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electron microscope phase

electron microscope phase, Total:495 items.

The international standard classification for "electron microscope phase" includes: Optical measuring instruments , Optics and optical measurements in general , Optical equipment , Linear and angular measurements , Chemical analysis , Physicochemical methods of analysis , Protection against crime , Radiographic equipment , Laboratory medicine , Ophthalmic equipment .

The Chinese standard classification for "electron microscope phase" includes: Electron optics and other physical optics instrument , Magnifier and microscope , Optical metrological instrument , Chemical Measurement , Length Measurement , Basic standards and general methods , Crime judging technology , Medical optical instrument and endoscope , Electrochemical, thermochemistry and optical profile type analyzer , Oil shale , General and microsurgical devices , Ophthalmic and ENT surgical devices .


Professional Standard - Machinery

工业和信息化部

  • YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

Professional Standard - Education

  • JY/T 0581-2020 General analysis rules for transmission electron microscope
  • JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
  • JY/T 0585-2020 General rules of analytical methods for the metallographic microscope
  • JY/T 011-1996 General rules for transmission electron microscopy
  • JY/T 010-1996 General rules for analytical scanning electron microscopy
  • JY/T 012-1996 General rules for metallographic microscopy

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1914-2021 Calibration Specification for Metallurgical Microscopes
  • JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Group Standards of the People's Republic of China

National Metrological Verification Regulations of the People's Republic of China

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

Professional Standard - Medicine

  • YY 0067-1992 Micro-circulation microscopes
  • YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
  • YY 0065-1992 Slit-Limp Microscopes
  • YY 0067-2007 Micro-circulation microscopes

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 22063-2018 Microscopes—Interfacing connection type C
  • GB/T 22062-2020 Microscopes—Graticules for eyepieces
  • GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
  • GB/T 22056-2018 Microscopes—Marking of objectives and eyepieces
  • GB/T 41398-2022 Microscopes一Minimum requirements for binocular tubes

机械工业部

国家食品药品监督管理局

Shanghai Provincial Standard of the People's Republic of China

  • DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
  • DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

  • SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

  • SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
  • SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
  • SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope

Taiwan Provincial Standard of the People's Republic of China

Heilongjiang Provincial Standard of the People's Republic of China

  • DB23/T 1531-2013 Technical Requirements for Phase Shift Differential Confocal Microscopy

Jiangsu Provincial Standard of the People's Republic of China

  • DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

全国标准信息公共服务平台

Professional Standard - Judicatory

  • SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

未注明发布机构

  • JIS B 7253-3:2024 Microscopes -- Definition and measurement of illumination properties -- Part 3: Incident light fluorescence microscopy with incoherent light sources

Professional Standard - Commodity Inspection

  • SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

WRC - Welding Research Council

  • BULLETIN 98-1964 FAILURE ANALYSIS OF PVRC VESSEL NO. 5; PART 1 – A STUDY OF MATERIALS PROPERTIES AND FRACTURE DEVELOPMENT; PART 2 – AN ELECTRON MICROSCOPE FRACTOGRAPHIC STUDY OF SELECTED PORTIONS OF THE FR

International Organization for Standardization (ISO)

  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
  • ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
  • ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
  • ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
  • ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
  • ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
  • ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
  • ISO 8038:2011 Microscopes — Screw threads for objectives and related nosepieces
  • ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO 9344:2011 Microscopes - Graticules for eyepieces
  • ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO/PRF 19012-4:2024 Microscopes
  • ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
  • ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
  • ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction
  • ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
  • ISO 9344:2016 Microscopes - Graticules for eyepieces
  • ISO/DIS 19012-4 Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics
  • ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
  • ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
  • ISO 19012-1:2013 Microscopes.Designation of microscope objectives .Part 1: Flatness of field/Plan
  • ISO 11883:1997 Optics and optical instruments - Microscopes - Marking of stereomicroscopes
  • ISO 19012-1:2011 Microscopes - Designation of microscope objectives - Part 1: Flatness of field/Plan
  • ISO 8038:2013 Microscopes.Screw threads for objectives and related nosepieces
  • ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
  • ISO 8578:2012 Microscopes - Marking of objectives and eyepieces
  • ISO 19012-3:2015 Microscopes - Designation of microscope objectives - Part 3: Spectral transmittance
  • ISO 19056-3:2022 Microscopes — Definition and measurement of illumination properties — Part 3: Incident light fluorescence microscopy with incoherent light sources
  • ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
  • ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
  • ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
  • ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
  • ISO 10934-1:2002 Optics and optical instruments - Vocabulary for microscopy - Part 1: Light microscopy
  • ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
  • ISO 10934:2020 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy

GSO

  • OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
  • GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
  • BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
  • BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
  • GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
  • OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
  • GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
  • GSO ISO 8038:2015 Microscopes -- Screw threads for objectives and related nosepieces
  • BH GSO ISO 8038:2016 Microscopes -- Screw threads for objectives and related nosepieces
  • OS GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces
  • GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
  • GSO ISO 19012-1:2015 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
  • BH GSO ISO 11883:2016 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
  • GSO ISO 15227:2015 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
  • BH GSO ISO 15227:2016 Optics and optical instruments -- Microscopes -- Testing of stereomicroscopes
  • GSO ISO 11883:2013 Optics and optical instruments -- Microscopes -- Marking of stereomicroscopes
  • OS GSO ISO 8578:2015 Microscopes -- Marking of objectives and eyepieces
  • OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
  • GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces
  • BH GSO ISO 8576:2016 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
  • BH GSO ISO 19012-1:2016 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
  • GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
  • GSO ISO 10935:2015 Microscopes -- Interfacing connection type C
  • BH GSO ISO 10934-1:2016 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
  • OS GSO ISO 10934-1:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy
  • OS GSO ISO 10936-2:2016 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
  • BH GSO ISO 10936-2:2017 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
  • GSO ISO 10936-2:2016 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery

British Standards Institution (BSI)

  • BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
  • 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
  • BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
  • BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
  • 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
  • BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
  • BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
  • BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
  • BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
  • BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
  • 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
  • BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
  • 19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
  • BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
  • BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
  • 24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
  • BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
  • BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
  • BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
  • BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
  • BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
  • BS ISO 9344:2011 Microscopes. Graticules for eyepieces
  • BS ISO 9344:2016 Microscopes. Graticules for eyepieces
  • BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
  • BS ISO 10934-1:2003 Optics and optical instruments - Vocabulary for microscopy - Light microscopy
  • BS 7012-1:1998 Light microscopes - Specification for the magnifying power of microscope imaging components
  • BS ISO 19056-2:2019 Microscopes. Definition and measurement of illumination properties - Illumination properties related to the colour in bright field microscopy
  • 18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
  • BS ISO 19056-3:2022 Microscopes. Definition and measurement of illumination properties - Incident light fluorescence microscopy with incoherent light sources
  • BS 7012-8:1997 Light microscopes - Graticules for eyepieces
  • BS ISO 8038:2013 Microscopes. Screw threads for objectives and related nosepieces
  • BS ISO 8578:2012 Microscopes. Marking of objectives and eyepieces
  • BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
  • BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
  • 23/30444981 DC BS ISO 19012-4. Microscopes. Designation of microscope objectives - Part 4. Polarization characteristics
  • BS 7012-15:1997 Light microscopes - Marking of objectives and eyepieces
  • BS EN ISO 14880-1:2005 Optics and photonics - Microlens array - Vocabulary
  • BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
  • BS ISO 15227:2000 Optics and optical instruments - Microscopes - Testing of stereomicroscopes
  • BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
  • BS 7012-4.1:1998 Light microscopes - Specification for microscope objective and nosepiece screw threads - Screw thread type RMS (4/5 in x 1/36 in)

Japanese Industrial Standards Committee (JISC)

Korean Agency for Technology and Standards (KATS)

