scanning probe microscopy
scanning probe microscopy, Total:40 items.
The international standard classification for "scanning probe microscopy" includes: Chemical analysis , Other standards related to optics and optical measurements .
The Chinese standard classification for "scanning probe microscopy" includes: Basic standards and general methods , Optical Measurement , Electron optics and other physical optics instrument .
National Metrological Technical Specifications of the People's Republic of China
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
- GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
- GB/T 42543-2023 Surface chemical analysis—Scanning probe microscopy—Determination of cantilever normal spring constants
- GB/T 43661-2024 Surface chemical analysis—Scanning probe microscopy—Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
- GB/T 22461.2-2023 Surface chemical analysis—Vocabulary—Part 2:Terms used in scanning probe microscopy
Professional Standard - Education
- JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
Korean Agency for Technology and Standards (KATS)
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope
British Standards Institution (BSI)
- BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
- BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
- BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
- BS ISO 18115-2:2010 Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy
- BS ISO 13083:2015 Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
- BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
GSO
- GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
- BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
- OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
- GSO ISO 28600:2013 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
- BH GSO ISO 28600:2016 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
- GSO ISO 18115-2:2013 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
International Organization for Standardization (ISO)
- ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO 13083:2015 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
- ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
- ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
- ISO 18115-2:2010 Analyse chimique des surfaces — Vocabulaire — Partie 2: Termes utilisés en microscopie à sonde à balayage (Première édition)
- ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
SCC
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- 10/30199182 DC BS ISO 11039. Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
- VDI/VDE 2656 BLATT 1-2019 Determination of geometric measurements with scanning probe microscopes - calibration of measuring systems
- 10/30199179 DC BS ISO 28600. Surface chemical analysis. Data transfer format for scanning-probe microscopy
Association Francaise de Normalisation
- NF X21-069-2:2010 Surface chemical analysis - Vocabulary - Part 2 : terms used in scanning-probe microscopy.
Japanese Industrial Standards Committee (JISC)
- JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
Association of German Mechanical Engineers
- VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
VDI - Verein Deutscher Ingenieure
- VDI/VDE 2656 Blatt 1-2006 Bestimmung geometrischer Messgroessen mit Rastersondermikroskopen - Kalibrierung von Messsystemen
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