of Lead
工业和信息化部
- YS/T 1057.2-2020 Methods for chemical analysis of cobaltosix oxide-Part 2 : Determination of chloride content-Ion selective electrode method
- YS/T 1531-2022 Method for chemical analysis of rhodium carbon—Determination of rhodium content—Inductively coupled plasma atomic emission spectrometry
- HG/T 5530-2019 Analyticalmethod ofchemicalcomposition for silicate molecular sieve based catalysts
- SJ/T 3328.2-2016 High purity quartz sand for electronic products Part 2 General rules for analytical methods
- YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method
- YS/T 1179.1-2017 Chemical analysis methods of aluminum slag-Part 1:Determination of fluorine in aluminum slag-Ion selective electrode method
- YS/T 482-2022 Methods for analysis of copper and copper alloys-The spark discharge atomic emission spectrometry
- SJ/T 11698-2018 Lead-free solder chemical analysis method Inductively coupled plasma atomic emission spectrometry
- YS/T 1569.5-2022 Methods for chemical analysis of lithium nickel manganese oxide-Part 5:Determination of chloride content-lon selective electrode method
Professional Standard - Chemical Industry
- HG/T 2954~2955-2008 Standard writing format for atomic absorption spectroscopic analysis method Standard writing format for molecular absorption spectroscopic analysis method
中华人民共和国工业和信息化部
- SJ/T 3228.2-2016 High purity arenaaceous quartz for used in electronics part 2: General Specification for testing methods
Taiwan Provincial Standard of the People's Republic of China
- CNS 12903-1991 General Rules for Chemical Analysis of Nickel Materials for Electron Tubes
Professional Standard - Building Materials
- JC/T 1073-2008 Methods for chemical analysis of chloride for cenment
Professional Standard - Commodity Inspection
- SN/T 2083-2008 Method for analysis of brass - Spark discharge atomic emission spectrometric
Professional Standard - Geology
- DZ/T 0064.54-2021 Methods for analysis of groundwater quality- Part 54: Determination of fluoride- Ion-selective electrode method
Professional Standard - Ferrous Metallurgy
- YB/T 190.10-2001 Methods for chemical analysis of continuous casting mold powder—The ion-selective electrode method for the determination of fluorine content
Professional Standard - Aerospace
- QJ/Z 176-1986 Analysis Method for Decorative Chromium Electroplate Liquid
CN-STDBOOK
- 图书 a-4565 Practical Methods for Electron Microanalysis
Association Francaise de Normalisation
- NF U47-017:2010 Animal health analysis methods - Detection of antibodies against equine Rhinopneumonia by the Complement Fixation Test
- FD ISO/TR 17623:2015 Molecular analysis of biomarkers - SSR analysis method on corn
- NF U47-030:2002 Animal health analysis methods - Detection of antibodies against bovine infectious rhinotracheitis by the virus neutralisation method.
- NF U47-030:2010 Animal health analysis methods - Search for antibodies against infectious bovine rhinotracheitis using the viral neutralization technique
- FD ISO/TR 17622:2015 Molecular analysis of biomarkers - SSR analysis method on sunflower
- NF ISO 11938:2012 Microbeam analysis - Electron microprobe analysis (Castaing microprobe) - Elemental mapping analysis methods using wavelength dispersive spectrometry
- NF U47-700:2019 Analysis methods in Animal Health - System for exchanging dematerialized data in analysis laboratories - ELabs Animal Health
- NF X21-013*NF ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy.
