electron microscope

electron microscope, Total:342 items.

The international standard classification for "electron microscope" includes: Dividing and tool-workpiece holding devices , Optics and optical measurements in general , Chemical analysis , Physicochemical methods of analysis , Chemical technology (Vocabularies) , Optical equipment , Measuring instruments , Other standards related to analytical chemistry , Laboratory medicine , Protection against crime , Optical measuring instruments , Test conditions and procedures in general , Ophthalmic equipment .

The Chinese standard classification for "electron microscope" includes: Electron optics and other physical optics instrument , Magnifier and microscope , Measuring tool and instrument , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Oil shale , Crime judging technology , Chemical Measurement , Medical optical instrument and endoscope , General and microsurgical devices .

Professional Standard - Machinery

JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
JB/T 5383-1991 Specification for Transmission Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 10014-1999 Inductance micrometer with digital display
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 7398.7-1994 Microscope - Revolving Nosepiece
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5477-1991 Microscope - Immersion Oil for Fluorescence Microscopy
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
JB/T 9333-1999 Microscopes -- Immersion oil for general use in light microscopy
JB/T 6842-1993 Test Method of Scanning Electron Microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33838-2017 Microbeam analysis―Scanning electron microscopy―Methods of evaluating image sharpness
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 43889-2024 Microbeam analysis—Electron probe microanalyser (EPMA)—Guidelines for performing quality assurance procedures
GB/T 26600-2024 Microscopes—Immersion liquid for light microscopy
GB/T 5594.8-1985 Test methods for properties of structure ceramic used in electronic components--Determination of microstructure
GB/T 22092-2018 Micrometer head and depth micrometer with electronic digital display
GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences―Part 6:Scanning electron microscopy
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 43610-2023 Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary
GB/T 26097-2010 Inductive length measuring instrument with digital display
GB/T 15247-2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using calibration curve method
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 30705-2014 Microbeam analysis―Electron probe microanalysis―Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB/T 26600-2011 Microscopes—Immersion liquids for light microscopy
GB/T 21636-2008 Microbeam analysis - Electron Probe Micro Analysis (EPMA) - Vocabulary
GB/T 22092-2008 Fixed micrometer and depth micrometer with electronic digital display
GB/T 28634-2012 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 32055-2015 Microbeam analysis―Electron probe microanalysis―Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 21638-2008 Guide for electron beam microananlysis of defect in steel materials
GB/T 27668-2023 Microscopes—Vocabulary for light microscopy

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary
GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)
GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy

Professional Standard - Education

JY/T 0581-2020 General analysis rules for transmission electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 011-1996 General rules for transmission electron microscopy

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Group Standards of the People's Republic of China

T/CSTM 00162-2020 Calibration methods for transmission electron microscope
T/CAB 0293-2023 Risk assessment guideline for electronics and electrical appliances – Computer Monitors
T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy
T/CA 206-2019 Special display for e-sports
T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/SPSTS 031-2023 Graphene Material Surface Potential Measurement Atomic Force Microscopy

Professional Standard - Aviation

HB 8694-2023 Display symbology of aircraft electronic Display

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope

工业和信息化部

YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

Professional Standard - Medicine

YY 0065-2007 Ophthalmic instruments—Slit-lamp microscopes
YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
YY 0067-1992 Micro-circulation microscopes
YY 0065-2016 Ophthalmic instruments - Slit-lamp microscopes
YY/T 0065-2016 Ophthalmic instruments—Slit-lamp microscopes

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

国家食品药品监督管理局

YY/T 0067-2007 Micro-circulation microscopes

International Organization for Standardization (ISO)

ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 11883:1997 Optics and optical instruments - Microscopes - Marking of stereomicroscopes
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
ISO 10934-1:2002 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 10934:2020 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
ISO 10939:2007 Ophthalmic instruments - Slit-lamp microscopes
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 10939:2017 Ophthalmic instruments - Slit-lamp microscopes
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO/CD 18221:2023 Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance
ISO 8036-1:1998 Optics and optical instruments - Microscopes - Part 1: Immersion oil for general use in light microscopy
ISO 10939:1998 Ophthalmic instruments - Slit-lamp microscopes
ISO 18221:2016 Microscopes - Microscopes with digital imaging displays - Information provided to the user regarding imaging performance

GSO

OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
BH GSO ISO 11883:2016 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 11883:2013 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
BH GSO ISO 8576:2016 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
GSO ISO 8576:2015 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BH GSO ISO 10934-1:2016 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
OS GSO ISO 10934-1:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
GSO ISO 10939:2021 Ophthalmic instruments — Slit-lamp microscopes
GSO ISO 18221:2021 Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance
BH GSO ISO 10939:2022 Ophthalmic instruments — Slit-lamp microscopes

