Scanning Electron Microscope Optical Microscope

Scanning Electron Microscope Optical Microscope, Total:334 items.

The international standard classification for "Scanning Electron Microscope Optical Microscope" includes: Optics and optical measurements in general , Optical equipment , Optical measuring instruments , Chemical analysis , Other standards related to optics and optical measurements , Protection against crime , Ophthalmic equipment .

The Chinese standard classification for "Scanning Electron Microscope Optical Microscope" includes: Chemical Measurement , Electron optics and other physical optics instrument , Magnifier and microscope , Optical metrological instrument , Basic standards and general methods , Oil shale , Optical Measurement , Crime judging technology , Medical optical instrument and endoscope .

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes

Professional Standard - Machinery

JB/T 9340-1999 Light-section microscope
JB/T 5477-1991 Microscope - Immersion Oil for Fluorescence Microscopy
JB/T 9340-2024 Light-section microscope
JB/T 8230.1-1999 Light microscope -- vocabulary
JB/T 9333-1999 Microscopes -- Immersion oil for general use in light microscopy
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 8230.1-1995 Light microscopy terminology
JB/T 7794-1995 Polarizing Microscope
JB/T 7398.2-1994 Microscope Optical Connection Dimensions
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 8230.10-1995 Microscope condenser series

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
GB/T 26600-2024 Microscopes—Immersion liquid for light microscopy
GB/T 2609-2006 Microscopes - Objectives
GB/T 22061-2008 Microscopes - Reference system of polarized light microscopy
GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
GB/T 9247-1996 Microscopes-Condensers
GB/T 2609-2015 Microscopes―Objectives
GB/T 27668-2023 Microscopes—Vocabulary for light microscopy
GB/T 24665-2009 Polarizing microscope
GB/T 9246-2008 Microscopes—Oculars (eyepieces)
GB/T 2609-1996 Microscopes--Objectives
GB/T 26601-2011 Microscopes—Spectral filters
GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
GB/T 26600-2011 Microscopes—Immersion liquids for light microscopy
GB/T 9246-1996 Microscopes-Oculars (eyepieces)
GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences―Part 6:Scanning electron microscopy
GB 9247-1988 Microscopes--Series of condensers
GB/T 9247-2008 Microscopes—Condensers
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Group Standards of the People's Republic of China

T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy
T/ZZB 0121-2016 Bio-fluorescence microscope
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0582-2020 General rules of analytical methods for the scanning probe microscope
JY/T 0586-2020 General rules of analytical methods for confocal laser scanning microscope
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

Professional Standard - Medicine

YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

Professional Standard - Public Safety Standards

GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1936-2021 Forensic sciences-Examination methods for cross-section shapes of chemical fiber evidence-Microscopy
GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
ISO 10934:2025 Microscopes — Vocabulary for light microscopy
ISO 11883:1997 Optics and optical instruments - Microscopes - Marking of stereomicroscopes
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO 15227 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
ISO 8576 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
ISO 10934-1:2002 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
ISO 10934:2020 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
ISO 8036-1:1998 Optics and optical instruments - Microscopes - Part 1: Immersion oil for general use in light microscopy
ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 8577:1997 Optics and optical instruments - Microscopes - Spectral filters
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 8036:2015 Plus Redline Microscopes - Immersion liquids for light microscopy (includes Redline Version)
ISO 10937:1997 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 8038:1985 Optics and optical instruments; Microscopes; Screw thread for objectives
ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Part 2: Advanced techniques in light microscopy
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 9344:1996 Optics and optical instruments - Microscopes - Graticules for eyepieces
ISO 8578:1997 Optics and optical instruments - Microscopes - Marking of objectives and eyepieces
ISO 9344:2011 Microscopes - Graticules for eyepieces
ISO 11884-2:1997 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
ISO 10937:2000 Optics and optical instruments - Microscopes - Diameter of interchangeable eyepieces
ISO 11884-1:1998 Optics and optical instruments - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO/PRF 19012-4:2024 Microscopes
ISO 19012-2:2009 Optics and photonics - Designation of microscope objectives - Part 2: Chromatic correction
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 19012-3:2015 Microscopes - Designation of microscope objectives - Part 3: Spectral transmittance