- NF X21-068*NF ISO 29081:2010 Surface chemical analysis - Auger electron spectroscopy - Reporting of methods used for charge control and charge correction
- NF X20-107*NF ISO 21087:2019 Gas analysis - Analytical methods for hydrogen fuel - Proton exchange membrane (PEM) fuel cell applications for road vehicles
- NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
RU-GOST R
- GOST R 52951-2008 Palladium. Methods of arc atomic-emission analysis
- GOST R 54313-2018 Palladium. Method of inductively coupled plasma atomic-emission analysis
- GOST R 54313-2011 Palladium. Method of inductively coupled plasma atomic-emission analysis
- GOST 33730-2016 Platinum. Method of inductively coupled plasma atomic-emission analysis
- GOST R 56306-2014 Silver. Method of inductively coupled plasma atomic-emission analysis
- GOST R 55079-2012 Steel. Method of inductively coupled plasma atomic-emission analysis
- GOST R 56308-2014 Silver. Method of atomic-absorption analysis
- GOST R 56142-2014 Silver. Method of ark atomic-emission analysis
- GOST 33728-2016 Platinum. Methods of ark atomic-emission analysis
- GOST 9816.5-2014 Tellurium technical. Method of atomic-absorptive analysis
- GOST R 52520-2006 Platinum. Methods of arc atomic-emission analysis
- GOST R 56307-2014 Silver. Method of spark atomic-emission analysis
- GOST 33731-2016 Platinum. Method of spark atomic-emission analysis
- GOST 27981.1-2015 High purity copper. Method of atomic-spectral analysis
- GOST R 54335-2011 Palladium. Method of spark atomic-emission analysis
- GOST 27981.2-2015 High purity copper. Method of chemical-atomic-emission analysis
- GOST R 52519-2006 Platinum. Method of inductively coupled plasma atomic-emission analysis
British Standards Institution (BSI)
- BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
- BS 3727-20:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Spectrographic method
- BS 3727-12:1970 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of sulphur (combustion method)
- 20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
- BS ISO 19430:2016 Particle size analysis. Particle tracking analysis (PTA) method
- BS 6337-4:1984 General methods of chemical analysis. Method for determination of chloride ions by potentiometry
- BS 3727-21:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of magnesium (atomic absorption method)
- BS 3727-3:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of carbon
- BS 3727-14:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of tungsten (gravimetric method)
- BS 3727-22:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of zinc (atomic absorption method)
- BS 3727-2:1968 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of boron (photometric method)
- BS 3727-8:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of manganese (photometric method)
- BS 3727-6:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of copper (photometric method)
- BS 3727-5:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of cobalt (photometric method)
- BS 3727-15:1968 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of zinc (photometric method)
- BS 3727-4:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of chromium (photometric method)
- BS 3727-13:1965 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of titanium (photometric method)
- BS 3727-1:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of aluminium (photometric method)
- 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- BS 3727-7:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of iron (photometric method)
- BS 3727-9:1967 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of magnesium (photometric method)
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- BS 7020-19:1988 Analysis of iron ores. Method for the determination of fluorine content. Ion-selective electrode method
- BS 3727-10:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of silicon 0.020-0.25 per cent (photometric method)
- BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- BS 7020-19:1989 Analysis of iron ores. Method for the determination of fluorine content. Ion-selective electrode method
- BS 3727-11:1965 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of silicon 0.001-0.020 per cent (photometric method)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 16531:2020 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- 19/30399949 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- BS 3727-16:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of combined and free magnesium
- BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS EN ISO 26845:2008(2009) Chemical analysis of refractories — General requirements for wet chemical analysis, atomic absorption spectrometry (AAS) and inductively coupled plasma atomic emission spectrometry (ICP - AES) methods
