GB/T 23414-2009 in English

VALID

Microbeam analysis - Scanning electron microscopy - Vocabulary

Issued on:2009-04-01
Implemented on:2009-12-01
File Format:PDF
Delivery:Via email within 5 business days

Price(USD)： $450.00
$437.00

Standard No:	GB/T 23414-2009
Document status:	VALID
Title in English:	Microbeam analysis - Scanning electron microscopy - Vocabulary
Title in Chinese:	微束分析扫描电子显微术术语
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 5 business days
Issued on:	2009-04-01
Implemented on:	2009-12-01
Chinese Classification:	N33-Electron optics and other physical optics instrument
Professional Classification:	GB-National Standard
Related Keywords:	electron microscopy analytical electron microscopy electron probe microanalysis vocabulary scopethis standard defines terms microbeam analysis
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《GB/T 23414-2009微束分析扫描电子显微术术语》由TC38（全国微束分析标准化技术委员会）归口，主管部门为国家标准化管理委员会。
本标准定义了扫描电子显微术(SEM)实践中使用的术语。包括一般术语和按技术分类的具体概念的术语,也包括已经在ISO23833中定义的术语。
本标准适用于所有有关SEM 实践的标准化文件。另外,本标准的某些术语定义,也适用于相关领域的文件〔例如:电子探针显微分析(EPMA)、分析电子显微术(AEM)、能谱法(EDX)等〕。

Scope

This standard defines terms used in the practice of scanning electron microscopy (SEM). Includes general terms and terms of specific concepts classified by technology, and also includes terms already defined in ISO 23833. This standard applies to all standardized documents related to SEM practice. In addition, some definitions of terms in this standard are also applicable to documents in related fields (for example: Electron Probe Microanalysis (EPMA), Analytical Electron Microscopy (AEM), Energy Spectroscopy (EDX), etc.].

More samples: GB 50021-2001(2009) YD/T 3934-2021 JC/T 2453-2018

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