Electronic analysis measurement

Electronic analysis measurement, Total:285 items.

The international standard classification for "Electronic analysis measurement" includes: Natural gas , Chemical analysis , Other standards related to analytical chemistry , Optical measuring instruments , Physicochemical methods of analysis , Test conditions and procedures in general , Cadmium, cobalt and their alloys , Metalliferous minerals , Nickel, chromium and their alloys , Optical equipment , Non-metalliferous minerals , Aluminium and aluminium alloys , Other non-ferrous metals and their alloys , Other standards related to optics and optical measurements , Laboratory medicine , Copper and copper alloys , Other metalliferous minerals , Chemical analysis of metals , Metallic coatings , Aluminium , Production of metals .

The Chinese standard classification for "Electronic analysis measurement" includes: Natural gas , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Heavy metals and their alloys analysis method , Iron ore , Heavy metal ore , Building material raw material ore , Precious metals and its alloy analysis method , Heavy metals and their alloys , Rare refractory metals and their compounds , Medical laboratory equipment , Technical Management , Light metals and their alloys analysis method , Light metal ore .

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary
GB/T 17360-2020 Microbeam analysis- Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer
GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
GB/T 27896-2018 Test method for water vapor content of natural gas—Electronic moisture analyzers

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 8647.2-2006 The methods for chemical analysis of nickel - Determination of aluminium content - Electrothermal atomic absorption spectrometric method
GB/T 15616-1995 Qantitative method for electron probe microanalysis of metals and alloys
GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 15075-1994 Method for testing EPMA instrument
GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis
GB/T 15074-2008 General guide of quantitative analysis by EPMA
GB/T 15247-2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using calibration curve method
GB/T 14506.12-1993 Sillicate rocks. Determination of fluorine content. Ion selective electrode method
GB/T 43889-2024 Microbeam analysis—Electron probe microanalyser (EPMA)—Guidelines for performing quality assurance procedures
GB/T 8220.6-1998 Methods for chemical analysis of bismuth--Determination of lead content--Electrothermal atomic absorption spectrometric method
GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 8220.13-1998 Methods for chemical analysis of bismuth--Determination of silver and cadmium content--Electrothermal atomic absorption spectrometric method
GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
GB/T 6730.28-1986 Methods for chemical analysis of iron ores; The ion-selective electrode method for the determination of fluorine content
GB/T 8151.9-1987 Methods for chemical analysis of zinc concentrates--The ion selective electrode method for the determination of fluorine content
GB/T 23273.6-2009 Methods for chemical analysis of cobalt oxalate - Part 6: Determination of chlorine ion content - Ion selective electrode method
GB/T 1819.15-2006 Methods for chemical analysis of tin concentrates―Determination of fluorine content―The ion-selective electrode method
GB/T 43749-2024 Microbeam analysis—Electron probe microanalysis—Quantitative analysis of anhydrous carbonate minerals
GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 15074-1994 General guide for EPMA quantitative analysis
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)
GB/T 6987.27-2001 Aluminium and aluminium alloys-Determination of copper content-Ion selective electrode method
GB/T 28634-2012 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
GB/T 11067.4-2006 Methods for chemical analysis of silver - Determination of antimony content - The inductively coupled plasma atomic emission spectrometric method
GB/T 17360-1998 Method of quantitative electron probe microanalysis on low contents of Si and Mn in steels
GB/T 4324.13-2008 Methods for chemical analysis of tungsten - Determination of calcium content - The inductively coupled plasma atomic emission spectrometry
GB/T 8220.12-1998 Methods for chemical analysis of bismuth--Determination of nickel content--Electrothermal atomic absorption spectrometric method
GB/T 27896-2011 Test method for water vapor content of natural gas using—Electronic moisture analyzers
GB/T 17360-2008 Quantitative analysis method of low content Si and Mn in steel with electron probe microanalysis

国家药监局

YY/T 1795-2021 Sperm quality analyzer

Professional Standard - Petroleum

SY/T 6027-2012 Quantitative Analysis Method of Rock and Mineral by Electron Probe Microanalysis
SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals

Professional Standard - Electron

SJ/T 11029-1996 Methods of analysis for gold-nickel brazing for electronic devices - Determination of nickel (Volumetric - EDTA method)
SJ/T 11028-2015 Analytical methods for gold copper brazing for electron device Determination of copper by EDTA volumetry
SJ/T 11020-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of copper (iodimetric method)
SJ/T 11029-2015 Analytical methods for gold nickel brazing for electron device Determination of nickel by EDTA volumetry
SJ/T 11018-2016 Analytical methods for pure silver brazing for electron device Determination of sulphur by combustion-iodimetry
SJ/T 10904-1996 Determination of fluorine in electronic glass - Specific ion electrode methods
SJ/T 11028-1996 Methods of analysis for gold-copper brazing for electronic devices - Determination of copper (Volumetric - EDTA method)
SJ/T 11018-1996 Methods of analysis for pure silver brazing for electronic devices-Determination of sulfur (iodimetric combustion method)

国家能源局

SY/T 6027-2019 Quantitative analysis of rocks and minerals by electron probe microanalysis

Professional Standard - Non-ferrous Metal

YS/T 536.2-2009 Methods for chemical analysis of bismuth - Determination of iron content - Electrothermal atomic absorption spectrometric method
YS/T 536.12-2009 Methods for chemical analysis of bismuth - Determination of nickel content - Electrothermal atomic absorption spectrometric method
YS/T 74.3-2010 Methods for chemical analysis of cadmium—Part 3:Determination of nickel content—Electrothermal atomic absorption spectrometric method
YS/T 536.6-2009 Methods for chemical analysis of bismuth—Determination of lead content—Electrothermal atomic absorption spectrometric method
YS/T 536.12-2006 Bismuth Chemical Analysis Method Electrothermal Atomic Absorption Spectrometry Determination of Nickel Content
YS/T 536.13-2006 Methods for chemical analysis of bismuth. Determination of silver and cadmium content. Electrothermal atomic absorption spectrometric method
YS/T 536.6-2006 Bismuth Chemical Analysis Method Electrothermal Atomic Absorption Spectrometry Determination of Lead
YS/T 536.13-2009 Methods for chemical analysis of bismuth - Determination of cadmium content - Electrothermal atomic absorption spectrometric method
YS/T 1072-2015 Chemical analysis methods of palladium-carbon―Determination of palladium contents―Inductively coupled plasma-atomic emission spectrometry
YS/T 1593.3-2023 Methods for chemical analysis of crude lithium carbonate—Part 3：Determination of fluoride ion content—Ion selective electrode method
YS/T 254.5-1994 Methods for chemical analysis of beryllium concentrates-beryl The ion selective electrode method for the determination of fluorine content
YS/T 990.5-2014 Methods for chemical analysis of copper matte―Part 5:Determination of fluorine content―Ion-selective electrode method

未注明发布机构

DIN ISO 13067 E:2021-01 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size

Hunan Provincial Standard of the People's Republic of China

DB43/T 879.2-2014 Frequency conversion power measuring instrument analyzer

Professional Standard - Aviation

HB 5219.5-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Iron Content with Atomical Absorption Spectrometry Method
HB/Z 5088.6-1999 Analysis Method for Electronickelling Solution - Determination of Copper Content with Atomic Absorption Spectrometry Method
HB/Z 5218.25-2004 Methods for chemical analysis of aluminium alloys-Part 25:Determination of boron content by ion selective electrode method
HB 8422-2014 Quantitative detection method of EPMA for trace elements in alloys
HB/Z 5091.6-1999 Analysis Method for Chrome Plating Solution Determination of Copper Content Through Atomic Absorption Spectrometry
HB 5219.11-1998 Methods for Chemical Analysis of Magnesium Alloy- Determination of Nickel Content Through Atomical Absorption Spectrometry
HB 5219.3-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Copper Content with Atomical Absorption Spectrometry Method
HB 5219.8-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Manganese Content with Atomical Absorption Spectrometry Method
HB/Z 5091.5-1999 Analysis Method for Chrome Plating Solution Determination of Ferrous Content Through Atomic Absorption Spectrometry
HB 6731.2-1993 Determination of Magnesium Content in Aluminum Alloys by Atomic Absorption Spectrometry
HB/Z 5088.5-1999 Analysis Method for Nickel Plating Solution Determination of Ferrous Content Through Atomic Absorption Spectrometry
HB 5219.20-1998 Methods for Chemical Analysis of Magnesium Alloy - Determination of Silver Content with Atomical Absorption Spectrometry Method
HB 5219.13-1998 Methods for Chemical Analysis Ofmagnesium Alloy - Determination of Zinc Content Through Atomical Absorption Spectrometry