- BS ISO 13322-2:2021 Particle size analysis. Image analysis methods. Dynamic image analysis methods
International Organization for Standardization (ISO)
- ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
- ISO 19430:2016 Particle size analysis - Particle tracking analysis (PTA) method
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
- ISO 21087:2019 Gas analysis — Analytical methods for hydrogen fuel — Proton exchange membrane (PEM) fuel cell applications for road vehicles
- ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- ISO 16577:2022 Molecular biomarker analysis — Vocabulary for molecular biomarker analytical methods in agriculture and food production
- ISO 16531:2020 Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
- ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
SCC
- DANSK DS/ISO 19430:2016 Particle size analysis – Particle tracking analysis (PTA) method
- 10/30185165 DC BS ISO 11938. Microbeam analysis. Electron probe microanalysis. Methods of elemental area analysis using wavelength-dispersive spectroscopy
- DANSK DS/IEC/TR 62725:2013 Analysis of quantification methodologies of greenhouse gas emissions for electrical and electronic products and systems
- ANS 19.3-2011(R2017) Steady-state Neutronics Methods for Power Reactor Analysis
- BS 6438-3:1986 Electrochemical analyzers-Method for specifying performance of electrolytic conductivity analyzers
- DANSK DS/ISO 13322-1:2014 Particle size analysis - Image analysis methods - Static image analysis methods
- DANSK DS/EN ISO 26845:2008 Chemical analysis of refractories - General requirements for wet chemical analysis, atomic absorption spectrometry (AAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES) methods
GOST
- GOST 28353.1-1989 Silver. Method of atomic-emission analysis
- GOST R ISO 21087-2023 Gas analysis. Hydrogen fuel analytical methods for proton exchange membrane fuel cell
- GOST 6012-1998 Nickel. Methods of chemical-atomic-emission spectral analysis
VE-FONDONORMA
- NORVEN 44-1-1960 Analysis method of sesame seeds
GOSTR
- GOST 28353.1-2017 Silver. Method of ark atomic-emission analysis
- GOST 34418-2018 Palladium. Methods of atomic-emission analysis with arc excitement of a range
Korean Agency for Technology and Standards (KATS)
- KS D 2518-2005 Methods for photoelectric emission spectrochemical analysis of cadmium metal
- KS D 1652-2007(2017) Iron and steel-Method for spark discharge atomic emission spectrometric analysis
- KS D 1652-2022 Iron and steel — Method for spark discharge atomic emission spectrometric analysis
- KS D 2518-1982 Methods for photoelectric emission spectrochemical analysis of cadmium metal
- KS E 3702-1982(2002) METHODS FOR SAMPLING AND DETERMINATION OF TOTAL MOISTURE AND ADHERENT MOISTURE OF COAL AND COKE
- KS E 3702-1982 METHODS FOR SAMPLING AND DETERMINATION OF TOTAL MOISTURE AND ADHERENT MOISTURE OF COAL AND COKE
- KS D 2553-2015(2020) Tantalum-Method for atomic absorption spectrometric analysis
- KS D 2553-2020 Tantalum-Method for atomic absorption spectrometric analysis
- KS D 2568-2019 Tantalum-Method for atomic absorption spectrometric analysis
- KS M 0036-2008 General rules for ion-selective electrode method
- KS D 1852-2005 Methods for photoelectric emission spectrochemical analysis of aluminium and aluminium alloys
- KS D 2086-2019 Methods for atomic emission spectrometric analysis of titanium
- KS C IEC/TR 62725:2017 Analysis of quantification methodologies of greenhouse gas emissions for electrical and electronic products and systems
- KS D 1659-2019 Methods for atomic absorption spectrophotometric analysis of iron and steel
- KS D 1684-2023 Magnesium and magnesium alloys — Method for spark discharge atomic emission spectrometric analysis
- KS C IEC/TR 62725-2022 Analysis of quantification methodologies of greenhouse gas emissions for electrical and electronic products and systems
- KS D 1659-1993 Methods for atomic absorption spectrophotometric analysis of iron and steel
- KS D 1659-2008(2019) Methods for atomic absorption spectrophotometric analysis of iron and steel
- KS C IEC/TR 62725-2017(2022) Analysis of quantification methodologies of greenhouse gas emissions for electrical and electronic products and systems
- KS D 1673-2007(2022) Methods for inductively coupled plasma emission spectrochemical analysis of steel
- KS D ISO 11435-2006(2016) Nickel alloys-Determination of molybdenum-Inductively coupled plasma atomic emission spectrometric method
- KS D ISO 22033-2006(2016) Nickel alloys-Determination of niobium-Inductively coupled plasma atomic emission spectrometric method
KR-KS
- KS D 1652-2007(2017)(英文版) Iron and steel-Method for spark discharge atomic emission spectrometric analysis
