GB/T 19267.6-2003 in English

SUPERSEDED

Physical and chemical examination of trace evidence in forensic sciences―Part 6:Scanning electron microscopy

Issued on:2003-08-01
Implemented on:2004-01-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $300.00
$291.00

Standard No:	GB/T 19267.6-2003
Document status:	SUPERSEDED
Superseded by:	GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences - Part 6:Scanning electron microscope/ X ray energy dispersive spectrometry
Superseded on:	2009-03-01
Title in English:	Physical and chemical examination of trace evidence in forensic sciences―Part 6:Scanning electron microscopy
Title in Chinese:	刑事技术微量物证的理化检验第6部分: 扫描电子显微镜法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2003-08-01
Implemented on:	2004-01-01
ICS Classification:	13.310-Protection against crime
Chinese Classification:	A92-Crime judging technology
Professional Classification:	GB-National Standard
Related Keywords:	physical evidence chemical examination trace evidence electron microscopy scopethis standard electron microscope
Related Topics:	scanning electron microscope scanning electron microscope SEM's criminal technology Physical and chemical test trace evidence scanning electron microscope SEM Physical and chemical test criminal Scanning Electron Microscopy Standards Principles of microtechnology -scanning electron microscope scanning electron microscopy electron microscopy Electron microscope Trace Evidence Technology SEM miniature scanning electron microscope electron microscopy Trace Evidence Detection Method scanning electron microscope Frontier Technology of Physical and Chemical Evidence Inspection Scanning Electron Microscope Trace Evidence electron microscope phase SEM electron physical and chemical evidence technology electron microscope phase Secondary Electron Microscopy What does an electron microscope examine dual electron microscope SEM analysis Scanning Electron Microscopy Measurement Methods Electron Microscopy Three Classes Environmental SEM Trace Evidence Technology Energy spectrometer electron microscope Scanning electron microscope one electron microscope plant SEM part Fracture Microscopy electron microscope Secondary Electron Microscopy Criminal Technology Laboratory criminal technology SEM 1 SEM Physicochemical Electron Microscopy microscopic measurement technology Dozens of electron microscopes microscopic measurement technology Scanning Electron Microscopy of Biology Scanning Electron Microscopy in Physical Evidence Inside the SEM electrons in an electron microscope Particle Scanning Electron Microscopy electron microscope Electron Microsystem Electron Microscopy 44 scanning principle in the electron microscope SEM Microscope Measurement Technology Scanning Electron Microscopy scanning electron microscope, microscopic measurement technology Scanning Electron Microscopy Detection Method Microanalysis inspection environmental scanning electron microscope scanning electron microscope: Efficient Electron Microscopy .scanning electron microscope Scanning Electron Microscope Optical Microscope scanning electron microscope microdisk Microcalorimetry scanning electron microscope Principles of Microcalorimetry electron microscope The principle of scanning Trace Potassium Ion Test Yan Microelectronics Biological Electron Microscopy electron micrograph Premium Electron Microscope Energy Spectroscopy plant electron microscope SEM detection SEM method early electron microscope field electron microscopy scanning microscopy Check electron microscope Two Methods of Electron Microscopy Hundreds of electron microscopes Electron microscope Scanning Electron Microscopy Two Techniques of Electron Microscopy Scanning Electron Microscopy Spectroscopy GBT19267.6 GB/T 19267.6-2003 GB/T 19267.6-2008 The first scanning electron microscope The principle of scanning electron microscope electron gun Principles of scanning microscope Scanning electron microscope principles Scanning electron microscope imaging principle Principles of scanning electron microscope The imaging principle of scanning electron microscope Scanning electron microscope testing principle Microscopy Validation of molecular weight and molecular weight distribution methods Scanning electron microscopy characterization methods and principles Microscopy Metrology Staining methods for electron microscopy Scanning electron microscopy preparation method Microscopy method validation Scanning electron microscopy Microscopic analysis method validation Magnetic Bead Microscope Test Method

《GB/T 19267.6-2003刑事技术微量物证的理化检验第6部分: 扫描电子显微镜法》由TC179（全国刑事技术标准化技术委员会）归口，TC179SC4（全国刑事技术标准化技术委员会理化检验分会）执行，主管部门为公安部。
本部分规定了扫描电镜的检验方法。本部分适用于刑事技术领域中微量物证的理化检验，其他领域亦可参照使用。

Scope

This standard specifies the inspection method of scanning electron microscope. This part applies to the physical and chemical examination of trace physical evidence in the field of criminal technology, and can also be used by reference in other fields.

More samples: NB/T 47013.2-2015 DL/T 368-2010 YD/T 3934-2021

Sample only — not a preview of GB/T 19267.6-2003

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