工业和信息化部

YS/T 1179.1-2017 Chemical analysis methods of aluminum slag-Part 1:Determination of fluorine in aluminum slag-Ion selective electrode method
YB/T 4799-2018 Iron and steel. Determination of aluminium nitride precipitated phase content. Inductively coupled plasma atomic emission spectrometic method after electrolytic separation
YS/T 1569.5-2022 Methods for chemical analysis of lithium nickel manganese oxide-Part 5:Determination of chloride content-lon selective electrode method

Group Standards of the People's Republic of China

T/GDGAA 0004-2022 Terahertz quantum fingerprint detection and analysis system for quality control of traditional chinese medicine
T/CSTM 01199-2024 Multilayer metal film-Measurement and analysis method of layer structure-X-ray photoelectron spectroscopy
T/HNNMIA 47-2023 Chemical analysis methods for ammonium molybdate - Determination of fluorine content - Ion selective electrode method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 1819.15-2017 Methods for chemical analysis of tin concentrates - Part 15: Determination of fluorine content - The ion-selective electrode method
GB/T 34500.1-2017 Chemical analysis methods for rare earth residue and waste water - Part 1: Determination of fluorine content - Ion selective electrode analysis

Professional Standard - Ferrous Metallurgy

YB/T 190.10-2001 Methods for chemical analysis of continuous casting mold powder—The ion-selective electrode method for the determination of fluorine content

British Standards Institution (BSI)

BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS 3727-2:1968 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of boron (photometric method)
BS 3727-8:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of manganese (photometric method)
BS 3727-6:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of copper (photometric method)
BS 3727-13:1965 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of titanium (photometric method)
BS 3727-4:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of chromium (photometric method)
BS 3727-5:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of cobalt (photometric method)
BS 3727-15:1968 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of zinc (photometric method)
BS 3727-1:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of aluminium (photometric method)
BS 3727-7:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of iron (photometric method)
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS 3727-9:1967 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of magnesium (photometric method)
BS 3727-14:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of tungsten (gravimetric method)
BS 3727-3:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of carbon
BS 3727-10:1964 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of silicon 0.020-0.25 per cent (photometric method)
BS 3727-11:1965 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of silicon 0.001-0.020 per cent (photometric method)
BS 3727-12:1970 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of sulphur (combustion method)
BS ISO 23833:2013 Microbeam analysis. Electron probe microanalysis (EPMA) Vocabulary
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS 3727-21:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of magnesium (atomic absorption method)
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS ISO 23692:2021 Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
BS 3727-22:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of zinc (atomic absorption method)
BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS ISO 14595:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)
BS ISO 14595:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
20/30393735 DC BS ISO 23692. Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
PD ISO/TR 23173:2021 Surface chemical analysis. Electron spectroscopies. Measurement of the thickness and composition of nanoparticle coatings
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS 3727-16:1966 Methods for the analysis of nickel for use in electronic tubes and valves - Determination of combined and free magnesium
BS 7020-19:1988 Analysis of iron ores. Method for the determination of fluorine content. Ion-selective electrode method
BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
BS 7020-19:1989 Analysis of iron ores. Method for the determination of fluorine content. Ion-selective electrode method
BS ISO 19463:2018 Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
BS ISO 14594:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 14594:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS ISO 14595:2023 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
BS ISO 24173:2024 Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 14701:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
PD IEC TS 63109:2022 Photovoltaic (PV) modules and cells. Measurement of diode ideality factor by quantitative analysis of electroluminescence images
BS PD ISO/TR 23173:2021 Surface chemical analysis. Electron spectroscopies. Measurement of the thickness and composition of nanoparticle coatings
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

International Organization for Standardization (ISO)

ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 23833:2013 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO 23833:2006 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 14595:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)
ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
ISO 14595:2003 Microbeam Analysis - Electron Probe Microanalysis - Guidelines for Specification of Certified Reference Materials (CRM) (First Edition)
ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 14595:2003/Cor 1:2005 Microbeam Analysis - Electron Probe Microanalysis - Guidelines for Specifications of Certified Reference Materials (CRM) TECHNICAL CORRECTION 1 (First Edition)
ISO 14594:2003 Microbeam analysis - Electron microprobe analysis (Castaing Microprobe) - Guidelines for determining experimental parameters for wavelength dispersive spectrometry
ISO 14594:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 23692:2021 Microbeam analysis - Electron probe microanalysis - Quantitative analysis of Mn dendritic segregation in continuously cast steel product
ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 16531:2020 Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
ISO 16592:2012 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
ISO/PRF 14595 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 14595:2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO/TR 23173:2021 Surface chemical analysis - Electron spectroscopies - Measurement of the thickness and composition of nanoparticle coatings
ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness

Korean Agency for Technology and Standards (KATS)

KS D ISO 14595:2012 Microbeam analysis-Electron probe microanalysis-Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO TR 17270:2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
KS D ISO 16592-2011(2021) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 16592-2021 Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 17560-2003(2018) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
KS D ISO 16592-2011(2016) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 14237-2003(2018) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
KS D ISO 14594:2012 Microbeam analysis－Electron probe microanalysis－Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 16592:2011 Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 14595:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 14595-2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS C IEC 60151-1-2013 Measurements of the electrical properties of electronic tubes and valves－Part 1：Measurement of electrode current
KS D ISO 13898-4:2010 Steel and iron－Determination of nickel, copper and cobalt contents－Inductively coupled plasma atomic emission spectrometric method－Part 4：Determination of cobalt content
KS D ISO 13898-4-2010(2020) Steel and iron－Determination of nickel, copper and cobalt contents－Inductively coupled plasma atomic emission spectrometric method－Part 4：Determination of cobalt content
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 18118-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h
KS C IEC 60151-1-2004(2009) Measurements of the electrical properties of electronic tubes and valves－Part 1：Measurement of electrode current
KS D ISO 13898-3:2010 Steel and iron-Determination of nickel, copper and cobalt contents-Inductively coupled plasma atomic emission spectrometric method-Part 3:Determination of copper content
KS D ISO 23833:2012 Microbeam analysis-Electron probe microanalysis(EPMA)-Vocabulary
KS D ISO 13898-3-2010(2020) Steel and iron－Determination of nickel, copper and cobalt contents－Inductively coupled plasma atomic emission spectrometric method－Part 3：Determination of copper content
KS D ISO 13898-2:2010 Steel and iron－Determination of nickel, copper and cobalt contents－Inductively coupled plasma atomic emission spectrometric method－Part 2：Determination of nickel content
KS D ISO 13898-2-2010(2020) Steel and iron－Determination of nickel, copper and cobalt contents－Inductively coupled plasma atomic emission spectrometric method－Part 2：Determination of nickel content
KS C IEC 60151-0-2004(2009) Measurements of the electrical properties of electronic tubes and valves－Part 0：Precautions relating to methods of measurement of electronic tubes and valves
KS C IEC 60151-0-2013 Measurements of the electrical properties of electronic tubes and valves－Part 0：Precautions relating to methods of measurement of electronic tubes and valves
KS D ISO 22489-2023 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS C IEC/TR 62725-2017(2022) Analysis of quantification methodologies of greenhouse gas emissions for electrical and electronic products and systems
KS D ISO 11435-2006(2016) Nickel alloys－Determination of molybdenum－Inductively coupled plasma atomic emission spectrometric method
KS D ISO 22033-2006(2016) Nickel alloys－Determination of niobium－Inductively coupled plasma atomic emission spectrometric method

GSO

GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 23833:2015 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
GSO ISO 23833:2015 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
BH GSO ISO 23833:2017 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
GSO ISO 16592:2015 Microbeam analysis -- Electron probe microanalysis -- Guidelines for determining the carbon content of steels using a calibration curve method
GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
OS GSO ISO 16592:2015 Microbeam analysis -- Electron probe microanalysis -- Guidelines for determining the carbon content of steels using a calibration curve method
BH GSO ISO 16592:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for determining the carbon content of steels using a calibration curve method
BH GSO ISO 14594:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
OS GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
GSO ISO 24173:2015 Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
GSO ISO 14701:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness
GSO ISO 22489:2015 Microbeam analysis -- Electron probe microanalysis -- Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BH GSO ISO 17470:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
OS GSO ISO 14595:2009 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22489:2017 Microbeam analysis -- Electron probe microanalysis -- Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy

KR-KS

KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO TR 17270-2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14595-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 14595-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO TS 18223-2023 Nickel alloys — Determination of Nickel content — Inductively coupled plasma atomic emission spectrometric method