British Standards Institution (BSI)

BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary
BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS IEC 62679-1-1:2014 Electronic paper displays. Terminology
PD IEC TR 62977-2-4:2018 Electronic displays. Transparent displays. Overview of application scenarios
BS ISO 10934-1:2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy
BS IEC 62977-2-7:2024 Electronic displays - Measurements of optical characteristics. Tiled displays
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS IEC 62977-3-4:2023 Electronic displays - Evaluation of optical performances. High dynamic range displays
BS EN 60749-35:2006 Semiconductor devices - Mechanical and climatic test methods - Acoustic microscopy for plastic encapsulated electronic components
BS IEC 62679-3-2:2013 Electronic paper display. Measuring method. Electro-optical
BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
BS EN ISO 10939:2007 Ophthalmic instruments - Slit-lamp microscopes
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
PD IEC TR 62977-2-5:2018 Electronic display devices. Transparent displays. Measurements of optical characteristics
BS IEC 62977-3-9:2023 Electronic displays. Evaluation of optical performance. Display sparkle contrast
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS IEC 62679-4-2:2016 Electronic paper displays. Environmental test methods
BS IEC 62679-3-1:2014 Electronic paper displays. Optical measuring methods
18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
BS EN 120007:1991 Harmonized system of quality assessment for electronic components - Blank detail specification - Liquid crystal displays - Monochrome LCDs without electronic circuit
BS EN ISO 10939:2017 Ophthalmic instruments. Slit-lamp microscopes
BS ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Advanced techniques in light microscopy
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS H 7804:2005 Method for particle size determination in metal catalysts by electron microscope
JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
JIS B 7150:1993 Micrometer microscopes
JIS T 7316:2014 Ophthalmic instruments -- Slit-lamp microscopes
JIS B 7563:2021 Electronic digital-indicator gauge

Korean Agency for Technology and Standards (KATS)

KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS M 2617-2022 Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS M 2617-2007(2017) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS B ISO 8576:2006 Optics and optical instruments－Microscopes－Reference system of polarized light microscopy
KS M 2617-2007(2022) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS B ISO 10934-1:2004 Optics and optical instruments－Vocabulary for microscopy－Part 1：Light microscopy
KS B ISO 10934-1:2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS D ISO TR 17270:2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS B 5601-1995(2021) Micrometer microscopes
KS B 5601-1995 Micrometer microscopes
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS P ISO 10939:2002 Ophthalmic instruments－Slit-lamp microscopes
KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS B 5601-2021 Micrometer microscopes
KS B ISO 11884-2-2021 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS P ISO 10939:2019 Ophthalmic instruments — Slit-lamp microscopes
KS B ISO 8036-1:2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS D 8544-2021 Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS B ISO 8036-1:2008 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy

SCC

BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
DIN 58272 E:2015 Draft Document - Medical instruments - Microscopic forceps, fine pattern
BS PD IEC TR 62977-2-4:2018 Electronic displays-Transparent displays. Overview of application scenarios
BS ISO 10934-1:2002 Optics and optical instruments. Vocabulary for microscopy-Light microscopy
BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
DANSK DS/IEC TR 62977-2-4:2018 Electronic displays – Part 2-4: Transparent displays – Overview of application scenarios
DANSK DS/IEC 62977-2-7:2024 Electronic displays – Part 2-7: Measurements of optical characteristics – Tiled displays
BS PD IEC TR 62977-2-5:2018 Electronic display devices-Transparent displays. Measurements of optical characteristics
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS EN ISO 10939:1998 Ophthalmic instruments. Slit-lamp microscopes
DANSK DS/EN ISO 10939:2007 Ophthalmic instruments – Slit-lamp microscopes

Association Francaise de Normalisation

NF X21-016*NF ISO 15932:2014 Microbeam analysis - Analytical electron microscopy - Vocabulary
NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF S12-123:2007 Ophthalmic instruments - Slit-lamp microscopes.
NF C96-315:1987 Microwave microelectronics. Attenuators and loads.
NF S12-123:1998 Ophthalmic instruments. Slit-lamp microscopes.
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF S12-123*NF EN ISO 10939:2017 Ophthalmic instruments - Slit-lamp microscopes

