electron microscope
electron microscope, Total:141 items.
The international standard classification for "electron microscope" includes: Optical equipment , Other standards related to analytical chemistry , Optical measuring instruments , Laboratory medicine , Protection against crime , Chemical analysis .
The Chinese standard classification for "electron microscope" includes: Electron optics and other physical optics instrument , Chemical Measurement , Electrochemical, thermochemistry and optical profile type analyzer , Oil shale , Crime judging technology , Basic standards and general methods .
Professional Standard - Machinery
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 5481-1991 Lamp Filament of Electron Microscope
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
- JB/T 5480-1991 Diaphragm of Electron Microscope
- JB/T 5383-1991 Specification for Transmission Electron Microscope
Professional Standard - Education
- JY/T 011-1996 General rules for transmission electron microscopy
- JY/T 010-1996 General rules for analytical scanning electron microscopy
- JY/T 0581-2020 General analysis rules for transmission electron microscope
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Group Standards of the People's Republic of China
- T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope
- T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
- T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB 7667-1996 The dose of X-rays leakage from electron microscope
- GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
- GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM and XEDS
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
- GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
- GB 7667-2003 The dose of X-rays leakage from electron microscope
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
Professional Standard - Public Safety Standards
- GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
Professional Standard - Petroleum
- SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
国家能源局
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
工业和信息化部
- YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method
Professional Standard - Judicatory
- SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
- GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
- ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
GSO
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
- GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
- OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
Korean Agency for Technology and Standards (KATS)
- KS D ISO 22493-2012(2017) Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2019 General rules for scanning electron microscopy
- KS D ISO 22493:2012 Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS I 0051-1999 General rules for scanning electron microscopy
- KS D 2716-2008(2018) Measurement of nanoparticle diameter-Transmission electron microscope
- KS D 2716-2008 Measurement of nanoparticle diameter-Transmission electron microscope
- KS D ISO 16700:2013 Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
- KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
- KS D 8544-2016(2021) Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
- KS D ISO 16700-2013(2018) Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
- KS D ISO 9220-2009(2017) Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
- KS D ISO 9220-2009(2022) Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
- KS D ISO 9220:2009 Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
- KS D ISO 9220-2022 Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
- KS D 8544-2021 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
SCC
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- 12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
- VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
- DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
- BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- AWWA JAW3027 Journal AWWA — Coagulation Mechanisms: An Electron Microscopic Study Using Aluminum Sulfate
KR-KS
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
- KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
Association Francaise de Normalisation
- NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
- NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
American Society for Testing and Materials (ASTM)
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
RU-GOST R
- GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
VDI - Verein Deutscher Ingenieure
- VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
- VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method
SE-SIS
- SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
- SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
Danish Standards Foundation
- DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
German Institute for Standardization
- DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
European Committee for Standardization (CEN)
- EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
Spanish Association for Standardization (UNE)
- UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
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