- KS C IEC/TR 62725-2017 Analysis of quantification methodologies of greenhouse gas emissions for electrical and electronic products and systems
- KS D ISO TS 18223-2023 Nickel alloys — Determination of Nickel content — Inductively coupled plasma atomic emission spectrometric method
Japanese Industrial Standards Committee (JISC)
- JIS H 1202:1996 Method for chemical analysis of oxygen-free copper products for electron tubes
- JIS H 1683:2002 Tantalum -- Method for atomic absorption spectrometric analysis
- JIS G 1257:1994 Iron and steel -- Methods for atomic absorption spectrometric analysis
- JIS H 1322:2017 Magnesium and magnesium alloys -- Method for spark discharge atomic emission spectrometric analysis
- JIS H 1288:2015 Nickel and nickel alloys -- Methods for spark discharge atomic emission spectrometric analysis
- JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
- JIS H 1113:2014 Method for photoelectric emission spectrochemical analysis of zinc metal
- JIS H 1113:1994 Method for atomic emission spectrophotoelectric analysis of zinc metal
US-ACEI
- IPC TM-650 2.3.28-1995 Ionic Analysis of Circuit Boards Ion Chromatography Method
IPC - Association Connecting Electronics Industries
- IPC TM-650 2.3.28A-2004 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
- IPC TM-650 2.3.28B-2012 Ionic Analysis of Circuit Boards@ Ion Chromatography Method
IN-BIS
- IS 13766-1993 Pliers and nippers for electronics. Single purpose pliers. Snipe nose pliers. Specification
GSO
- GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- OS GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- BH GSO ISO 11938:2017 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- GSO IEC/TR 62725:2017 Analysis of quantification methodologies of greenhouse gas emissions for electrical and electronic products and systems
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
- GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
- GSO ISO 19430:2017 Particle size analysis -- Particle tracking analysis (PTA) method
- OS GSO ISO 19430:2017 Particle size analysis -- Particle tracking analysis (PTA) method
- BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
- BH GSO ISO 26845:2017 Chemical analysis of refractories -- General requirements for wet chemical analysis, atomic absorption spectrometry (AAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES) methods
American Society for Testing and Materials (ASTM)
- ASTM E107-88(1998) Standard Test Methods for Chemical Analysis of Electronic Nickel (Withdrawn 2003)
- ASTM C1379-10 Standard Test Method for Analysis of Urine for Uranium-235 and Uranium-238 Isotopes by Inductively Coupled Plasma-Mass Spectrometry
- ASTM C1022-93 Standard Test Methods for Chemical and Atomic Absorption Analysis of Uranium-Ore Concentrate
Danish Standards Foundation
- DS/IEC/TR 62725:2013 Analysis of quantification methodologies of greenhouse gas emissions for electrical and electronic products and systems
- DS/EN ISO 26845:2008 Chemical analysis of refractories - General requirements for wet chemical analysis, atomic absorption spectrometry (AAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES) methods
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC TM-650 2.3.28-2004 Ionic Analysis of Circuit Boards, Ion Chromatography Method Revision A
German Institute for Standardization
- DIN EN ISO 26845:2008-06 Chemical analysis of refractories - General requirements for wet chemical analysis, atomic absorption spectrometry (AAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES) methods (ISO 26845:2008); German version EN ISO 26845:2008
Microbeam Analysis Analysis Electron Microscopy Transmission Electron Microscopy Selected Area Electron Diffraction Analysis Method,Methods of analysis for silver-copper solders for electronic devices Determination of bismuth by atomic absorption spectrophotometry,Electron Probe Quantitative Analysis Method of Rare Earth Oxides,Analytical methods for gold, silver and their alloy solders for electronic devices cleanliness and spatter,Quantitative Analysis Method of Electron Probe for Sulfide Minerals,Scanning Electron Microscopy Analysis Method,Analytical Electron Microscopy Transmission Electron Microscopy Selected Area Electron Diffraction Analysis Method,Scanning Electron Microscopy Analysis Method,Analytical Scanning Electron Microscopy Analysis Methods General Rules,Electron Probe Analysis Method,General Rules of X-ray Photoelectron Spectroscopy Analysis Methods,Electron spectroscopy,Electron Microanalysis Methods,Secondary electron analysis method,SEM Scanning Electron Microscopy Analysis Method,Electron spectroscopy,Electron Microanalysis Methods,Ultraviolet Photoelectron Spectroscopy Analysis Method,Destructive physical analysis method for military electronic components