GB/T 28634-2012 in English
SUPERSEDEDMicrobeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
- Issued on:2012-07-31
- Implemented on:2013-02-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$204.00
《GB/T 28634-2012微束分析 电子探针显微分析 块状试样波谱法定量点分析》由TC38(全国微束分析标准化技术委员会)归口,主管部门为国家标准化管理委员会。
Scope
This standard specifies the requirements for the quantitative analysis of the elements in the micron-scale volume of the sample by using the electron probe or the scanning electron microscope (SEM) spectrometer (WDS), through the X-rays generated by the interaction between the electron beam and the sample. Contents include: --Principles of quantitative analysis; --General ranges of elements, mass fractions and standard substances involved in this method; --General requirements for instruments; process and reporting. This standard is applicable to the vertical incidence of the electron beam, and the surface of the test block sample for quantitative analysis is required to be smooth and uniform. There are no special requirements for instruments and data processing software. Users should obtain instrument installation conditions, detailed operating procedures and instrument instructions from the instrument manufacturer.

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