JY/T 0584-2020 in English

VALID

General rules of analytical methods for scanning electron microscope

Issued on:2020-09-29
Implemented on:2020-12-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $250.00
$243.00

Standard No:	JY/T 0584-2020
Document status:	VALID
Title in English:	General rules of analytical methods for scanning electron microscope
Title in Chinese:	扫描电子显微镜分析方法通则
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2020-09-29
Implemented on:	2020-12-01
Superseding:	JY/T 010-1996 General rules for analytical scanning electron microscopy
Professional Classification:	JY-Education
Related Topics:	scanning electron microscope scanning electron microscope Scanning Electron Microscopy Sample Preparation scanning microscope Small Scanning Electron Microscope SEM and SEM electron microscope Central Dual Beam Scanning Electron Microscope scanning electron microscope scanning electron microscope Micro SEM scanning electron microscope SEM scanning electron microscope analysis Scanning electron microscope analysis Materials Analysis Microscope Scanning Electron Microscope and Energy Spectrometer Environmental Scanning Electron Microscopy SEM-EDS Scanning Electron Microscopy Spectroscopy dual beam SEM SEM analysis SEM X-ray scanning electron microscope SEM SEM parameters SEM Leather electron microscope Water quality analysis microscope Micro SEM New SEM scanning electricity Scanning Electron Microscopy Use electron microscope tem Portable SEM Portable SEM Scanning electron microscope analysis Scanning Electron Microscopy Main parameters of SEM Scanning Electron Microscopy Analysis scanning microscope Atomic Force Microscopy and Scanning SEM Gold Small SEM Electron Microanalysis General Principles of Electron Microscopy Scanning Electron Microscopy Electron microscope parameters scanning electron microscope scanning analysis technique SEM electron microscope in vacuum Dual Beam Scanning Electron Microscope Scanning Electron Microscopy SEM organic carbon field electron microscope FSEM Scanning Electron Microscopy Standards electron microscope analysis scanning electron microscope What does scanning electron microscopy analyze? 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Introduction

Analysis of the core content of the standard

Technical modules	Contents of the 1996 version	Additions/modifications to the 2020 version
Terminology	12 basic terms	8 new key technical terms such as Environmental scanning electron microscope and Cathode fluorescence
Instrument configuration	Basic SEM functions	Added technical specifications for Electron backscatter diffractometer and Cathode fluorescence system
Sample Preparation	General Sample Preparation Methods	New Special Preparation Requirements for Spectroscopy Test and EBSD Samples

Detailed Explanation of Key Technical Points

4.1 Imaging Mode Selection Matrix

Imaging Mode	Applicable Samples	Resolution Range	Typical Applications
Secondary Electron Image	Surface Morphology Analysis	1-10nm	Material Fracture Analysis, Biological Samples
Backscattered electron image	Composition contrast analysis	10-50nm	Alloy phase distribution, mineral identification
Cathode fluorescence image	Semiconductor materials	100-500nm	Defect location, energy band analysis

5. Laboratory environment control indicators

Temperature and humidity control: 20±5℃, humidity ≤75%
Electromagnetic interference: ≤5μT alternating magnetic field
Vibration control: foundation amplitude ≤5μm (5-20Hz)

Recommendations for the implementation of the standard

Typical application cases

A scientific research institution used a field emission scanning electron microscope in conjunction with an EBSD system to analyze the grain boundary characteristics of titanium alloy:

Electrolytic polishing was performed according to Clause 7.3.3
The working distance was set to 15mm, and the accelerating voltage was 20kV
Orientation contrast images were acquired using a 4-segment backscatter detector
Scanning step size was 0.1μm, and the acquisition speed was 300 points/second