JJF 1351-2012 in English

VALID

Calibration Specification for Scanning Probe Microscopes

Issued on:2012-06-18
Implemented on:2012-09-18
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $270.00
$262.00

Standard No:	JJF 1351-2012
Document status:	VALID
Title in English:	Calibration Specification for Scanning Probe Microscopes
Title in Chinese:	扫描探针显微镜校准规范
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2012-06-18
Implemented on:	2012-09-18
Related Keywords:	probe microscopes scopethis specification calibration specification probe microscopes calibration specification
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本规范适用于以几何表面形貌为测量对象的扫描探针显微镜的校准。
扫描探针显微镜根据其设计原理不同,校准时需要根据实际情况选择相关的计量特性。对有特殊要求的测量任务,如对溯源要求较高的测量,不在本校准规范的适用范围。

Scope

This specification is applicable to the calibration of scanning probe microscopes that take geometric surface topography as the measurement object. Scanning probe microscopes have different design principles, and relevant metrological characteristics need to be selected according to the actual situation during calibration. Measurement tasks with special requirements, such as measurements with high traceability requirements, are not within the scope of application of this calibration specification.

More samples: YD/T 3934-2021 GB 18306-2015 GB 50021-2001(2009)

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