SCC

BS ISO 23833:2006 Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary
BS ISO 16592:2006 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
DIN ISO 16592 E:2015 Draft Document - Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method (ISO 16592:2012); Text in German and English
BS PD IEC TS 63109:2022 Photovoltaic (PV) modules and cells. Measurement of diode ideality factor by quantitative analysis of electroluminescence images
BS ISO 22489:2006 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
VDI/VDE/DGQ/DKD 2622 BLATT 11:2003 Calibration of measuring instruments for electrical quantities — spectrum analyzers
DANSK DS/IEC TS 63109:2022 Photovoltaic (PV) modules and cells – Measurement of diode ideality factor by quantitative analysis of electroluminescence images
10/30195133 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

SE-SIS

SIS SS IEC 746:1984 Electronic measuring equipment - Expression of performance of electrochemical analyzers
SIS SS IEC 776:1986 Electronic measuring equipment- Expression ofthe properties oflogic analyzers
SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers
SIS SS IEC 528:1984 Electronic measuring equipment - Expression ofperformance of air quality infra-red analyzers

Association Francaise de Normalisation

NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
NF X21-009:2008 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary.
NF X21-001:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs).
NF C42-695:1985 Electronic measuring instruments. Expression of the properties of logic analyzers.
NF ISO 24173:2009 Microbeam Analysis - Guidelines for Orientation Measurement by Backscattered Electron Diffraction
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
NF X21-007:2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steel using a calibration curve method.
NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X21-016*NF ISO 15932:2014 Microbeam analysis - Analytical electron microscopy - Vocabulary
NF T51-241:2011 Plastics - Determination of the molecular mass and molecular mass distribution of polymer species by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS).
NF M60-404:1998 Determination of plutonium content in plutonium dioxide (PuO2) of nuclear grade quality. Gravimetric method.

U.S. Air Force

AIR FORCE A-A-58042 A VALID NOTICE 1-2012 Analyzer, Digital Data, Electronic Test
AIR FORCE A-A-58042 A-1996 ANALYZER, DIGITAL DATA, ELECTRONIC TEST

RU-GOST R

GOST R 50706.4-1994 Nitric acid for industrial use. Determination of chloride ions content. Potentiometric method

German Institute for Standardization

DIN 29571-3:1990-10 Aerospace; electrical equipment; analysis of load and power source capacity
DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)

CZ-CSN

CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters

Society of Automotive Engineers (SAE)

SAE AIR6966-2020 Conducting Measurement Systems Analysis for Rotor Balancing Tasks

Standard Association of Australia （SAA）

AS 1696.2:1997 Copper - Determination of copper content - Electrogravimetric method

HU-MSZT

MNOSZ 5965-1956 Chemical molecular analysis and detection

RO-ASRO

STAS 6908/3-1990 Gaseous hydroc arbcrs. Hydrogen sulph. Buffers. Shapes and dimensions

American Society for Testing and Materials (ASTM)

ASTM E3063-17 Test Method for Antimony Content Using Neutron Activation Analysis (NAA)
ASTM E3063-16 Test Method for Antimony Content Using Neutron Activation Analysis (NAA)

Japanese Industrial Standards Committee (JISC)

JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

International Electrotechnical Commission (IEC)

IEC TR 62725:2013 Analysis of quantification methodologies for greenhouse gas emissions for electrical and electronic products and systems

Danish Standards Foundation

DS/IEC/TR 62725:2013 Analysis of quantification methodologies of greenhouse gas emissions for electrical and electronic products and systems

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc.

ASHRAE CH-95-4-1995 Measuring and Analyzing Power Quality in HVAC Applications

VDI - Verein Deutscher Ingenieure

VDI/VDE/DGQ/DKD 2622 Blatt 11-1999 Kalibrieren von Messmitteln fuer elektrische Groessen - Spektrumanalysatoren

Indonesia Standards

SNI 03-3962-1995 Test method for light sediment grain distribution gravimetrically by sieves

BR-ABNT

ABNT TB-19 Pt.4-1979 Electronic and electrical measurements, electronic measurement methods using ionizing radiation

Association of German Mechanical Engineers

VDI/VDE/DGQ/DKD 2622 Blatt 11-2003 Calibration of measurement equipments for electrical quantities - Spectrum analyzers