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS K 0149-1:2019 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
JIS B 7148:1992 Microscope eyepieces
JIS K 0183:2024 Surface chemical analysis-Scanning probe microscopy-Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
JIS B 7150:1993 Micrometer microscopes

Korean Agency for Technology and Standards (KATS)

KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2024 General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS M 2617-2022 Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS M 2617-2007(2017) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 15227:2003 Optics and optical instruments-Microscopes-Testing of stereomicroscopes
KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 15227:2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
KS B ISO 15227:2013 Optics and optical instruments ― microscopes ― testing of stereomicroscopes
KS M 2617-2007(2022) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
KS D 2713-2021 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS B ISO 10934-1:2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 10934-1:2004 Optics and optical instruments － Vocabulary for microscopy － Part 1: Light microscopy
KS B ISO 8576:2006 Optics and optical instruments－Microscopes－Reference system of polarized light microscopy
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 10934-1-2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 10934-1-2024 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS B ISO 11884-2-2011(2016) Optics and photonics － Minimum requirements for stereomicroscope － Part 2: High performance microscopes
KS B ISO 8036-1-2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS B ISO 8036-1:2006 Optics and optical instruments－Microscopes－Part 1：Immersion oil for general use in light microscopy
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
KS B ISO 11884-2:2011 Optics and photonics － Minimum requirements for stereomicroscope － Part 2: High performance microscopes
KS B ISO 8036-1:2008 Optics and optical instruments － Microscopes － Part 1: Immersion oil for general use in light microscopy
KS B ISO 11884-2-2021 Optics and photonics － Minimum requirements for stereomicroscope － Part 2: High performance microscopes
KS B ISO 10934-2-2021 Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS B ISO 10934-2-2011(2016) Optics and optical instruments － Vocabulary for microscopy － Part 2: Advanced techniques in light microscopy
KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS B ISO 10934-2-2011(2021) Optics and optical instruments－Vocabulary for microscopy－Part 2：Advanced techniques in light microscopy
KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS B 5619-2019(2024) Microscopes — Eyepiece reticles
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS B ISO 10934-2:2011 Optics and optical instruments － Vocabulary for microscopy － Part 2: Advanced techniques in light microscopy
KS B 5619-2019 Microscopes — Eyepiece reticles
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS B ISO 8578-2021 Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B ISO 8578-2016(2021) Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B ISO 8578-2016 Optics and optical instruments－Microscopes－Marking of objectives and eyepieces
KS B 5601-1995(2021) Micrometer microscopes
KS B ISO 8039-2016 Optics and optical instruments Microscopes Magnification
KS B 5601-1995 Micrometer microscopes

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 11883:2016 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
BH GSO ISO 27911:2016 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
BH GSO ISO 8576:2016 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
BH GSO ISO 10934-1:2016 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
BH GSO ISO 10936-2:2017 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
BH GSO ISO 11884-2:2015 Optics and optical instruments- Minmum requirements for stereomicroscopes- Part 2 high performance microscopes
BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
BH GSO ISO 11884-1:2015 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use

British Standards Institution (BSI)

BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
BS ISO 10934:2025 Microscopes. Vocabulary for light microscopy
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
BS ISO 10934-1:2002 Optics and optical instruments. Vocabulary for microscopy-Light microscopy
19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
BS ISO 10934-1:2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy
BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS 7012-8:1997 Light microscopes - Graticules for eyepieces
BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components
BS ISO 10934-2:2007 Optics and optical instruments - Vocabulary for microscopy - Advanced techniques in light microscopy
10/30165036 DC BS ISO 27911. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS 7012-15:1997 Light microscopes - Marking of objectives and eyepieces
BS 7012-16:1997 Light microscopes-Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
BS 7012-1:1990 Light microscopes-Specification for the magnifying power of microscope imaging components
BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 19012-2:2009 Optics and photonics. Designation of microscope objectives-Chromatic correction
BS EN ISO 14880-1:2005 Optics and photonics - Microlens array - Vocabulary
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
BS ISO 10936-2:2010 Optics and photonics - Operation microscopes - Light hazard from operation microscopes used in ocular surgery
BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
BS 7012-4.1:1998 Light microscopes - Specification for microscope objective and nosepiece screw threads - Screw thread type RMS (4/5 in x 1/36 in)
BS 7012-10.4:1998 Light microscopes - Minimum requirements for stereo microscopes - Information provided to the user
BS ISO 10936-2:2001 Optics and optical instruments. Operation microscopes-Light hazard from operation microscopes used in ocular surgery
18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS ISO 25498:2025 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS 7012-6:1998 Light microscopes. Specification for spectral filters

