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Database: 365,228(8 Aug 2026)

electron microscope

electron microscope, Total:141 items.

The international standard classification for "electron microscope" includes: Optical equipment , Other standards related to analytical chemistry , Optical measuring instruments , Laboratory medicine , Protection against crime , Chemical analysis .

The Chinese standard classification for "electron microscope" includes: Electron optics and other physical optics instrument , Chemical Measurement , Electrochemical, thermochemistry and optical profile type analyzer , Oil shale , Crime judging technology , Basic standards and general methods .


Professional Standard - Machinery

Professional Standard - Education

  • JY/T 011-1996 General rules for transmission electron microscopy
  • JY/T 010-1996 General rules for analytical scanning electron microscopy
  • JY/T 0581-2020 General analysis rules for transmission electron microscope
  • JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Group Standards of the People's Republic of China

  • T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope
  • T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
  • T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy
  • T/CSTM 00162-2020 Calibration methods for transmission electron microscope

National Metrological Verification Regulations of the People's Republic of China

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB 7667-1996 The dose of X-rays leakage from electron microscope
  • GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
  • GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM and XEDS
  • GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
  • GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
  • GB 7667-2003 The dose of X-rays leakage from electron microscope
  • GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
  • GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope

Professional Standard - Public Safety Standards

  • GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
  • GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry

Shanghai Provincial Standard of the People's Republic of China

  • DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
  • DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

Professional Standard - Petroleum

  • SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
  • SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
  • SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

国家能源局

  • SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

工业和信息化部

  • YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method

Professional Standard - Judicatory

  • SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Jiangsu Provincial Standard of the People's Republic of China

  • DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
  • GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy

International Organization for Standardization (ISO)

  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
  • ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
  • ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
  • ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
  • ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
  • ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
  • ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method

Japanese Industrial Standards Committee (JISC)

  • JIS K 0132:1997 General rules for scanning electron microscopy
  • JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
  • JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

GSO

  • OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
  • GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
  • BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
  • BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
  • GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
  • GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
  • GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
  • OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness

British Standards Institution (BSI)

  • BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
  • 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
  • BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
  • 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
  • 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
  • BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
  • BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

Korean Agency for Technology and Standards (KATS)

  • KS D ISO 22493-2012(2017) Microbeam analysis-Scanning electron microscopy-Vocabulary
  • KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
  • KS M 0044-1999 General rules for scanning electron microscopy
  • KS I 0051-1999(2019) General rules for scanning electron microscopy
  • KS I 0051-2019 General rules for scanning electron microscopy
  • KS D ISO 22493:2012 Microbeam analysis-Scanning electron microscopy-Vocabulary
  • KS I 0051-1999 General rules for scanning electron microscopy
  • KS D 2716-2008(2018) Measurement of nanoparticle diameter-Transmission electron microscope
  • KS D 2716-2008 Measurement of nanoparticle diameter-Transmission electron microscope
  • KS D ISO 16700:2013 Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
  • KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
  • KS D 8544-2016(2021) Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
  • KS D ISO 16700-2013(2018) Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
  • KS D ISO 9220-2009(2017) Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
  • KS D ISO 9220-2009(2022) Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
  • KS D ISO 9220:2009 Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
  • KS D ISO 9220-2022 Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
  • KS D 8544-2021 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method

SCC

  • BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
  • 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
  • 12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
  • VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
  • DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
  • BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
  • DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • AWWA JAW3027 Journal AWWA — Coagulation Mechanisms: An Electron Microscopic Study Using Aluminum Sulfate

KR-KS

  • KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
  • KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
  • KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

Association Francaise de Normalisation

  • NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
  • NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
  • NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
  • NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
  • XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
  • XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
  • NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

American Society for Testing and Materials (ASTM)

  • ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
  • ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
  • ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
  • ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
  • ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
  • ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
  • ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy

RU-GOST R

  • GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
  • GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes

VDI - Verein Deutscher Ingenieure

  • VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
  • VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

SE-SIS

  • SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
  • SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

Danish Standards Foundation

  • DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

German Institute for Standardization

  • DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022

European Committee for Standardization (CEN)

  • EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

Spanish Association for Standardization (UNE)

  • UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)