German Institute for Standardization

DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
DIN 58272 E:2015-09 Medical instruments - Microscopic forceps, fine pattern
DIN 58272:2023-03 Medical instruments - Microscopic forceps, fine pattern
DIN 58272 E:2022-08 Medical instruments - Microscopic forceps, fine pattern
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN EN 120007:1993 Blank detail specification: Liquid Crystal Displays; monochrome LCDs without electronic circuit; German version EN 120007:1992
DIN EN 120007:1993-06 Blank detail specification: Liquid Crystal Displays; monochrome LCDs without electronic circuit; German version EN 120007:1992
DIN EN ISO 10939:2007 Ophthalmic instruments - Slit-lamp microscopes (ISO 10939:2007); English version of DIN EN ISO 10939:2007-04
DIN EN ISO 10939:2017-09 Ophthalmic instruments - Slit-lamp microscopes (ISO 10939:2017); German version EN ISO 10939:2017
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS D ISO TR 17270-2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
KS B ISO 10934-1-2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS P ISO 10939-2019 Ophthalmic instruments — Slit-lamp microscopes
KS B ISO 8036-1-2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery

CN-STDBOOK

图书 a-4565 Practical Methods for Electron Microanalysis

Society of Automotive Engineers (SAE)

SAE ARP4102/7-2007 Electronic Displays
SAE ARP4102/7-1988 Electronic Displays
SAE ARP4102/7_APXC-2007 Appendix C Electronic Display Symbology for Engine Displays

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)

American Society for Testing and Materials (ASTM)

ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

RU-GOST R

GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes

Military Standards (MIL-STD)

DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
DOD A-A-53448 A-1991 TRAY, INSTRUMENT (OPHTHALMIC MICROSURGERY)

International Electrotechnical Commission (IEC)

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components
IEC TR 62977-2-4:2018 Electronic displays - Part 2-4: Transparent displays - Overview of application scenarios
IEC 62977-2-7:2024 Electronic displays - Part 2-7 : Measurements of optical characteristics - Tiled displays

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

Association for Information and Image Management (AIIM)

AIIM TR19-1993 Electronic Imaging Output Displays

SAE - SAE International

SAE ARP4102/7 APPENDIX C-1993 Appendix C Electronic Display Symbology for Engine Displays
SAE AS6296-2016 Electronic Flight Instrument System (EFIS) Displays

U.S. Air Force

AIR FORCE MIL-HDBK-87213 A-2005 ELECTRONICALLY/OPTICALLY GENERATED AIRBORNE DISPLAYS
AIR FORCE AFGS-87213 B CHG NOTICE 1-1996 DISPLAYS, AIRBORNE, ELECTRONICALLY/OPTICALLY GENERATED

RO-ASRO

STAS 9105-1971 MICROCOPY APPARATUS Terminology

IT-UNI

UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.
UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.

Spanish Association for Standardization (UNE)

UNE-EN 120007:1992 BDS: LIQUID CRISTAL DISPLAYS. MONOCHROME LCDS WITHOUT ELECTRONIC CIRCUIT. (Endorsed by AENOR in September of 1996.)

VDI - Verein Deutscher Ingenieure

VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

Standard Association of Australia （SAA）

AS 2856.3:2000(R2013) Coal Petrography Microscopic Coal Microscopic Reflectivity Microscopic Determination Method

European Committee for Standardization (CEN)

EN ISO 10939:2017 Ophthalmic Instruments - Slit-Lamp Microscopes
EN ISO 10939:1998 Ophthalmic Instruments - Slit-Lamp Microscopes ISO 10939: 1998
EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
EN ISO 10939:2007 Ophthalmic instruments - Slit-lamp microscopes (ISO 10939:2007)

IN-BIS

IS 8839-1978 Forceps, Cup Up, Specifications for Microlaryngeal Surgery

Danish Standards Foundation

DS/EN ISO 10939:2007 Ophthalmic instruments - Slit-lamp microscopes
DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

Lithuanian Standards Office

LST EN 120007-2001 Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit

SE-SIS

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

PL-PKN

PN C04061-1965 Pe?roleum produc?s Foreign par?icles in greases determina?ion by microscopical me?hod

Defense Logistics Agency

DLA DSCC-DWG-80002 REV B-2005 METERS, ELECTRICAL INDICATING
DLA DSCC-DWG-80038 REV A-2005 METERS, ELECTRICAL INDICATING
DLA DSCC-DWG-80040 REV B-2005 METER, ELECTRICAL INDICATING
DLA SMD-5962-86088-1986 MICROCIRCUITS, DIGITAL, GRAPHICS DISPLAY CONTROLLER, MONOLITHIC SILICON
DLA DSCC-DWG-80009 REV B-2005 METERS, ELECTRICAL INDICATING
DLA DSCC-DWG-80007 REV A-2005 METERS, ELECTRICAL, INDICATING