GCC Standardization Organization

GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 11883:2013 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
GSO ISO 10934-1:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
GSO ISO 8576:2015 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
GSO ISO 10936-2:2016 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
GSO ISO 8578:2015 Microscopes -- Marking of objectives and eyepieces
GSO ISO 27911:2013 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope

American Society for Testing and Materials (ASTM)

ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
ASTM STP 372-1965 Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis
ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM C1723-25 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO ISO 10934-1:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO 10934-2:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 2: Advanced techniques in light microscopy
OS GSO ISO 10936-2:2016 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
OS GSO ISO 11884-2:2013 Optics and optical instruments- Minmum requirements for stereomicroscopes- Part 2 high performance microscopes
OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 11884-1:2013 Optics and Optical Instruments – Minimum requirements for Stereomicroscopes – Part 1 : Stereomicroscopes for general use

Bureau of Indian Standards

IS 13108-2019 Optics and Photonics —— Microscopes —— Immersion Liquids for Light Microscopy ( Second Revision )
IS 13108-1-2002 Optics and Optical Instruments - Microscopes - Part 1 : Immersion Oil for General Use in Light Microscopy
IS 18581-2-2024 Optics and Photonics-Operation Microscopes - Part 2 Light Hazard from Operation Microscopes Used in Ocular Surgery

Portuguese Institute of Quality

E E 15-1971 Optical microscope

Military Standards (MIL-STD)

DOD A-A-54868-1993 MICROSCOPE, OPTICAL STEREOSCOPIC
DOD A-A-54970-1994 MICROSCOPE, OPTICAL
DOD A-A-50852 A-1985 MICROSCOPE, OPTICAL, BINOCULAR
DOD A-A-51796 A-1991 MICROSCOPE, OPTICAL (BINOCULAR)

German Institute for Standardization

DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN ISO 8577:2001 Optics and optical instruments - Microscopes - Spectral filters (ISO 8577:1997)
DIN ISO 8576:2002 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN 58629-1:2006 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN ISO 9344:2001 Optics and optical instruments - Microscopes - Graticules for eyepieces (ISO 9344:1996)

Association Francaise de Normalisation

NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of confocal fluorescence microscopes for biological imaging
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF X11-660:1983 Granulometry - Granulometric analysis by optical microscopy - General information on the microscope
X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.

Magyar Szabványügyi Testület

MNOSZ 5534-1956 Microscope light mirror

Defense Logistics Agency

DLA MIL-M-37869-1978 MICROSCOPE, OPTICAL, BINOCULAR

Swedish Institute for Standards

SS-ISO 9220:1989 Metallic coatings - Measurements of coating thickness - Scanning electron microscope method
SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

Ente Nazionale Italiano di Unificazione

UNI EN ISO 9220:1998 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
UNI ISO 9220:1990 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
UNI EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

Danish Standards Foundation

DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DANSK DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery

Association of German Mechanical Engineers

VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI VDE 2656 Blatt 1-2019 Determination of geometrical quantities by using of scanning probe microscopes

Gosstandart of Russia

GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
GOST 4.451-1986 Product-quality index system. Light microscopes. Nomenclature of indices
GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
GOST 28489-1990 Light microscopes. Terms and definitions

European Committee for Standardization (CEN)

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

American Water Works Association (AWWA)

AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope

Polski Komitet Normalizacyjny (PKN)

PN N53040-1988 Light microscopes Optical mechanical dimensions

National Standardisation Body (ASRO)

STAS 6851/2-1975 MICROSCOPES Basic optical dimensions
STAS 7353/4-1982 MICROSCOPES Basic optical dimensions
STAS 7353/5-1982 MICROSCOPES Basic optical parameters

Spanish Association for Standardization (UNE)

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
AENOR UNE 1059:1956 Microcopy.