SCC

  • BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
  • 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
  • 12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
  • AENOR UNE 1059:1956 Microcopy.
  • BS ISO 8038:2011 Microscopes. Screw threads for objectives and related nosepieces
  • BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
  • 13/30272924 DC BS ISO 8038. Microscopes. Screw threads for objectives and related nosepieces
  • 10/30199404 DC BS ISO 8038. Microscopes. Screw threads for objectives and related nosepieces
  • BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
  • BS 3836-2:1965 Specification for components of microscopes. Dimensions and marking of microscopes
  • BS ISO 10934-1:2002 Optics and optical instruments. Vocabulary for microscopy-Light microscopy
  • BS 3836-1:1964 Specification for components of microscopes. Microscope cover slips and slides
  • BS 7012-16:1997 Light microscopes-Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
  • DIN 58881:1956 Microscopes - Oculars, fitting dimensions
  • 12/30266267 DC BS ISO 19012-1. Microscopes. Designation of microscope objectives. Flatness of field/Plan
  • BS 7012-1:1990 Light microscopes-Specification for the magnifying power of microscope imaging components
  • DIN 58889:1986 Lenses and oculars for microscops - Marking
  • BS ISO 19012-2:2009 Optics and photonics. Designation of microscope objectives-Chromatic correction
  • VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
  • DIN 58878:1978 Colour designation of objectives for microscopes
  • DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
  • 09/30199298 DC BS ISO 9344. Microscopes. Graticules for eyepieces
  • BS 3836-1:1974 Specification for components of microscopes.-Microscope cover slips and slides and immersion fluid
  • ISO 8036:2015 Plus Redline Microscopes - Immersion liquids for light microscopy (includes Redline Version)
  • 08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
  • 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
  • BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
  • VDI 3866 BLATT 4-2002 Determination of asbestos in technical products — phase contrast microscopic method

Association Francaise de Normalisation

  • NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
  • NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
  • NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
  • NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
  • XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
  • XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
  • NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • NF X11-660:1983 Granulométrie - Analyse granulométrique par microscopie optique - Généralités sur le microscope.
  • X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
  • NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

KR-KS

  • KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
  • KS B 5616-2023 Biological microscope eyepieces
  • KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
  • KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
  • KS B ISO 15227-2023 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
  • KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
  • KS B ISO 15227-2018 Optics and optical instruments — Microscopes — Testing of stereomicroscopes
  • KS B 5614-2023 Binocular stereo microscopes
  • KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
  • KS B ISO 10934-1-2019 Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy

Association of German Mechanical Engineers

American Society for Testing and Materials (ASTM)

  • ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
  • ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM D7201-06(2020) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
  • ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E210-63(2005) Standard Specification for Microscope Objective Thread
  • ASTM D7201-06(2011) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
  • ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
  • ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
  • ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
  • ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

Military Standards (MIL-STD)

PT-IPQ

IT-UNI

  • UNI 7604-1976 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microfractography examination.

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

HU-MSZT

RU-GOST R

  • GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
  • GOST 3469-1991 Mikroscopes. Screw threads for objectives. Dimensions
  • GOST 11200-1975 Objectives and body-tubes of the microscopes. Attaching dimensions
  • GOST 3361-1975 Eyepieces and body-tubes of the microscopes. Attaching dimensions
  • GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes

German Institute for Standardization

  • DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
  • DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
  • DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
  • DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
  • DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
  • DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022

VE-FONDONORMA

International Electrotechnical Commission (IEC)

  • IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

American Society of Mechanical Engineers (ASME)

American National Standards Institute (ANSI)

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

Standard Association of Australia (SAA)

  • ISO 19012-4:2024 Microscopes - Designation of microscope objectives - Part 4: Polarization characteristics
  • AS 2856.1:2000(R2013) Preparation of coal samples for incident light microscopy of coal petrography

RO-ASRO

PL-PKN

VDI - Verein Deutscher Ingenieure

  • VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
  • VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

IN-BIS

ESDU - Engineering Sciences Data Unit

  • SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)

Defense Logistics Agency

SE-SIS

  • SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
  • SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

Danish Standards Foundation

  • DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
  • DS 2011:1985 Micrometers. External micrometers of standard design. Terms and definitions, requirements, testing

European Committee for Standardization (CEN)

  • EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)